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Electric and dielectric features of thin organic polymer layers

Lozovski T., Montrimas E., Arlauskas K.

Prace Naukowe Instytutu Podstaw Elektrotechniki i Elektrotechnologii Politechniki Wrocławskiej. Konferencje

2004

Vol. 40, nr 15

1-3

The charge carrier transport features of organic dielectric layers on the base of double hydrazone derivative and polycarbonate (PC) mixture of ratio 1:1 by weight have been investigated. The dielectric layers have been cast from solution of both organic materials on thin poly(ethylene theraphthalate) films coated by aluminum layer. Using dosed charging-discharging method, by measuring charge-voltage (C-V) characteristics, the dielectric features of organic polymer layers have been investigated. Latter characteristics enabled to evaluate layer's dielectric permittivity, surface resistance and it's dependence on electric field and polarity of charging potential. Investigation of the hole drift mobility dependencies on electric field by time-of-flight method demonstrated that the hole mobility increased from 3.5∙10-7 cm2/Vs till 2∙10-6cm2/Vs with the electric field increasing from 1.6∙105 V/cm up to 6∙105 V/cm.

Investigation of electrical immunity in monocrytalline and porous silicon oxide layers

Łozowski T., Montrimas E., Rinkunas R., Beck R. B., Jakubowski A.

Electron Technology

1999

Vol. 32, No. 1/2

154-157

Very little is known so far on the electrochemical propeties of the oxides formed by oxidation of the porous silicon. In the course of this work the comparative study of electrical immunity in monocrystalline and porous oxides was made. The techniques used for this study were contacless methods allowing to analyse the defects formed in the oxides, thier density and morphology. The obtained results prove that the defects in porous oxides differ in size and unlike in monocrystalline oxide, appear in localized spots.