Warianty tytułu
Języki publikacji
Abstrakty
The aim of the article is to show practical possibilities of LabView application in an EPC/EMC/RFID laboratory. This paper presents advantages and disadvantages of LabView graphical development environment for controlling of test equipment in case of electromagnetic compatibility of RFID systems. As an example the applications for pulse/burst generator verification, radiated immunity test controlling and intermediate frequency analyzing for assessment of Radio Frequency Identification Technology used in logistics applications are shown.
Słowa kluczowe
Czasopismo
Rocznik
Tom
Strony
4076--4083
Opis fizyczny
Bibliogr. 5 poz., fig., pełen tekst na CD
Twórcy
autor
- Institute of Logistics and Warehousing, Laboratory of Electronic Devices, Poznań, LA@ilim.poznan.pl
autor
- Institute of Logistics and Warehousing, Laboratory of Electronic Devices, Poznań, LA@ilim.poznan.pl
Bibliografia
- 1.LabView7 Express – Getting Started with LabVIEW, National Instrument, April 2003 Edition
- 2.EN 61000-4-5 Electromagnetic Compatibility – Testing and measurement techniques – Surge immunity test.
- 3.EN 61000-4-4 Electromagnetic Compatibility – Testing and measurement techniques – Electrical fast transient/ burst immunity test.
- 4.EN 61000-4-3 Electromagnetic Compatibility – Testing and measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test.
- 5.EN 55014-1:2000 Electromagnetic compatibility. Requirements for household appliances, electric tools and simi¬lar apparatus.
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.baztech-f39eabaa-2b1e-4633-87b4-df99e75cee99