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2015
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tom Vol. 61, No. 7
302--304
EN
This paper presents an analysis of the impact of ambient temperature changes on main parameters of the interpolating time counter. The performed tests reveal that a relatively small change in the ambient temperature of 1°C causes a measurement error of the counter as large as 3.5 ps. The thorough research of two stages of interpolation of the counter allowed determining the main sources of the error. One of them is the temperature drift of widths of four-phase clock (FPC) segments in the first interpolation stage (FIS). It equals 2.5 ps/°C. The widths of FPC phases directly influence the active range of the second interpolation stage (SIS) and its offset. The test results also show that the temperature drift of the offset has a greater impact on the measurement accuracy than the temperature-driven changes of quantization steps in SIS. The presented conclusions are the first step to develop a new method for reducing the impact of changes in the ambient temperature on the measurement accuracy of the interpolating time counter.
PL
W artykule opisane są projekt i wyniki badań przetwornika czas-liczba o rozdzielczości 5,3 ps (1 LSB) i zakresie pomiarowym 428 ps. Do przetwarzania czasowo-cyfrowego użyta została metoda kodowania wielokrotnego. Metoda ta umożliwia pokonanie ograniczeń technologicznych współczesnych układów scalonych i uzyskanie wartości rozdzielczości mniejszej niż czas propagacji pojedynczej komórki linii kodującej. Przetwornik został zrealizowany w układzie programowalnym Spartan-6 firmy Xilinx.
EN
This paper presents the implementation and tests results of a time-to-digital converter based on the wave union method and implemented in Spartan-6 FPGA (Xilinx). The converter has the resolution of 5,3 ps (1 LSB) in the measurement range of 428 ps and the integral nonlinearity of 3,8 LSB (Fig. 7). In the wave union method, contrary to the typical conversion methods with a single coding, the resolution is lower than the FPGA cell delay thanks to coding several transitions of the time event signal (Fig. 2). In addition, the linearity of conversion is increased by reducing the width of wide bins. Although, using a multi-transition pattern gives better performance, it also brings more problems to be solved. The main problems such as implementation of a pattern generator for certain amount of transitions, minimal delays between transitions and elimination of bubble errors are discussed in this paper. The pattern generator (Fig. 3) is implemented with use of a carry chain. It enables controlling the pattern by means of diagnostic and measurement software. Bubble errors (Fig. 4) are eliminated with a fast asynchronous encoder (Fig. 5). The diagnostic-control software (Fig. 6) allows to configure the pattern generator, launch the measurement session and generate a text file with all information needed to calculate conversion characteristics of the time-to-digital converter.
3
80%
EN
We present a method and results of measurements of FPGA (Field Programmable Gate Array) selected timing parameters crucial in many timing sensitive applications such as precise time and frequency metrology. Two main parameters, i.e. the delay and its jitter, were evaluated for look-up-tables (delay 740 ps/jitter 1.33 ps), IO buffers (na/0.45 ps) and carry-chain multiplexers (28ps/0.153 ps) integrated in a programmable device Spartan-6 (Xilinx) which is one of most popular FPGA chips on the market now. Measurements were performed with the use of fast real-time sampling oscilloscope.
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