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Application of atomic force microscopy in analysis of material surfaces

100%

Konstantová V.

tom Z. 16

47-55

Atomic Force Microscopy (AFM) is from the family of Scanning Probe microscopy common used technique for imaging analysis of material. This paper describe fundamentals of Atomic Force Microscopy - contact, semicontact and noncontact mode. Topography by semicontact mode will be presented by scan images of different type of materials, biological and technical. This work was done with the financial support of the VEGA project n. 1/0564/10 "Research of Structures, Morphologies of Surface and Properties of Nature Materials as Source of Inspiration for Non-conventional constructional Materials".

Material and Thermal Analysis of Laser Sintered Products

51%

Hudák R. , Šarik M. , Dadej R. , Živčák J. , Harachová D.

tom Vol. 7, no. 1

15-19

Thermal analysis of laser processes can be used to predict thermal stresses and consequently deformation in a completed part. Analysis of temperature is also the basic for feedback of laser processing parameters in manufacturing. The quality of laser sintered parts greatly depends on proper selection of the input processing parameters, material properties and support creation. In order to relatively big heat stress in the built part during sintering process, the thermal simulation and thermal analysis, which could help better understand and solve the issue of parts deformations is very important. Main aim of presented work is to prepare input parameters for thermal simulations by the use of RadTherm software (Thermoanalytics Inc., USA), directly during the sintering process and after the process and find out the impact of the heat stress on a final shape and size of the prototype. Subsequently, an annealing process of constructed products after DMLS could be simulated and specified.