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Correlation between physical properties of superlattices obtained by means of electrochemical deposition method and ion spraying

Duś-Sitek M., Nabiałek M., Gągorowska B.

Optica Applicata

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2009

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Vol. 39, nr 4

645-653

EN

This paper compares structural and magnetic properties of Cu/Ni and Ni/Cu multilayer systems obtained by means of ion sputtering and electrochemical deposition method. The impact of both thickness of Cu and Ni sublayers and a number of bilayers repetition on magnetic properties was also investigated. The purpose of this work was to verify which method for multilayer system deposition enables samples of better structural and magnetic properties to be obtained.

2

An impact of the state and type of surface layer on magnetic properties of Cu/Ni and Ni/Cu multilayers

Gągorowska B., Duś-Sitek M., Nabiałek M.

Optica Applicata

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2009

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Vol. 39, nr 4

839-844

EN

This paper presents the results of investigation of magnetic properties in Cu/Ni multilayer systems. Based on the investigation of Ni/Cu and Cu/Ni systems with different thickness of magnetic and non-magnetic layers it was proved that the presence of ferromagnetic (F-F) and antiferromagnetic (A-F) exchange couplings depends on the quality of layers in artificial superlattice and on the state and type of free surface, superlattice structure and its roughness.

3

Comparative X-ray investigation of Ni/Cu systems heated in the 250-350 stC temperature range

Gągorowska B., Kucharska B., Duś-Sitek M., Tokarz A.

Materials Science Poland

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2008

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Vol. 26, No. 1

149--155

EN

Results of investigation of structural properties of Cu/Ni multilayers have been presented. Samples were obtained by the electrochemical method and after deposition they were heated from 250 oC to 350 oC. The increase of the heating temperature and of the Cu thickness in multilayers caused a decrease of intensities of peaks corresponding to (111) planes. The phenomenon results from the formation of a solid solution in the interfaces. Heating of multilayers in the investigated temperature range resulted in the increase of tensile stresses in external layers and of compressive stresses in substrate adjacent layers.

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The comparison of the structural properties of multilayered systems Cu/Ni obtained by the electrochemical and face-to-face sputtering methods

Gągorowska B., Duś-Sitek M.

Archives of Metallurgy and Materials

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2008

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Vol. 53, iss. 3

909-917

EN

The investigations of the structural properties of Cu/Ni multilayer systems for following samples: Si(100)/[Cu(20Å)/Ni(t)] x 100, Si(100)/[Ni(20 Å)/Cu(t)] x 100 were performed. The samples were produced using electrochemical and face-to-face sputtering methods. It was affirmed that multilayers obtained by face-to-face sputtering method, in comparison with samples obtained by electrochemical method, were characterized by better quality of the structure. The samples madę by the face-to-face sputtering method have smaller value of the interface roughness, higher quantity and quality of satellite peaks. The half widths of peaks for both superlattices are similar. Additionally, in reflectivity measurements the presence of Bragg peaks was stated. They are used to determine the value of period of the multilayer system. These type of peaks was not present in samples madę by electrochemical method.

PL

W pracy przedstawiono wyniki badań właściwości strukturalnych układów wielowarstwowych Cu/Ni. Wielowarstwy te otrzymano dwoma metodami: elektrochemiczną oraz rozpylenia jonowego. Na podstawie przeprowadzonych badań udowodniono, że próbki uzyskane metodą rozpylenia jonowego charakteryzują się lepszą jakością struktury. Przejawia się to: w mniejszej wartości szorstkości, obecnością wierzchołków satelitarnych, zbliżoną wartością szerokości połówkowej wierzchołków supersieci.

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Badanie właściwości fazy skondensowanej metoda! Emisji niskoenergetycznych elektronów wspomagana analiza rentgenograficzna

Gągorowska B., Duś-Sitek M.

Inżynieria Powierzchni

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2006

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nr 2

87-91

PL

W pracy przedstawiono właściwości układów wielowarstwowych Cu/Ni wykorzystując metodę emisji niskoenergetycznych elektronów wspomaganą analizą rentgenograficzną. Otrzymane obrazy dyfrakcyjne dla układów przed nagrzewaniem wykazały obecność pików satelickich, z kolei dla próbek nagrzewanych do temperatury 933 K struktura ich została zachwiana. Z badań metoda emisji elektronów otrzymano krzywą emisyjną, na której obserwuje się dwa maksima. Nagrzewanie wymusza proces rozrostu obszarów nanokrystalicznych, tworzenia granic międzyfazowych oraz wystąpienie zjawisk transportowych. Aby uzyskać pełne informacje na temat emisji elektronów badano także stan powierzchni obydwu rodzajów próbek. Ponieważ zjawisko emisji elektronów wykorzystano jako metodę do kompleksowego badania faz krystalicznych, w pracy wykazano, że metodę tą można również wykorzystać do badania nanokrystalicznych struktur wielowarstwowych.

EN

The exoemission properties of multi-layered Cu/Ni systems are presented. Samples were tested using emission of low-energetistic electrons. Furthermore, the x-ray diffraction analysis was made to determine the quality of the multi-layer structure. The x-ray diffraction spectra for systems before heat treatment showed the presence of satellite peaks. Heating of samples up to 933 K induced some distortion of their structure. Investigation of electron emission resulted in determining the temperature dependence of the emission intensity, with characteristic two maxima peaks. Heat treatment of samples provokes the growth of nanocrystalline clusters, the formation of interfacial boundaries as well as pronouncement of transport phenomena. To obtain full information about emission of electrons, the surface topography of Cu/Ni superlattices was investigated. Until now electron emission phenomenon was used as a method of complex investigations of crystalline phase properties. The aim of this paper is to demonstrate, that the electron emission method is a valuable tool to investigate the nanocrystalline multi-layer structures.