Photoreflectance spectroscopy of low-dimensional semiconductor structures

• Autorzy: Misiewicz, J. , Sitarek, P. , Sęk, G.
• Języki publikacji: EN

Abstrakty

EN

In this paper, we present the applications of photoreflectance spectroscopy for investigations of low-dimensional, semiconductor structures. We briefly introduce the theoretical background of this technique including the line-shape expressions related to semiconductor microstructures. We show examples of photoreflectance investigations of two-dimensional structures such as quantum wells, multiple quantum wells and superlattices, one-dimensional structures-guantum wires, and quasi zero-dimensional structures-quantum dots. Finally, we concentrate our attention on investigations of the structures of semiconductor devices like high electron mobility transistors, heterojunction bipolar transistors and vertical / planar light emitting lasers structures.

Słowa kluczowe

EN

photoreflectance; low-dimensional heterostructures; transistors; semiconductor lasers

• Czasopismo: Opto-Electronics Review
• Rocznik: 2000
• Tom: Vol. 8, No. 1
• Strony: 1-24
• Opis fizyczny: Bibliogr. 59 poz.

Twórcy

autor

Misiewicz, J.

autor

Sitarek, P.

autor

Sęk, G.

• Institute of Physics, Wrocław University of Technology, 27 Wybrzeże St. Wyspiańskiego, 50-370 Wrocław, Poland,