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Semiconductor heterostructures and device structures investigated by photoreflectance spectroscopy

Misiewicz J., Sitarek P., Sęk G., Kudrawiec R.

Materials Science

2003

Vol. 21, No. 3

263-318

In this review paper, we present the photoreflectance spectroscopy as a powerful tool for investigations of bulk semiconductors and semiconductor heterostructures. We discuss the application of this spectroscopy technique to investigate various properties of semiconductors, including: the composition of multinary compounds, distribution of the built-in electric field and the influence of perturbation such as temperature, strain, pressure; low-dimensional structures such as quantum wells, multiple quantum wells and superlattices, quantum dots; and the structures of semiconductor devices like transistors and vertical/planar light emitting laser structures.