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Electron Magnetic Resonance Study of the Most Sensitive Metal Paint Components for Degradation

100%

Żyłka W. M. , Cieniek B. , Skała P.

Advances in Science and Technology. Research Journal

2023

tom Vol. 17, no 3

101--109

The article presents an electron magnetic resonance study of metal paints in terms of identification and selection of appropriate pigment components based on the summation of spectral components. Research was carried out to assess the durability of paints on the basis of the detection of free radicals in individual components, the occurrence of which leads to paint degradation. Two types of acrylic resins, three types of organic pigments, and titanium white, hardener, and clearcoat were tested. The g-factor as well as all electron magnetic resonance line parameters were calculated. Electron magnetic resonance is found to be useful in the effort to eliminate a paint component that reduces color durability and to select components in terms of paint quality.

Structural and optical properties of aluminium nitride thin films fabricated using pulsed laser deposition and dc magnetron sputtering on various substrates

75%

Virt I. , Potera P. , Wisz G. , Dziedzic A. , Cieniek B. , Lopatynskyi I. , Frugynskyi M.

Advances in Materials Science

2024

tom Vol. 24, nr 1(79)

5--16

Aluminium nitride thin films were fabricated using pulsed laser deposition and DC magnetron sputtering. Different technological parameters and the effects of different substrates on the optical and structural parameters of AlN samples were studied. An X-ray diffraction study was performed for the layer deposited on the Si3N4 substrate. A high-energy electron diffraction study was also carried out for the layer deposited on a KCl substrate. Transmission spectra of layers on quartz, sapphire, and glass substrates were obtained. An evaluation of the optical band gap of the obtained layers was carried out (Eg form 3.81 to 5.81 eV) and the refractive index was calculated (2.58). The relative density of the film (N1TN-AlN sample) is 1.26 and was calculated using the Lorentz-Lorentz relationship. Layers of aluminium nitride show an amorphous character with a polycrystalline region. It was shown that the properties of AlN films strongly depend on the method, growth conditions, and substrate used.