Wyniki wyszukiwania - Biblioteka Nauki

Ten serwis zostanie wyłączony 2025-02-11.

Nowa wersja platformy, zawierająca wyłącznie zasoby pełnotekstowe, jest już dostępna.
Przejdź na https://bibliotekanauki.pl

Ograniczanie wyników

Znaleziono wyników: 4

Liczba wyników na stronie

Wyniki wyszukiwania

Wyszukiwano:
w słowach kluczowych: ultrathin films

Sortuj według:

Ogranicz wyniki do:

Study of ultrathin Co films grown on Si(111) substrates

100%

Stupakiewicz A. , Fleurence A. , Gieniusz R. , Maziewski A. , Maroutian T. , Gogol P. , Bartenlian B. , Mégy R. , Beauvillain P.

Materials Science Poland

2008

tom Vol. 26, No. 4

1021--1026

Ultrathin Co films were grown on vicinal Si(111) substrate with Cu buffer layers. Room temperature ferromagnetic behaviour of Co layer thicker than 4 monolayers was confirmed by the magneto-optical Kerr effect. Ferromagnetic resonance measurements have proven the coexistence of the magnetocrystalline anisotropy along with the growth- and vicinal induced uniaxial out-of-plane and in-plane contributions. Multi-jump hysteresis loops were observed for selected in-plane orientations of magnetic field which is explained by the competition of different anisotropy contributions.

Magnetic properties of ultrathin Co(0001) films on vicinal Si(111) substrate

100%

Stupakiewicz A. , Fleurence A. , Gieniusz R. , Maziewski A. , Maroutian T. , Gogol P. , Bartenlian B. , Mégy R. , Beauvillain P.

Materials Science Poland

2008

tom Vol. 26, No. 2

295--300

In the present work we report on magnetization reversal process, anisotropy and domain structures in ultrathin Au/Co(0001)/Au films deposited on vicinal Si(111) substrates. The measurements were performed using a magneto-optical Kerr effect based magnetometer, a polarizing optical microscope and a ferromagnetic resonance spectrometer. Co thickness induced spin-reorientation from out-of-plane into in-plane magnetization was studied. Changes of in-plane magnetic anisotropy symmetry were deduced from shapes of magneto-optical hysteresis loops and from analysis of angular dependences of the resonance field. The experimental data have been discussed taking into account both uniaxial out-of-plane anisotropy and step-induced uniaxial in-plane anisotropy. A preferential orientation of domain walls in 3ML thick Co films was observed. The finding is explained by the step-induced magnetic anisotropy.

Modification of Magnetic Properties of Pt/Co/Pt Films by Ga^{+} Ion Irradiation: Focused versus Uniform Irradiation

88%

Sveklo I. , Mazalski P. , Jaworowicz J. , Jamet J. , Vernier N. , Mougin A. , Ferré J. , Kisielewski M. , Zablotskii V. , Bourhis E. , Gierak J. , Postava K. , Fassbender J. , Kanak J. , Maziewski A.

tom 133

nr 5

1215-1226

30 keV Ga^{+} irradiation-induced changes of magnetic and magneto-optical properties of sputtered Pt/Co/Pt ultrathin trilayers films have been studied as a function of the ion fluence. Out-of-plane magnetic anisotropy states with enhanced magneto-optical effects were evidenced for specific values of cobalt thickness and irradiation fluence. Results obtained after uniform or quasi-uniform focused ion beam irradiation on either out-of-plane or in-plane magnetized sputtered pristine trilayers are compared. Similar irradiation-induced magnetic changes are evidenced in quasi-uniformly focused ion beam or uniformly irradiated films, grown either by sputtering or molecular beam epitaxy. We discuss on plausible common mechanisms underlying the observed effects.

Nowa metoda pomiaru lepkości ultracienkich warstw polimerów

75%

Jarząbek D. , Rymuza Z.

tom R. 57, nr 7

697-700

W artykule przedstawiono nową, metodę pomiaru lepkości ultracienkich warstw polimerów. Polega ona na zanurzeniu w warstwie drgającej sondy pomiarowej. Na podstawie zmian częstotliwości rezonansowej oraz fazy jej drgań można wyznaczyć wartość lepkości w funkcji głębokości zanurzenia. Grubość najcieńszej przebadanej warstwy wynosiła 30 nm, a dokładność pomiaru lepkości około 10%. Otrzymane wyniki są zgodne z przewidywaniami oraz z wynikami otrzymywanymi innymi metodami. Nowa metoda pomiarowa może być przydatna w rozwoju nowych technologii takich jak proces nanoimprint lithography.

A new method of measurement viscosity of thin polymeric films is presented. The probe, which is placed on the end of the arm of the mini tuning fork (Fig. 2) is made to oscillate and than is put into the PMMA (poly(methyl methacrylate)) films. Because of the rheological properties of measured samples, the amplitude and resonant frequency are changed. Simple mathematical model of probe, which is immersed partially into a liquid and oscillates, was elaborated. Thirteen samples were examined which differed from each other by the thickness of the film and the molecular weight. The thickness of the films is from 30 nm up to 1080 nm (Tab. 1). All measured properties are depended on temperature, thickness of the film, the depth of indentation of the probe and the molecular weight of PMMA. The viscosity is lower in higher temperatures (Fig. 5) but higher with bigger molecular weight (Fig. 6). They are also lower for thicker films. The results gained from this experiment may be useful in development of nanoimprint lithography and many other branches of nanotechnology. What is more, the method gives a possibility of fast and precise measure-ment of rheological properties of many different thin films in function of temperature.