Wyniki wyszukiwania - Biblioteka Nauki

1

Formal definition and properties of FEB-based ENOB of intelligent cyclic ADC

100%

Platonov A. A. , Małkiewicz Ł. , Jędrzejewski K.

Metrology and Measurement Systems

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2008

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tom Vol. 15, nr 3

267-280

EN

The paper presents a new approach to the measurement of effective resolution (effective number of bits - ENOB) of the cyclic A/D converters (CADCs). The core idea of the approach is a direct measurement of ENOB using, as a numerical measure, the number of true bits before the first erroneous bit (FEB) in the code of the sample. The position of FEB is determined by the first non-zero bit in the binary presentation of the conversion error. The FEB-based definition of ENOB is introduced and discussed. The results of simulation evaluations of FEB distributions in sequential cycles of conversion are presented and values of FEB-based ENOB are compared with the conventional ENOB evaluations. The influence of DNL and INL errors of internal A/D converter on directly and conventionally measured values of ENOB is analysed. The proposed method of ENOB measurement is less dependent on the class of the testing signal and can be used for more adequate assessment of actual ADC resolution.

2

Particularities of the cyclic A/D converters ENOB definition and measurement

88%

Platonov A. A. , Małkiewicz Ł. M.

Metrology and Measurement Systems

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2008

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tom Vol. 15, nr 1

9-22

EN

The paper is devoted to the methods of accurate assessment and analysis of the expected and actual effective number of bits (ENOB) of cyclic analog-to-digital converters. The equivalence of definition of ENOB in the IEEE Standard 1241-2000 and proposed in earlier author's works analytical definition formulated on the basis of distributions of the input signal and conversion errors. Indirect and direct methods of ENOB measurement are considered. The presented results can be used for a development of accurate methods of performance analysis and testing of the cyclic and other ADCs.

3

DAC testing using modulated signals

75%

Fexa P. , Verdal J. , Svatoš J.

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tom Vol. 18, nr 2

283-293

EN

This document analyses qualities of methods used for testing dynamical parameters of Digital-to-Analog Converters (DAC) using a multi-frequency signal. As the source for these signals, Amplitude Modulated (AM) and Frequency Modulated (FM) signals are used. These signals are often used in radio engineering. Results of the tests, like Effective Number of Bits (ENOB), Signal-to-Noise and Distortion (SINAD), are evaluated in the frequency domain and they are compared with standard results of Sine Wave FFT test methods. The aim of this research is firstly to test whether it is possible to test a DAC using modulated signals, secondly to reduce testing time, while estimating band performance of DAC.

4

Model konwersji A/C oraz demodulator IQ dla radaru z cyfrowym formowaniem wiązki

71%

Nitecki D.

Elektronika : konstrukcje, technologie, zastosowania

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2013

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tom Vol. 54, nr 3

56-60

PL

W artykule omówiono zagadnienia dotyczące parametrów wielokanałowej konwersji analogowo-cyfrowej oraz cyfrowego demodulatora IQ. Przedstawiono cele prac modelowych z modułem konwersji A/C wraz z opisem ich realizacji. Opisano definicję i sposoby pomiaru parametrów konwersji analogowo-cyfrowej tj.: SFDR, SINAD, ENOB, THD oraz przesłuch międzykanałowy. Omówiono cyfrową demodulację IQ. Przedstawiono warunki pracy radaru oraz związane z nimi wymogi jakie muszą spełnić poszczególne etapy demodulacji. Opisano implementację cyfrowej demodulacji IQ w architekturze układu FPGA.

EN

This work concerns the necessary measures of the multi-channel ADC dynamic performance before the implementation of ADC module. It also presents the implmentation of the digital IQ demodulator in the FPGA device. Project based on the FPGA device allows to create multi-channel and fully-parallel systems. In addition one large FPGA devices allows to implement e.g. All digital IQ demodulation tracks in all receiving channels of the radar station. The system consists of FPGA also allows the designer to test the behavior of one component independenity of the others, which has a significant impact on ensuring the high reliability of the designed system.

5

Design and testing of CMOS asynchronous flash analog-to-digital converter

71%

Frankiewicz M. , Mroszczyk P. , Gołda A. , Kos A.

Elektronika : konstrukcje, technologie, zastosowania

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2009

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tom Vol. 50, nr 12

19-22

EN

The paper describes design and testing of the monolithic asynchronous analog-to-digital converter fabricated in CMOS AMS 0.35 µm technology. Two basic tests are applied to calculate error parameters of the ADC: code test to obtain a static characteristic and input-output test to measure the SNR (signal-to-noise), the ENOB (effective-number-of-bits), and propagation times to determine maximum conversion speed. Two different test circuits are used to measure these parameters. Unit under test is the 4-bit flash analog-to-digital asynchronous converter with additional error detection systems.

PL

Praca opisuje projekt i testy scalonego asynchronicznego przetwornika analogowo-cyfrowego typu flash wykonanego w technologii CMOS AMS 0,35 µm. W celu wyznaczenia parametrów i błędów układu zastosowano dwie metody: code test aby otrzymać charakterystykę statyczną i input-output test aby zmierzyć stosunek sygnału do szumu (SNR), efektywną liczbę bitów (ENOB) oraz czasy propagacji i maksymalną szybkość przetwarzania. Na potrzeby pomiarów zaprojektowano i zbudowano dwa układy testowe. Badany układ scalony stanowi 4-bitowy asynchroniczny przetwornik A/C z dodatkowymi układami wykrywającymi błędy przetwarzania.

6

DAC Testing Using Modulated Signals

51%

Fexa P. , Vedral J. , Svatoš J.

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