Purpose: The aim of this paper was to investigate changes in surface morphology and optical parameters of thin films of poly(3,4-ethylenedioxythiophene) poly(styrenesulfonate) (PEDOT:PSS). Thin films were prepared using spin coating method. Design/methodology/approach: The thin films of PEDOT:PSS was investigate by Raman scattering technique in Raman spectrometer. The changes in surface topography were observed with the atomic force microscope AFM XE-100. The results of roughness have been prepared in the software XEI Park Systems. The measurement of optical parameter was performed using spectrometer UV/VIS and spectroscopic ellipsometer. Findings: Results and their analysis allow to conclude that the PEDOT:PSS solution concentration and spin speed, an important factor in spin coating technology, have a significant influence on surface morphology and optical reflection of thin films. Practical implications: Knowledge about the sol gel PEDOT:PSS optical parameters and the possibility of obtaining a uniform thin films show that it can be good material for photovoltaic and optoelectronic devices. Originality/value: The paper presents some researches of PEDOT:PSS thin films deposited by spin coating method on glass substrate.
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