Application of elastic peak electron spectroscopy in complex systems

• Autorzy: Lesiak, B.
• Konferencja: Techniki Próżni i Technologie Próżniowe (6, 7; 23-25.09.2002; Korbielów, Polska)
• Języki publikacji: EN

Abstrakty

EN

Elastic peak electron spectroscopy (EPES) investigates the elastic electron backscattering probality from solid surfaces and relates it to their surface properties. This phenomenon was used in many analytical applications. The aim of the present work was to apply the EPES method and the Monte Carlo algorothm for determining the electron inelastic mean free paths (IMFP) in complex systems. Influence of texture, surface roughness, density, surface composition and standard was investigated. New applications of the EPES method toward determining surface composition and density, are trends of its development have been indicated.

Słowa kluczowe

PL

spektrometria

• Czasopismo: Prace Naukowe Politechniki Warszawskiej. Elektronika
• Rocznik: 2002
• Tom: z. 143
• Strony: 45-52
• Opis fizyczny: Bibliogr. 23 poz., schem., wykr.

Twórcy

autor

Lesiak, B.

• Institute of Physical Chemistry, Polish Academy of Science, Warsaw

Bibliografia

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