Ten serwis zostanie wyłączony 2025-02-11.
Nowa wersja platformy, zawierająca wyłącznie zasoby pełnotekstowe, jest już dostępna.
Przejdź na https://bibliotekanauki.pl
Preferencje help
Widoczny [Schowaj] Abstrakt
Liczba wyników

Znaleziono wyników: 3

Liczba wyników na stronie
first rewind previous Strona / 1 next fast forward last
Wyniki wyszukiwania
help Sortuj według:

help Ogranicz wyniki do:
first rewind previous Strona / 1 next fast forward last
1
Content available remote Resonant Photoemission Study οf 4f Electrons on the Surface οf Semiconductors
100%
|
|
nr S
S-103-S-114
EN
The contribution of 4f electrons to the electronic structure of the semiconductor clean surface caused by the surface doping of it by rare-earth metal atoms (Eu, Sm) will be presented. The surface doping was performed by the controlled, sequential deposition of the rare-earth metal atoms on the clean surface in UHV conditions (Sm on GaN or CdTe) or by the doping of the layer volume of (EuGd)Te. After each deposition or surface treatment the synchrotron radiation was used to measure in situ the resonant photoemission spectra (the Fano type resonance) to study the contribution of 4f electrons of divalent and trivalent Sm and Eu ions to the valence band electronic structure of created sample. The first stages of the metal atoms deposition lead to the surface doping. Further metal atoms deposition leads to the growth of the metallic islands on the surface and causes the appearance of the sharp metallic Fermi edge in the energy distribution curves. Proper coverage and annealing of the sample surface with metal atoms leads to the diffusion of the metal atoms into the sample and results in an increase in the crystal doping and decrease in the metallic islands contribution to the measured spectra. As a result, the new electronic structure of the valence band can be created and investigated in situ.
2
Content available remote Visible Luminescence from Porous Silicon
75%
EN
This paper presents results of investigation of the temperature dependence of visible luminescence in porous silicon layers prepared by anodization in hydrofluoric acid. Luminescence spectra were measured in the temperature range between 40 K and 350 K. Room temperature reflectivity spectra were also measured in vacuum ultraviolet radiation range from 4 eV to 12 eV.
3
Content available remote Photoemission Study of Mn 3d Electrons in the Valence Band of Mn/GeMnTe
63%
EN
We present the results of the electronic band structure study of Ge_{0.9}Mn_{0.1}Te epilayers, clean and modified in situ by deposition of manganese atoms. The sets of resonant photoemission spectra were measured for the photon energy range covering the energy of Mn 3p→3d transition (45
first rewind previous Strona / 1 next fast forward last
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.