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Al₂O₃/TiO₂ thin films were deposited onto monocrystalline silicon surfaces using an atomic layer deposition. Their surface morphology and optical properties were examined for their possible use in solar cells. The surface condition and chemical composition were characterized using a scanning electron microscope and the thickness was measured using a spectroscopic reflectometer. The refractive index and the reflection characteristics were determined. First, the optical properties of the Al₂O₃ thin filmand its influence on recombination in the semiconductor were examined. In this way, it can fulfil a double role in a solar cell. Since reflection reduction was only achieved in a narrow range, it was decided to use the Al₂O₃/TiO₂ system. Thanks to this solution, the light reflection was reduced in a wide range (even below 0.2%).
EN
This article introduces a zinc metal layer structure integrated into a standard photovoltaic (PV) module, potentially serving a double purpose: as a light reflecting and re-directing diffuser, increasing the PV module overall efficiency, offering anodic protection of Ag/Sn interface against corrosion within the PV module structure. The ethylene-vinyl acetate (EVA) cross-linking degree and peel force measurements were carried out to check the quality of the encapsulation process for the modified modules. Finally, the electrical series resistance of PV modules was measured showing that the modified PV module almost maintained its initial series resistance after exposure to damp-heat conditions of 85 °C, 85% relative humidity for 1000 h, while the unmodified PV module increased its resistance by 5% under the same conditions.
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