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Cienkie ferroelektryczne warstwy PLZT dla zastosowań w szybkich elektrooptycznych układach próbkujących

Łoziński A.

Przegląd Elektrotechniczny

2010

R. 86, nr 10

80-82

Opisano opracowanie cienkich, warstw modyfikowanej lantanem ceramiki z cyrkoniano-tytanianu ołowiu (Pb,La)(Zr,Ti)O3 (PLZT), do wykorzystania w tytułowych układach próbkujących. Warstwy wytwarzano metodą zol-żel. Zaprezentowano sposób wytwarzania zolu, wytwarzania warstw metodą rozwirowania oraz obróbki termicznej. Przedstawiono rentgenogram warstwy oraz parametry mechaniczne, optyczne i elektryczne uzyskane za pomocą pomiarów elipsometrycznych i niskokoherentnej interferometrii LCI.

Elaboration of thin films of lead lanthanum zirconate titanate (Pb,La)(Zr,Ti)O3 (PLZT) ceramics for utilizing in title sampling circuits has been presented. Films were made by sol-gel process. The sol preparation, film production and thermal processing are described. The x-ray diffraction pattern of obtained film as well as its mechanical, optical and electric parameters are presented. Optical and electric parameters were determined from ellipsometric measurements, the film thickness – with low coherence interferometry LCI.

Analysis of quadratic electrooptic response of BaTiO₃ crystal in ferroelectric phase

Izdebski M., Kucharczyk W.

Opto-Electronics Review

2008

Vol. 16, No. 1

42-45

Using the example of BaTiO₃ in a ferroelectric phase it is shown that a large difference in magnitudes of individual linear electrooptic coefficients may be a reason of additional indirect quadratic contributions that are independent of real quadratic coefficients. For some directions of the applied field and light, the indirect contributions may be even larger than the real quadratic ones. Independently of nonlinear distortions that can affect applicability of technical devices, a large difference between linear electrooptic coefficients may lead to serious problems in measurements of the real quadratic electrooptic effect. The analysis is based on the extended Jones matrix calculus applied to a Gaussian beam.

Temperature dependence of the electrooptic coefficients r ₂₂ and m ₂₂ in LiNbO₃

Górski P., Bondarczuk K., Kucharczyk W.

Opto-Electronics Review

2004

Vol. 12, No. 4

459-461

Measurements of temperature dependence of linear electrooptic coefficients defined in terms of the electric field r ₂₂ and the induced polarization m ₂₂ were made for LiNbO₃ within the temperature range 25°C-200°C. After annealing, the coefficient r ₂₂ in samples with xc =49.3% is found to be nearly temperature independent, increasing at 125°C only 0.6%. Contrary to the commonly observed temperature behaviour of intrinsic coefficients, m ₂₂ instead of r ₂₂, changes significantly with temperature.