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A system for precise laser beam angular steering

100%

Iwasińska-Kowalska O.

tom Vol. 21, nr 1

27--36

A system for precise angular laser beam deflection by using a plane mirror is presented. The mirror was fixed to two supports attached to its edges. This article details the theoretical basis of how this deflector works. The spring deflection of a flat circular metal plate under a uniform axial buckling was used and the mechanical stress was generated by a piezoelectric layer. The characteristics of the deformation of the plate versus the voltage control of the piezoelectrics were examined and the value of the change resolution possible to obtain was estimated. An experimental system is presented and an experiment performed to examine this system. As a result, a resolution of displacement of 10-8 rad and a range of 10-5 rad were obtained.

Przyrządy do pomiaru konturu

100%

Iwasińska-Kowalska O.

2014

tom nr 3-4

106--107

Konturografy znajdują wiele zastosowań, choć mają swoje ograniczenia, takie jak mały zakres pomiarowy i pomiar wykonywany zwykle w jednej płaszczyźnie. Urządzenia te wymagają precyzyjnego doboru strategii pomiarowej, ze szczególnym uwzględnieniem wpływu samego obiektu pomiarowego na wynik.

Interferometric Set-Up for Measuring Thermal Deformations of Precision Construction Elements

45%

Dobosz M. , Kożuchowski M. , Ściuba M. , Iwasińska-Kowalska O. , Woźniak A.

tom Vol. 24, nr 2

241--254

Many precision devices, especially measuring devices, must maintain their technical parameters in variable ambient conditions, particularly at varying temperatures. Examples of such devices may be super precise balances that must keep stability and accuracy of the readings in varying ambient temperatures. Due to that fact, there is a problem of measuring the impact of temperature changes, mainly on geometrical dimensions of fundamental constructional elements of these devices. In the paper a new system for measuring micro-displacements of chosen points of a constructional element of balance with a resolution of single nanometres and accuracy at a level of fractions of micrometres has been proposed.