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2 Acta Physica Polonica A

2 1997

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Electrical and ESR Studies of GaN Layers Grown by Metal Organic Chemical Vapour Deposition

100%

Suchanek B. , Palczewska M. , Pakuła K. , Baranowski J. , Kamińska M.

nr 5

1001-1004

Electrical transport and ESR studies were performed on the state-of-theart GaN layers grown on sapphire substrate using metal organic chemical vapour deposition technique. For undoped samples electron concentration below 2×10^{17} cm^{-1} and mobility up to 500 cm^{2}/(V s) were achieved whereas hole concentration up to 7×10^{17} cm^{-3} and mobility about 16 cm^{2}/(V s) were obtained for intentionally Mg doped samples and subsequently annealed. Temperature dependence of mobility was discussed. ESR revealed the presence of two resonance absorption lines. One of them with g_{⊥}=1.9487 and g_{∥}=1.9515, commonly observed in n-type GaN was due to shallow donor. The second ESR line was an isotropic one of g=2.0032 and it is discussed.

High Resistivity GaN Single Crystalline Substrates

58%

Porowski S. , Boćkowski M. , Łucznik B. , Grzegory I. , Wróblewski M. , Teisseyre H. , Leszczyński M. , Litwin-Staszewska E. , Suski T. , Trautman P. , Pakuła K. , Baranowski J.

nr 5

958-962

High resistivity 10^{4}-10^{6} Ω cm (300 K) GaN single crystals were obtained by solution growth under high N_{2} pressure from melted Ga with 0.1-0.5at.% of Mg. Properties of these crystals are compared with properties of conductive crystals grown by a similar method from pure Ga melt. In particular, it is shown that Mg-doped GaN crystals have better structural quality in terms of FWHM of X-ray rocking curve and low angle boundaries. Temperature dependence of electrical resistivity suggests hopping mechanism of conductivity. It is also shown that strain free GaN homoepitaxial layers can be grown on the Mg-doped GaN substrates.