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2 Acta Physica Polonica A

2 2015

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XPS Valence Band Studies of LaNi_{5-x}Mₓ (M = Al, Co; x = 0, ,1) Alloy Thin Films

100%

Skoryna J. , Marczyńska A. , Pacanowski S. , Szajek A. , Smardz L.

nr 2

430-432

LaNi_{5-x}Mₓ (M = Al, Co) alloy thin films were prepared onto oxidised Si(100) substrates in the temperature range of 285-700 K using UHV magnetron co-sputtering. The surface chemical composition and valence bands of all the alloy thin films were measured in situ, immediately after deposition, transferring the samples to an UHV analysis chamber equipped with X-ray photoelectron spectroscopy. Results showed that the shape of the valence bands measured for the polycrystalline samples is practically the same compared to those obtained theoretically from ab initio band structure calculations. On the other hand, the X-ray photoelectron spectroscopy valence bands of the nanocrystalline thin films (especially LaNi₄Co) are considerably broader compared to those measured for the polycrystalline samples. This is probably due to a strong deformation of the nanocrystals. Therefore, the different microstructure observed in polycrystalline and nanocrystalline alloy thin films leads to significant modifications of their electronic structure.

Electronic Properties of In Situ Prepared Nanocrystalline Fe-Ni-Ti Alloy Thin Films

100%

Pacanowski S. , Skoryna J. , Marczyńska A. , Skoryna D. , Smardz L.

nr 2

436-438

In this contribution we study experimentally the electronic properties of nanocrystalline Fe-Ni-Ti alloy thin films using X-ray photoelectron spectroscopy. The structure of the samples has been studied by X-ray diffraction. Their bulk chemical compositions were measured using X-ray fluorescence method. The surface chemical composition and the cleanness of all samples were checked in situ, immediately after deposition, transferring the samples to an UHV analysis chamber equipped with X-ray photoelectron spectroscopy. X-ray diffraction studies revealed the formation of nanocrystalline Fe-Ni-Ti alloy thin films at a substrate temperature of about 293 K. In situ X-ray photoelectron spectroscopy studies showed that the valence bands of nanocrystalline samples are broader compared to those measured for the polycrystalline bulk alloys. Such modifications of the valence bands of the nanocrystalline alloy thin films could influence on their hydrogenation properties.