Purpose: Surface texturisation is a common technological process in solar cell manufacturing aiming at a reduction of the light reflection losses. The standard alkaline texturing of multicrystalline silicon for solar cells is not effective because of random orientation of the grains. In this paper a method of laser texturisation has been proposed to overcome these difficulties. Design/methodology/approach: The microstructure of laser textured surface was investigated by DSM 940 OPTON scanning electron microscope (SEM). Electrical parameters of produced solar cells were characterized by measurements of I-V light characteristics under standard AM 1,5 radiation. Findings: The analysis performed in the paper revealed the existence of laser-damaged layer on the textured surface which has to be removed prior to successive technological steps to obtain solar cells of satisfactory performance. Research limitations/implications: It is suggested that future work should be done to develop a better post-scribe etching technique to remove the laser damaged layer. Originality/value: It seems to be very promising method since it can be applicable in industry.
Przedstawiono metodykę określania czasu życia nośników ładunku, wykorzystującą pomiar absorpcji optycznej nośników swobodnych w podczerwieni, pozwalającą na szybki, bezdotykowy i przeprowadzany z dużą rozdzielczością przestrzenną pomiar tego głównego parametru rekombinacyjnego. Metodyka ta uzupełnia dotychczas stosowane bezdotykowe metody pomiarowe czasu życia nośników ładunku stosowane w diagnostyce przemysłowej a może znaleźć szczególne zastosowanie do charakteryzacji multikrystalicznego krzemu.
EN
A method of charge carrier lifetime determination by using free carriers absorption measurement is presented. The method is quick, contactless and has good spatial resolution. It complements known contactless lifetime measurement methods applied in industry diagnostics and can be especially useful for multicrystalline silicon characterization.
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Purpose: The aim of the paper is to elaborate a laser method of texturization multicrystalline silicon. The main reason for taking up the research is that most conventional methods used for texturization of monocrystalline silicon are ineffective when applied for texturing multicrystalline silicon. This is related to random distribution of grains of different crystalographic orientations on the surface of multicrystalline silicon. Design/methodology/approach: The topography of laser textured surfaces were investigated using ZEISS SUPRA 25 and PHILIPS XL 30 scanning electron microscopes and LSM 5 Pascal ZEISS confocal laser scanning microscope. The reflectance of produced textures was measured by Perkin-Elmer Lambda spectrophotometer with an integrating sphere. Electrical parameters of manufactured solar cells were characterized by measurements of I-V illuminated characteristics under standard AM 1.5 radiation. Findings: A method of texturing of multicrystalline silicon surface using Nd:YAG laser appeared to be much more independent on grains crystallographic orientation compared to conventional texturing methods. Laser texturing makes it possible to increase absorption of the incident solar radiation. Research limitations/implications: The major inconveniences are surface damage in the heat affected zone and depositing of foreign materials during laser treatment. Applied etching procedure allows for obtaining solar cells of high efficiency larger in relation to cells without texture. Originality/value: This paper demonstrates that laser texturing has been shown to have great potential as far as its implementation into industrial manufacturing process of solar cells is concerned.
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