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Morphological, topographical and FTIR characterizations of Pd–C films

Rymarczyk J., Kamińska A., Kęczkowska J., Kozłowski M., Czerwosz E.

Optica Applicata

2013

Vol. 43, nr 1

123--132

The structure, topography and morphology of Pd–C films were studied by AFM (atomic force microscopy), SEM (scanning electron microscopy), Raman and FTIR (Fourier transform infrared spectroscopy) methods. It was found that an increasing content of palladium in films causes a decrease in their roughness and size of nanograins. The topography and morphology of Pd–C films depend on the content of palladium in the film, what was found from the analysis of SEM and AFM images. FTIR and Raman spectra show that the content of fullerene and palladium in the film strongly depends on technological parameters of PVD (physical vapor deposition) process.

Palladium nanocrystals and their properties

Czerwosz E., Dłużewski P., Kęczkowska J., Kozłowski M., Suchańska M., Wronka H.

Materials Science Poland

2008

Vol. 26, No. 1

119--125

Films composed of Pd nanocrystals embedded in fullerene C60 matrix have been studied by TEM, AFM, UV-VIS absorption methods. Data on the structure of Pd nanocrystals was obtained from electron diffraction of selected areas and the size distribution for Pd nanocrystals was found from dark field TEM images. UV-VIS absorption spectra showed the shift of C60 characteristic bands connected with the ligand field effect. Electric characteristics were recorded for the initial dry film and film wetted by various liquid agents (benzene, ethanol, toluene).