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EN
Self-assembled monolayers (SAMs) of 4-methyl-4'-mercaptoethyl-biphenyl (HS-CH₂-CH₂-C₆H₄-C₆H₄-CH₃) and nexadecane thiol (HS-(CH₂)₁₅-CH₃ adsorbed on Au(111)/mica were investigated by cyanide etching in order to identify defects in the monolayer. The etch pits formed around a defect were examined ex situ by scanning tunneling microscopy. For both tiols removal of gold atoms begins in the vicinity of terrace edges and leads to the formation of triangular pits on the gold terraces. The defect densities of both thiols are comparable and the etch rate slightly higher for the alkane thiol compared to the biphenyl thiol. This feature combined with a charge permeability orders of magnitude higher than for alkane thiols makes biphenyl based thiols a promising material for modifying electrochemical properties of electrodes.
EN
Laser postionization technique has been used to invetigate processes that occur during ion bombardment of thin organic layers. Dependence of the kinetic nergy disrtibutions has been investigated as a function of layer thickness and projectile type. Thin films obtained from self-as-sembled monolayer of phenylethanethiol on gold and C₆H₆ on silver have been probed. Results indicate that the sputtering mechanism depends on the organic material used. Phenylethanethiol molecules are emitted predominantly with thermal kinetic energies and the shape of the distribution depends on surface temperature. Emission of benzene is much more energetic and possesses characteristics similar to sputtering of metals. Emission of phenylethanethiol molecules is stimulated by a chemical reaction, which gently breaks the adsorbate surface bonds. Benzene molecules are emitted from the thin overlayer due to collisions with ejecting substrate atoms.
EN
STM/AFM and LFM microscopes were used for morphological analysis of uniform and patterned self-assembled monolayers (SAMs) formed from docosanethiol (HS-(CH₂)₁₁CH₃), dodecanethiol (HS-(CH₂)₁₁CH₃) and mercaptododecanoic acid (HS-(CH₂)₁₁COOH) molecules adsorbed at 200nm gold film deposited onto silicon wafer. All measurements were performed in air. The lateral distances between atoms were determined using HOPG sample for calibration. Images obtained on clen Au substrate revealed that the surface was not uniform but was composed from flat crystallites having {111} surfaces. For DCT/Au samples a (√3 x √3) R30° reconstruction of molecules was detected. In this case, electron tunneling was pesumed to occur between the microscope itp and gold-bound uslfur atom of DCT molecule. Depressions with a diameter of 40÷150 Å and a depth of approximately 2.4 Å were observed on otherwise flat surface of DCT monolayer. Our results support hypothesis that defects are formed by removal of Au atoms that takes place during monolayer formation when the substrate is immersed in ethanol solution.
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