Wyniki wyszukiwania - Biblioteka Nauki

1

Noise Measurements Of Resistors With The Use Of Dual-Phase Virtual Lock-In Technique

100%

Stadler A. W. , Kolek A. , Zawiślak Z. , Dziedzic A.

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2015

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tom Vol. 22, nr 4

503--512

EN

Measurement of low-frequency noise properties of modern electronic components is a very demanding challenge due to the low magnitude of a noise signal and the limit of a dissipated power. In such a case, an ac technique with a lock-in amplifier or the use of a low-noise transformer as the first stage in the signal path are common approaches. A software dual-phase virtual lock-in (VLI) technique has been developed and tested in low-frequency noise studies of electronic components. VLI means that phase-sensitive detection is processed by a software layer rather than by an expensive hardware lock-in amplifier. The VLI method has been tested in exploration of noise in polymer thick-film resistors. Analysis of the obtained noise spectra of voltage fluctuations confirmed that the 1/f noise caused by resistance fluctuations is the dominant one. The calculated value of the parameter describing the noise intensity of a resistive material, C= 1·10−21m3, is consistent with that obtained with the use of a dc method. On the other hand, it has been observed that the spectra of (excitation independent) resistance noise contain a 1/f component whose intensity depends on the excitation frequency. The phenomenon has been explained by means of noise suppression by impedances of the measurement circuit, giving an excellent agreement with the experimental data.

2

Noise spectroscopy of resistive components at elevated temperature

100%

Stadler A. W. , Zawiślak Z. , Dziedzic A. , Nowak D.

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tom Vol. 21, nr 1

15--26

EN

Studies of electrical properties, including noise properties, of thick-film resistors prepared from various resistive and conductive materials on LTCC substrates have been described. Experiments have been carried out in the temperature range from 300 K up to 650 K using two methods, i.e. measuring (i) spectra of voltage fluctuations observed on the studied samples and (ii) the current noise index by a standard meter, both at constant temperature and during a temperature sweep with a slow rate. The 1/f noise component caused by resistance fluctuations occurred to be dominant in the entire range of temperature. The dependence of the noise intensity on temperature revealed that a temperature change from 300 K to 650 K causes a rise in magnitude of the noise intensity approximately one order of magnitude. Using the experimental data, the parameters describing noise properties of the used materials have been calculated and compared to the properties of other previously studied thick-film materials.

3

Rezystory grubowarstwowe RuO2 + szkoło jako kriogeniczne czujniki temperatury

75%

Mleczko K. , Żak D. , Kolek A. , Stadler A. W. , Szałański P. , Zawiślak Z.

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tom Vol. 46, nr 2-3

54-55

PL

Wykonane w laboratorium rezystory RuO2 + szkło badano pod kątem zastosowań w termometrii niskotemperaturowej. Badania obejmowały stabilność w cyklach chłodzenia od 300 do 77 K oraz pomiary zależności rezystancji od temperatury i pola magnetycznego.

EN

Laboratory-maded thick film RuO2 + glass resistors were tested for the application as low temperature thermometers. Stability in thermal cycles and temperature and magnetic field dependences of resistance were examinated.

4

Właściwości elektryczne grubowarstwowych rezystorów na bazie kompozycji polimerowych z nanorurkami węglowymi

75%

Stadler A. W. , Kolek A. , Mleczko K. , Zawiślak Z. , Ptak P. , Słoma M. , Jakubowska M.

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2010

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tom Vol. 51, nr 10

22-25

PL

W artykule omówiono wyniki badań rezystorów grubowarstwowych z fazą przewodzącą wykonaną nanorurek węglowych. Badania rezystancji i szumu niskoczęstotliwościowego prowadzono w zakresie temperatury T od 5 K do temperatury pokojowej z użyciem kriostatów: helowego i azotowego. Stwierdzono, że obserwowany szum jest typu rezystancyjnego o widmie 1/f. Zauważono, że intensywność szumu, mierzona w pasmach dekadowych rośnie ze wzrostem temperatury. Posługując się niskoczęstotliwościową, spektroskopią szumową, wykryto, w zakresie T>15 K, aktywowane termicznie źródła szumu o energii aktywacji w zakresie 25 meV-1,6 eV. Na podstawie temperaturowej zależności rezystancji wykazującej ujemny TWR wyznaczono bezwymiarową. czułość, która jest porównywalna z wartościami uzyskiwanymi dla kriogenicznych czujników temperatury. Wyznaczona wartość objętościowego współczynnika intensywności szumu warstwy rezystywnej, wskazuje, ze właściwości szumowe są gorsze niż w przypadku warstw rezystywnych RuO2 -szkło.

EN

Experimental studies of carbon nanotubes/polymer thick film resistors have been described. Liquid helium and nitrogen cryostats have been involved to study temperature dependence of resistance and noise in temperature range from 5 K up to room temperature. 1/f resistance noise has been observed. Noise intensity, calculated in decade frequency bands, significantly rises with increasing temperature. Thermally activated noise sources (TANS) of activation energies in the range 25 meV-1.6 eV have been revealed using low-frequency noise spectroscopy. Relatively large value of negative TCR has been obtained from resistance versus temperature curve. Calculated dimensionless sensitivity is similar to that observed in cryogenic temperature sensors. However, bulk noise intensity of resistive layer is larger than that obtained for RuO2 based resistive layers.

5

Noise Properties Of Thick-Film Conducting Lines For Integrated Inductors

75%

Stadler A. W. , Kolek A. , Mleczko K. , Zawiślak Z. , Dziedzic A. , Nowak D.

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tom Vol. 22, nr 2

229--240

EN

Studies of noise properties of thick-film conducting lines from Au or PdAg conductive pastes on LTCC or alumina substrates are reported. Experiments have been carried out at the room temperature on samples prepared in the form of meanders by traditional screen-printing or laser-shaping technique. Due to a low resistance of the devices under test (DUTs), low-frequency noise spectra have been measured for the dc-biased samples arranged in a bridge configuration, transformer-coupled to a low-noise amplifier. The detailed analysis of noise sources in the signal path and its transfer function, including the transformer, has been carried out, and a procedure for measurement setup self-calibration has been described. The 1/f noise component originating from resistance fluctuations has been found to be dominant in all DUTs. The analysis of experimental data leads to the conclusion that noise is produced in the bends of meanders rather than in their straight segments. It occurs that noise of Au-based laser-shaped lines is significantly smaller than screen-printed ones. PdAg lines have been found more resistive but simultaneously less noisy than Au-based lines.