Microstructural properties of Ce1−xGdxO2−δ (x = 0 to 0.3) thin films prepared by pulsed laser deposition technique were studied. The thin films were deposited on Si(100) substrate at a substrate temperature of 973 K at the oxygen partial pressure of 0.2 Pa using KrF excimer laser with energy of 220 mJ. The prepared thin films were characterized by X-ray diffraction, Raman spectroscopy and atomic force microscopy. X-ray diffraction analysis confirmed the polycrystalline nature of the thin films. Crystallite size, strain and dislocation density were calculated. The Raman studies revealed the formation of Ce–O with the systematic variation of peak intensity and full width half maxima depending on concentration of gadolinium dopant. The thickness of the films was estimated using Talystep profiler. The surface roughness was estiamted based on AFM.
A comparative analysis of a compact planar Square patch Microstrip Multiband antenna on three different substrates is proposed. The proposed design has a C-shaped slot etched on the square radiating part and the antenna is energized using microstrip feed line. RT Duroid (ε r= 2.2), Taconic (ε r= 3.2) and FR4 (ε r= 4.4) substrates are used for simulation analysis. The flow of current is modified by the C-shaped slot making the antenna to resonate at 3/4 and 6 bands for RT Duroid/Taconic and FR4 substrates respectively suitable for 5G sub GHz applications. The antenna has a compact dimension of 32 × 32 × 1.6 mm 3 and exhibits a return loss, S11 of less than -10dB for all the resonating frequencies for all three substrates. The analysis has been done by considering the S11 (Return loss <-10 dB), Directivity, Antenna Gain, VSWR and surface current distribution. Table II provides the comparison of parameters for different substrate material.
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