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EN
A correlation between the growth process and electrical properties of [Ni_{80}Fe_{20}(2 nm)/Au(2 nm)/Co(0.8 nm)/Au(2 nm)]_{15} multilayers is presented. A set of multilayers of identical composition was deposited in different temperatures. The changes in giant magnetoresistance amplitude were correlated with the changes in Co layers growth process that occur in different temperatures. The in situ conductance measurement leads to the growth mechanism identification in high temperatures as formation of Co islands. Intensified islandisation of Co was eventually confirmed by the temperature changes in shape of the Hall voltage loops, and the evolution of Co layers contribution.
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In this contribution the in situ conductance vs. deposition time dependences of Fe/Si multilayers are analysed. The plot of resistance multiplied by the square of the thickness as a function of iron thickness shows that during the iron deposition initially amorphous-like Fe-Si mixture is formed, next the mixture crystallises, and finally bcc-Fe phase appears. The interface mixing is also manifested by the reduction of the total multilayer thickness measured by small angle X-ray diffraction.
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