The interface states in TCO/Cds/CdTe and ZnO/CdS/Cu(In,Ga)Se₂ photovoltaic devices has been studied by use of reverse-bias transient capacitance spectroscopy. Laplace transform analysis has been used in order to enhance a spectral resolution of the technique. It is shown that the method yields useful information on the electronic characteristics of the heterointerface in the thin film solar cells. The conclusion include a degree of inversion of the heterointerface and a contribution of tunneling in the carrier transport. The influence of these factors on photovoltaic performance of the devices under study is discussed.
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Thin film solar cells based on Cd/Te/Cds are expected to become the base material for the low - cost and efficient large-scale solar energy conversion devices. The samples have been investigated using current-voltage (I-V) and capacitance-voltage (C-V) measurements in order to define the transport mechanism in heterostructure and basic electronic parameters. Trap-assisted tunnelling has been found to dominate carrier transport mechanism in the junction.
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