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An UHV experimental system for in situ determination of the electronic properties of metal phthalocyanine thin films by photoemission yield spectroscopy

100%

Grządziel L. , Szuber J.

tom Vol. 31, No. 3/4

502-504

The experimental system for in situ determination of the electronic properties of metal phthalocyanine thin films by photoemission yield spectroscopy (PYS) is described. Preliminary results of studies of the electronic parameters of the space charge layers of in situ obtained cooper phthalocyanine (CuPc) thin films are presented and compared with those previously determined for the ex situ obtained cooper phthalocyanine (CuPc) thin films.

Electronic properties of space charge layer of cooper phthalocyanine (CuPc) thin films "in situ" studied by photoemission yield spectroscopy

80%

Grządziel L. , Mikołajczak K. , Szuber J.

2000

tom Vol. 33, No. 1/2

157-160

The electronic properties of the space charge layer in situ prepared copper phthalocyanine (CuPc) thin films studied by Photoemission Yield Spectroscopy (PYS) are presented. Depending on the thickness and annealing temperature the energetic parameters of the space charge layer were determined and compared with those obtained for the copper phtahlocyanine (CuPc) thin film obtained ex situ and then UHV outgased at 410 K. Moreover, the origin of these differences is shortly discussed.

Simple, low cost quartz crystal monitor system for metal phthalocyanine thin film growth control

80%

Matkowski P. , Grządziel L. , Szuber J.

2000

tom Vol. 33, No. 1/2

297-301

In this paper we describe the low cost monitor system, using the quartz crystal microbalance (QCM), for the groeth control of the metal phthalocyanines during deposition under UHV conitions. After short analysis of the theoretical basic of QCM, the detailed description of the elaborated systen is presented, together with its performance in the control of the deposition of the copper phthalocyanine (CuPc) thin films.

Surface photovoltage spectroscopy system for "in situ" studies of metal phthalocyanine thin films

71%

Bilski M. , Kaszczyszyn S. , Grządziel L. , Adamowicz B. , Szuber J.

2000

tom Vol. 33, No. 1/2

289-29

The exprimental system for in situ determination of the electronic properties of metal phthalocyanine thin films by surface photovoltage spectroscopy (SPS) is described. The preliminary results of in situ studies of the electronic properties of the space charge layer of the freshly evaporated copper phthalocyanine (CuPc) thin films are presented.