Wyniki wyszukiwania - Biblioteka Nauki

Nowa wersja platformy, zawierająca wyłącznie zasoby pełnotekstowe, jest już dostępna.
Przejdź na https://bibliotekanauki.pl

Ograniczanie wyników

Znaleziono wyników: 3

Liczba wyników na stronie

Wyniki wyszukiwania

Wyszukiwano:
w słowach kluczowych: periodic patterns

Sortuj według:

Ogranicz wyniki do:

Computer animation in creative design

100%

Ślusarczyk G.

Machine Graphics and Vision

2007

tom Vol. 16, No. 1/2

85-104

The paper proposes a new approach to graphic design with the use of computer animation. The class of designs considered are periodic patterns. First, the characterization of rosettes, borders and periodic planar designs is given. Then, a generative system which produces a great variety of periodic designs is equipped with animation. As in-between animation frames ensure the continuity and fluidity of pattern movement, a dynamic continuous design space is obtained. The changes in pattern symmetry groups which result from the use of animation are described. The role of animation in supporting perception of the emergent shapes in the generated patterns is also mentioned. The paper is illustrated by periodic designs produced by the DARTAN animated generative system.

Generation of Large-area Arrays of Aperiodic Functional Micro/nano Structures Using Phase Shift Interferometry

86%

Pearly Princess J. , Alfred Kirubaraj A. , Christina Sophia S. , Senith S. , Jino Ramson S. R.

International Journal of Electronics and Telecommunications

2022

tom Vol. 68, No. 1

91--96

Phase shift interferometry (PSI) derived from interference technique as greater surface characterization technique based on the interference information recorded during a controlled phase shift. This research shows the development of micro/nano structures using phase shift interferometry. (PSI) is the process of developing the complex pattern structure using variable phase angle between two or more beams aligned to obtain functional aperiodic arrays. We have designed and modelled the PSI and simulated through MATLAB in 2D and 3D pattern structures. The PSI was performed in two process analysis. First, without PSI referring normal interference technique. Second, with PSI referring position of laser beams in quadrant-based alignment. The obtained results show the minimum feature structure was measured as 12 nm. This feature size developed under phase shift interferometry (PSI) produces minimum feature size compared to the existing interferometry technique. This study gives the promising increased fabrication area could develop large area arrays structures.

Influence of tilted surface alignment on flexoelectric domains in twisted nematic layers

72%

Buczkowska M. , Derfel G.

Scientific Bulletin. Physics / Lodz University of Technology

2017

tom Vol. 38

5--10

The small deformations induced by electric field in twisted flexoelectric nematic layers were simulated numerically. The onedimensional (i.e. homogeneous over the whole area of the layer) and two-dimensional (i.e. spatially periodic flexoelectric domains) deformations were considered. It was shown that the periodic deformations do not arise if sufficiently high pretilt angle is imposed by the boundary conditions. The value of pretilt angle necessary for elimination of domains increases with the flexoelectric coefficient e33. This result is of practical meaning because the flexoelectric domains are undesirable from an applicative point of view since they destroy the homogeneous appearance of the area of an excited pixel of a display.

Niewielkie odkształcenia wywołane polem elektrycznym w warstwach skręconego nematyka były symulowane numerycznie. Badano odkształcenia jednowymiarowe (tj. jednorodne na całej powierzchni warstwy) i dwuwymiarowe (tj. przestrzennie okresowe). Wykazano, że odkształcenia okresowe nie powstają, gdy warunki brzegowe narzucają odpowiednio duży kąt nachylenia uporządkowania powierzchniowego. Jego wartość rośnie ze wzrostem współczynnika fleksoelektrycznego e33. Wynik ten ma znaczenie praktyczne, ponieważ występowanie domen fleksoelektrycznych w urządzeniach ciekłokrystalicznych jest niepożądane.