Typical analysis of thermoluminescence (TL) is based on various curve fitting algorithms. Older methods used merely several characteristic points of TL curves as the peak position, inflection points or peak width. This approach is generally not suitable for advanced TL measurements utilizing simultaneous detection of wavelength and intensity of the emitted light. In this paper we present some numerical methods for modelling (simulation) of spectrally resolved thermoluminescence as well as determination of parameters of traps and recombination centres from measured data. The latter case is more complex. For this purpose we put forward a new technique called surface fitting. Exemplary data for selected materials are presented.
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.