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A Study on the Durability of Dimensionally Stable Electrode in High-Rate Electroplating Process Condition Using Accelerated Life Test

Park Sung Cheol, Jung Yeon Jae, Koo Seokbon, Lee Kee-Ahn, Son Seong Ho

Archives of Metallurgy and Materials

2021

Vol. 66, iss. 3

675--678

In order to the long-term stability of DSE for electroplating process, the lifetime equations were calculated from the results of the accelerated life testing, and the lifetime of DSE was predicted. The nano-embossing pre-treatment led to 2.65 times in the lifetime of DSE. The degradation mechanism of DSE with a thick metal oxide layer for applied highly current density process condition was identified. The improvement of durability of DSE seems to be closely related to adhesion between titanium plate and mixed metal oxide layer.

Influence of temperature and aging on polarization mode dispersion of tight-buffered optical fibers and cables

Borzycki K.

Journal of Telecommunications and Information Technology

2005

nr 3

96-104

This paper presents results of laboratory tests investigating influence of temperature on polarization mode dispersion (PMD) in variety of single mode optical fibers and cables. Research was focused primarily on tight-buffered fibers, where most pronounced effects resulting from buffer shrinkage or expansion were expected. The goal was to verify performance of optical fiber cable exposed to extreme temperatures and to compare behavior of different cables. Very strong temperature dependence of PMD was detected in standard single mode fibers with 0.9 mm tight buffer, commonly used in indoor cables, and in complete cable with such fiber. However, both nonzero dispersion-shifted fibers, spun during drawing and optical unit used in optical ground wire (OPGW), where 12 fibers are stranded showed good stability of PMD during thermal cycling. The same optical unit extracted from OPGW exhibited excellent PMD stability also during accelerated life test.