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Content available remote Grazing Incidence X-Ray Reflectivity Study of MBE-Grown Co/Cu Multilayers
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EN
In this work we report preliminary grazing-incidence X-ray reflectometry studies of multilayer structures composed of 3d metals Co and Cu deposited in the ultra-high vacuum molecular beam epitaxy system. The multilayers of different modulation period were deposited on glass substrate directly, or on 3d -metallic buffers of various thicknesses. The experimental specular reflectivity spectra were analyzed by a comparison with a theoretical model calculated from a recursive algorithm based on the Fresnel formula [1, 2]. It enabled us to estimate the structural parameters concerning layer thickness and roughness. The results obtained are correlated with magnetization measurements of the layered structures, as a function of modulation period, buffer type and thickness. A special attention to influence of interfacial roughness on magnetization results is paid.
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Content available remote STM/AFM Observations of Co/Cu Magnetic Multilayers
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EN
UHV deposited magnetic Co/Cu multilayers were investigated by means of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Surface of the sample i.e. upper covering layer in "plane" configuration and individual sublayers in "cross-section" configuration were investigated. A possibility of structure characterization of metallic multilayers by STM and AFM in the cross-section configuration is demonstrated.
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Content available remote Structure and Magnetism of MBE-Grown Co/Cu Multilayers
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EN
Structural and magnetic properties of Co/Cu multilayers deposited in the ultra-high vacuum molecular beam epitaxy system on glass substrates with different modulations periods were investigated. A structural characterization was performed by means of RHEED and Auger spectroscopy (in situ), small angle X-ray reflectivity and scanning tunneling microscopy. The samples obtained have a textured, polycrystalline layered structure for deposition at room temperature. Magnetization and in-plane magnetoresistance measurements were performed as a function of Cu and Co layer thicknesses. An influence of different buffers and of interface quality on magnetic properties was investigated.
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