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Pierwsze polskie przyrządy półprzewodnikowe : z perspektywy 50 lat

Klamka J.

Elektronika : konstrukcje, technologie, zastosowania

2006

Vol. 47, nr 6

40-46

Przedstawiono historię rozwoju pierwszych polskich przyrządów półprzewodnikowych opracowanych przez autora i jego zespół. Dotyczy to głównie diod prostowniczych, diod Zenera, fotodiod oraz różnych przyrządów mikrofalowych (waraktorów, diod lawinowych, diod PIN, diod Gunna, diod Schottky'ego, tranzystorów i podzespołów), wytwarzanych głównie w Pionie Mikrofal Instytutu Technologii Elektronowej.

In the paper, a history of the first semiconductor devices that were designed in Poland by the author and his co-workers, is described. It includes rectifier diodes, Zener diodes, photodiodes and microwave devices (varactors, avalanche diodes, PIN diodes, Gunn diodes, Schottky diodes, transistors and subsystems) - all developed at the Institute of Electron Technology, mainly in the Microwave Division of that Institute.

Reliability of deep submicron MOSFETs

Balestra F.

Journal of Telecommunications and Information Technology

2001

nr 1

12-17

In this work, a review of the reliability of n- and p-channel Si and SOI MOSFETs as a function of gate length and temperature is given. The main hot carrier effects and degradation are compared for bulk and SOI devices in a wide range of gate length, down to deep submicron. The worst case aging, defice lifetime and maximum drain bias that can be applied are addressed. The physical mechanisms and the emergence of new phenomena at the origin of the degradation are studied for advanced MOS transistors. The impact of the substrate bias is also outlined.

Photoreflectance spectroscopy of low-dimensional semiconductor structures

Misiewicz J., Sitarek P., Sęk G.

Opto-Electronics Review

2000

Vol. 8, No. 1

1-24

In this paper, we present the applications of photoreflectance spectroscopy for investigations of low-dimensional, semiconductor structures. We briefly introduce the theoretical background of this technique including the line-shape expressions related to semiconductor microstructures. We show examples of photoreflectance investigations of two-dimensional structures such as quantum wells, multiple quantum wells and superlattices, one-dimensional structures-guantum wires, and quasi zero-dimensional structures-quantum dots. Finally, we concentrate our attention on investigations of the structures of semiconductor devices like high electron mobility transistors, heterojunction bipolar transistors and vertical / planar light emitting lasers structures.