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1

Theoretical analysis of electro-optical characteristics of the modified three cylindrical mirror analyzer

Klein S., Kaszczyszyn S., Grzeszczak A., Koscielniak P.

Optica Applicata

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2010

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Vol. 40, nr 2

521--526

EN

In this paper, theoretical electro-optical characteristics of a modified cylindrical mirror analyzer based on three coaxial cylindrical electrodes obtained with numerical calculations are presented. It was shown, for the first time, that the image of a point source of electrons located on the analyzer optical axis is in the form of a circle which does not depend on the entrance angle of electrons into the analyzer within the range of angles ? = 30°– 40°. In particular, for the input angle ? = 36° and dispersion ?? = š3°, the relative energy resolution is equal to 0.01% at the analyzer constant K = 1.97.

2

Multiple-technique electron spectrometr for investigation of semiconductor surfaces and interfaces

Szuber J., Kościelniak P., Kaszczyszyn S.

Elektronika : konstrukcje, technologie, zastosowania

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2001

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Vol. 42, nr 8-9

74-75

EN

In this paper a self-constructed multiple-technique electron spectrometer is described. It consists of the main analysis chamber connected with the preparation chamber via the gate valve and magnetically coupled sample transport system. It was mainly designed for study of III-V semiconductor surfaces with a special emphasis on various surface processing.

3

Surface photovoltage spectroscopy system for "in situ" studies of metal phthalocyanine thin films

Bilski M., Kaszczyszyn S., Grządziel L., Adamowicz B., Szuber J.

Electron Technology

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2000

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Vol. 33, No. 1/2

289-29

EN

The exprimental system for in situ determination of the electronic properties of metal phthalocyanine thin films by surface photovoltage spectroscopy (SPS) is described. The preliminary results of in situ studies of the electronic properties of the space charge layer of the freshly evaporated copper phthalocyanine (CuPc) thin films are presented.

4

Application of the unipole mass filter (UMF) for determination of partial pressures of gases with near atomic masses

Król A., Szuber J., Kaszczyszyn S.

Electron Technology

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1998

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Vol. 31, No. 3/4

505-507

EN

In this paper the improvements of the recently described unipolar mass mfilter (UMF) are presented together with the new method of detrmination of the partial pressures of gases with near atomic masses.