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XPS study of air exposed copper phthalocyanine ultra-thin films deposited on Si(111) native substrates

Krzywiecki M., Grządziel L., Ottaviano L., Parisse P., Santucci S., Szuber J.

Materials Science Poland

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2008

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Vol. 26, No. 2

287--294

EN

Results are presented of XPS characterization of ultra-thin copper phthalocyanine (CuPc) (16 nm- QCM controlled) films thermally deposited under UHV conditions on p- and n- type Si(111) substrates covered by native oxide. Our attempt has been focused on comparative studies of thin films in terms of the stability and durability of CuPc layers after one year of aging in ambient atmosphere. The impact of the type of the substrate doping was also explored. Our results clearly prove that CuPc layers are chemically stable and durable after one year exposure to air. We also demonstrate the existence of the substrate doping impact on the CuPc ultra-thin film what might be caused by dipole effects.

2

Surface photovoltage spectroscopy system for "in situ" studies of metal phthalocyanine thin films

Bilski M., Kaszczyszyn S., Grządziel L., Adamowicz B., Szuber J.

Electron Technology

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2000

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Vol. 33, No. 1/2

289-29

EN

The exprimental system for in situ determination of the electronic properties of metal phthalocyanine thin films by surface photovoltage spectroscopy (SPS) is described. The preliminary results of in situ studies of the electronic properties of the space charge layer of the freshly evaporated copper phthalocyanine (CuPc) thin films are presented.

3

Simple, low cost quartz crystal monitor system for metal phthalocyanine thin film growth control

Matkowski P., Grządziel L., Szuber J.

Electron Technology

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2000

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Vol. 33, No. 1/2

297-301

EN

In this paper we describe the low cost monitor system, using the quartz crystal microbalance (QCM), for the groeth control of the metal phthalocyanines during deposition under UHV conitions. After short analysis of the theoretical basic of QCM, the detailed description of the elaborated systen is presented, together with its performance in the control of the deposition of the copper phthalocyanine (CuPc) thin films.

4

Electronic properties of space charge layer of cooper phthalocyanine (CuPc) thin films "in situ" studied by photoemission yield spectroscopy

Grządziel L., Mikołajczak K., Szuber J.

Electron Technology

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2000

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Vol. 33, No. 1/2

157-160

EN

The electronic properties of the space charge layer in situ prepared copper phthalocyanine (CuPc) thin films studied by Photoemission Yield Spectroscopy (PYS) are presented. Depending on the thickness and annealing temperature the energetic parameters of the space charge layer were determined and compared with those obtained for the copper phtahlocyanine (CuPc) thin film obtained ex situ and then UHV outgased at 410 K. Moreover, the origin of these differences is shortly discussed.

5

An UHV experimental system for in situ determination of the electronic properties of metal phthalocyanine thin films by photoemission yield spectroscopy

Grządziel L., Szuber J.

Electron Technology

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1998

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Vol. 31, No. 3/4

502-504

EN

The experimental system for in situ determination of the electronic properties of metal phthalocyanine thin films by photoemission yield spectroscopy (PYS) is described. Preliminary results of studies of the electronic parameters of the space charge layers of in situ obtained cooper phthalocyanine (CuPc) thin films are presented and compared with those previously determined for the ex situ obtained cooper phthalocyanine (CuPc) thin films.