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Modelling of a two-dimensional photonic crystal as an antireflection coating for optoelectronic applications

Przybylski Dariusz, Patela Sergiusz

Opto-Electronics Review

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2019

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Vol. 27, No. 1

79--89

EN

In article a two-dimensional photonic crystal (PhC) is considered and modelled as a new generation antireflection coating for optoelectronic devices. Traditional antireflective coatings (ARCs) reduce the reflection of the radiation only – the new generation of antireflective coatings should affect the distribution of the radiation also. Such functionality can be provided by the two-dimensional PhC which reduce the reflection and scatter transmitted light. Prior to the fabrication, the PhCs should be designed and analysed. Results of the analysis should provide quantitative means for choice of materials and design solutions. In work, we analyse the electromagnetic field distribution as Poynting vectors inside the materials of optoelectronic devices, in order to investigate the possibility of improving the construction of future optoelectronic devices. Furthermore, we calculate the reflection and transmission of that ARC. It’s a complex optic analysis of new generation of ARC. The numerical analysis has been performed with the FDTD method in Lumerical Software. In work, we consider the two-dimensional photonic crystal on the top surface of optoelectronic structures. We compared the results with the traditional ARC from these same parameters as PhC: thickness and material. As an example, we presented the application of modelled, photonic crystal, thin-film, GaAs solar cells with PhC on top. The efficiency of this solar cell, using the photonic crystal, was improved by 6.3% over the efficiency of this same solar cell without PhC. Thus, our research strongly suggests that the unique properties of the photonic crystal could be used as a new generation of ARC.

2

Simple expressions for the designing of the double bandpass optical filter

Kushnir O.

ECONTECHMOD : An International Quarterly Journal on Economics of Technology and Modelling Processes

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2015

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Vol. 4, No 4

91--94

EN

Simple expressions for designing of the double bandpass optical filter have been obtained. These expressions make it possible to determine the phase thicknesses of the two symmetrical layers of multilayer structures, which provide double bandpass optical filter based on the interference reflector with an odd number of layers. The possibility of designing double bandpass optical filter with different bandwidth is shown.

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The principle of multilayer plane-parallel structure antireflection

Kosoboutskyy P., Karkulovska M., Morgulis A.

Optica Applicata

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2010

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Vol. 40, nr 4

759--765

EN

The principle of two- and three-layer transparent system antireflection is based on the method of Fabry–Perot multiple-beam interference spectrum envelopes and it is shown that the presence of half-wave and quarter-wave layer thicknesses or their combination is sufficient but not necessary for its achievement. The necessary condition is the condition of overlapping of interference layer envelopes, therefore the antireflection effect can be observed at arbitrary ratios of optical layer thicknesses, angles of incidence and optical refraction index of media when the condition is satisfied for the minimum of interference contour in the required spectral region.

4

Silicon solar cells with antireflecting and protective coatings based on diamond-like carbon and silicon carbide films

KLyui N. I., Litovchenko V. G., Kostylyov V. P., Rozhin A. G., Gorbulik V. I., Voronkin M. A., Zaika N. I.

Opto-Electronics Review

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2000

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Vol. 8, No. 4

406-409

EN

Deposition of single or two-layer diamond like carbon (DLC) antireflecting coatind enables the solar cell (SC) efficiency to be improved 1.35 - 1.45 time. It is interesting to note that the SC efficiency improvement after DLC films deposition is connected not only with the antireflecting effect. The DCL films deposition also results in short circuit current (Jsc) increasing but enhancement of open circuit voltage (Voc) and fill factor (FF) as well. The latter is likely caused by passivation of recombination active centers on the SC surface during DLC film deposition and, possibly, by gettering of the defect and impurities from the SC volume. The improvement in SC' efficiency was also observed for SC covered by thin (50-100 nm) antireflecting SiC coatings.