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Prace Instytutu Technologii Elektronowej

2004 | z. 1/2 | 48-61
Tytuł artykułu

Department of Silicon Microsystem and Nanostructure Technology

Autorzy
Grabiec, P.
Warianty tytułu
Języki publikacji
EN
Abstrakty
Słowa kluczowe
PL
EN
Wydawca

Czasopismo
Prace Instytutu Technologii Elektronowej
Rocznik
2004
Tom
z. 1/2
Strony
48-61
Opis fizyczny
Bibliogr. 88 poz., il., wykr.
Twórcy
autor
Grabiec, P.
Bibliografia
  • Publications
  • [P1] AMATI M., BARAŃSKI M., BULGHERONI A., CACCIA M., DOMAŃSKI K., GRABIEC P., GRODNER M. JAROSZEWICZ B., KUCEWICZ W., KUCHARSKI K., KUTA S., MACHOWSKI W., MARCZEWSKI J., NIEMIEC H., SAPOR M., TOMASZEWSKI D.: Hybrid Active Pixel Sensors and SOI Inspired Option. Nucl. Instr. a. Methods A 2003 vol. 511 no 1-2 p. 265-270.
  • [P2] BARAŃSKI M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCEWICZ W., KUCHARSKI K., MARCZEWSKI J., NIEMIEC H., SAPOR M., TOMASZEWSKI D.: TSSOI as an Efficient Tool for Diagnostics of SOI Technology in the IET. Proc. of the IEEE 6th Symp. "Diagnostics and Yield", Warsaw, Poland, 22-25.06.2003 (CD-ROM).
  • [P3] BARAŃSKI M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCEWICZ W., KUCHARSKI K., MARCZEWSKI J., NIEMIEC H., SAPOR M., TOMASZEWSKI D.: TSSOI as an Efficient Tool for Diagnostics of SOI Technology in the IET. J. of Telecommun. a. Inform. Technol. (submitt. to publ.).
  • [P4] CACCIA M., AIROLDI A., DOMAŃSKI K., GRABIEC P., JAROSZEWICZ B., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D., ZALEWSKA A.: Silicon Ultra Fast Cameras for Electron and Gamma Sources in Medical Applications. Nucl. Physics В - Proc. Suppl. 2003 vol. 125 p. 133-138.
  • [P5] DOMAŃSKI K., GRABIEC P., MARCZEWSKI J., GOTSZALK T., IVANOV Tz., ABEDINOV N., RANGELOW I. W.: Fabrication and Properties of Piezoresistive Cantilever Beam with Porous Silicon Element. J. Vacuum Sci. Technol. В 2003 vol. 21 no 1 p. 48-52.
  • [P6] DOMARADZKI J., KACZMAREK D., WĘGRZECKI M., WĘGRZECKA I., BUDZYŃSKI T., KRZEMIŃSKI S., GRABIEC P.: Detectors of Optical and Nuclear Radiation Examined by the Light Beam Induced Current (LBIC) Method. Proc. Of SPIE, Lightmetry 2002 2003 vol. 5064 p. 275-280.
  • [P7] GOTSZALK T. P., GRABIEC P., RANGELOW I. W.: Application of Electrostatic Force Microscopy in Nanosystem Diagnostics. Mater. Sci. 2003 vol. 21 no 3 p. 333-339.
  • [P8] GOTSZALK T., GRABIEC P., RANGELOW I. W.: Calibration and Examination of Piezoresistive Wheatstone Bridge Cantilevers for Scanning Probe Microscopy. Ultramicroscopy 2003 vol. 97 no 1-4 p. 385-389.
  • [P9] GOTSZALK T., JANUS P., MARENDZIAK A., CZARNECKI P., RADOJEWSKI J., SZELOCH R., GRABIEC P., RANGELOW I. W.: Diagnostics of the Micro- and Nanostructure Using the Scanning Probe Microscopy. Proc. of the IEEE 6th Symp. "Diagnostics and Yield", Warsaw, Poland, 22-25.06.2003 (CD-ROM).
  • [P10] GRABIEC P., RADOJEWSKI J., ZABOROWSKI M., DOMAŃSKI K., SCHENKEL T., RANGELOW I. W.: Batch Fabricated Scanning Near Field Optical Microscope Atomic Force Microscopy Microrobe Integrated with Piezoresistive Cantilever Beam with Highly Reproducible Focused Ion Beam Micromachined Aperture. J. Vacuum Sci. Technol. В (in print).
  • [P11] GRABIŃSKI W., TOMASZEWSKI D., LEMAITRE L., JAKUBOWSKI A.: Standardization of the Compact Model Coding: Non-Fully Depleted SOI MOSFET Example. Proc. of the IEEE 6th Symp. "Diagnostics and Yield", Warsaw, Poland, 22-25.06.2003 (CD-ROM).
  • [P12] GRABIŃSKI W., TOMASZEWSKI D., LEMAITRE L., JAKUBOWSKI A.: Standardization of the Compact Model Coding: Non-Fully Depleted SOI MOSFET Example. J. of Telecommun. a. Inform. Technol. (submitt. to publ.).
  • [P13] IVANOV T., GOTSZALK T., GRABIEC P., TOMEROV E., RANGELOW I. W.: Thermally Driven Micromechanical Beam with Piezoresistive Deflection Readout. Microelectron. Eng. 2003 vol. 67-68 p. 550-5 5 6.
  • [P14] JAKUBOWSKA K., ŁUCZYŃSKI J.: Cutting of Semiconductor Wafers. Elektronizacja 2003 no 1 p. 13-15 (in Polish).
  • [P15] JAROSZEWICZ B., BUDZYŃSKI T., PANAS A., KOCIUBIŃSKI A., SŁYSZ W., JUNG W., JAKIELA R., BARCZ A., GRABIEC P., MARCZEWSKI J.: High Quality p-n Junction Fabrication by Ion Implantation using LPCVD Amorphous Silicon Films. Vacuum 2003 vol. 70 no 2-3 p. 81-85.
  • [P16] KAMIŃSKA E., GOŁASZEWSKA K., PIOTROWSKA A., KUCHUK A., KRUSZKA R., PAPIS E., SZELOCH R., JANUS P., GOTSZALK T., BARCZ A.: Study of Long-Term Stability of Ohmic Contacts to GaN. phys. stat. sol. (c) 2003 (submitt. to publ.).
  • [P17] KUCEWICZ W., ALEMI M., AMATI M., DOMAŃSKI K., GRABIEC P., JAROSZEWICZ A., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D., ZALEWSKA A.: Position Sensitive Silicon Detectors for Real Time Dosimetry in Medical Applications. Nucl. Instr. a Methods A (submitt. to publ.).
  • [P18] ŁYSKO J. M., ŁOZINKO J., JAŹWIŃSKI J., LATECKI B., PANAS A., GÓRSKA M.: Silicon Katarometr with the BSC-Type Contacts. Proc. of SPIE, Optoelectronic and Electronic Sensors V 2003 vol. 5124 p. 125-129.
  • [P19] ŁYSKO J. M., MRÓZ J., MAŁACHOWSKI M., LATECKI B., NIKODEM M., WRZESIŃSKA H., BUDZYŃSKI T.: Detection of Mining Gases Using TCD. Proc. of the II Domestic Conf. on Electronics KKE’03, Kołobrzeg, Poland, 9-12.06.2003, Vol. II p. 597-601.
  • [P20] MANASSON V. A., SADOVNIK L., ARETSKIN M., BRAILOVSKY A., GRABIEC P., ELIYAHU D., FELMAN M., KHODOS V., LITVINOV V., MARCZEWSKI J., MINO R.: Electronically Controlled Beam-Steering Antenna. Proc. of the 27th Annual Antenna Application Symp., Monticello, Illinois, U.S.A, 17-19.09.2003, p. 355-359.
  • [P21] MARCZEWSKI J., CACCIA M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KLATKA T., KOCIUBIŃSKI A., KOZIEŁ M., KUCEWICZ W., KUCHARSKI K., KUTA S., NIEMIEC H., SAPOR M., SZELEZNIAK M., TOMASZEWSKI D.: Monolithic Silicon Ріхеl Detectors in SOI Technology. Proc. of “Physics and Detectors for a 90 to 800 GeV Linear Collider”, Windermere, United Kingdom, 14-19.09.2003 (CD ROM).
  • [P22] MARCZEWSKI J., CACCIA M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KLATKA T., KOCIUBIŃSKI A., KOZIEŁ M., KUCEWICZ W., KUCHARSKI K., KUTA S., NIEMIEC H., SAPOR M., SZELEZNIAK M., TOMASZEWSKI D.: Monolithic Silicon Pixel Detectors in SOI Technology. Nucl Instr. a. Methods A (submitt. to publ.).
  • [P23] MARCZEWSKI J., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., TOMASZEWSKI D., KUCEWICZ W., KUTA S., MACHOWSKI W., NIEMIEC H., SAPOR M., CACCIA M.: SOI Active Pixel Detectors of Ionizing Radiation - Technology & Design Development. Proc. of “Physics and Detectors for a 90 to 800 GeV Linear Collider”, Portland, Oregon, U.S.A., 19-25.10.2003 (CD ROM).
  • [P24] MARCZEWSKI J., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., TOMASZEWSKI D., KUCEWICZ W., KUTA S., MACHOWSKI W., NIEMIEC H., SAPOR M., CACCIA M.: SOI Active Pixel Detectors of Ionizing Radiation - Technology & Design Development. 1EEE Trans. on Nucl. Sci. (submitt. to publ.).
  • [P25] MARCZEWSKI J., TOMASZEWSKI D., DOMAŃSKI K., GRABIEC P., CACCIA M., BORGHI S., CAMPAGNOLO R., KUCEWICZ W.: Charge Sharing Modelling in Pixel Detectors with Capacitive Charge Division. IEEE Trans. on Electron Dev. 2003 vol. 50 no 1 p. 26-31.
  • [P26] NIEMIEC H., BARAŃSKI M., KUCEWICZ W., KUTA S., MACHOWSKI W., SAPOR M., DOMAŃSKI K., GRABIEC P., GRODNER M., KUCHARSKI K., JAROSZEWICZ B., MARCZEWSKI J., TOMASZEWSKI D.: SOI Inspired Pixel Sensors. Proc. of the World-Wide Linear Collider Vertex Detector Workshop, Arlington, U.S.A, 8.01.2003 (http://design.lbl.gov/-natalie/program html).
  • [P27] NIEMIEC H., KLATKA T., KOZIEŁ M., KUCEWICZ W., KUTA S., MACHOWSKI W., SAPOR M., SZELEZNIAK M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D.: Technology Development for Silicon Monolithic Pixel Sensor in SOI Technology. Proc. of the 10th Int. Conf. M1XDES’2OO3, Łódź, Poland, 26-28.06.2003, p. 508-511.
  • [P28] NIEMIEC H., KLATKA T., KOZIEŁ M., KUCEWICZ W., KUTA S., MACHOWSKI W., SAPOR M., SZELEZNIAK M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A, KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D.: Technology Development for Silicon Monolithic Pixel Sensor in SOI Technology. Elektronizacja 2003 no 10 p. 19-24 (in Polish).
  • [P29] NIEMIEC H., KOZIEŁ M., KLATKA T., KUCEWICZ W., KUTA S., MACHOWSKI W., SAPOR M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D., CACCIA M.: Monolithic Pixel Sensor in SOI Technology -First Test Results. Proc. of the 4th ECFA/DESY Workshop on Physics and Detectors, Amsterdam, Holland, 1-4.04.2003 (http://www.nikhef.nl/ ecfa-desy/ECspecific/Program/Presentations/April-2/Par-3-З//A/niemiec-h.ppt).
  • [P30] PIJANOWSKA D., TORBICZ W., JAROSZEWICZ B., GRABIEC P.: p-Well ISFET Туре Pehametric Sensors. Elektronizacja 2003 no 6 p. 26-20 (in Polish).
  • [P31] RADOJEWSKI J., GRABIEC P.: Combined SNOM/AFM Microscopy with Micromachined Nano- apertures. Mater. Sci. 2003 vol. 21 no 3 p. 319-332.
  • [P32] SCHENKE T., RANGELOW I. W., KELLER R., PARK S. J., NILSSON J., PERSAUD A., RADMILOVIC V. R., GRABIEC P., SCHNEIDER D. H., LIDDLE J. A., BOKOR J.: Open Questions in Electronic Sputtering of Solids by Slow Highly Charged lons with Respect to Applications in Single Ion Implantation. Proc. of the 16th Int. Conf. on Ion Beam Analysis, Albuquerque, NM, U.S.A, June 2003, Nucl. lnstr. a. Methods В (submitt. to publ.).
  • [P33] SZELOCHR. F., GOTSZALKT. P., JANUS P.: Thermal Characterisation of Micro-Devices with Far and Near Field Microscopy. Opt. Appl. (in print).
  • [P34] TOMASZEWSKI D., GRABIŃSKI W., LEMAITRE L., JAKUBOWSKI A.: Silicon-Insulator MOSFET Modelling and Its Verilog-A Coding. Proc. of the 10th Int. Conf. MIXDES’2OO3, Łódź, Poland, 26-28.06.2003, s. 105-110.
  • [P35] TOMASZEWSKI D., KOCIUBIŃSKI A., KUCHARSKI K.: MOSTXX - Software for Extraction of the Parameter of MOSFET Models. Proc. of the IV Domestic Conf. “Computer Methods and Systems in Research and Engineering.”, Cracow, Poland, AGH, 26-28.11.2003 (in print, in Polish).
  • [P36] TOMASZEWSKI D., KOCIUBIŃSKI A., MARCZEWSKI J., KUCHARSKI K., DOMAŃSKI K., GRABIEC P.: A Versatile Tool for Extraction of MOSFETs Parameters. Proc. of the IEEE 6th Symp. "Diagnostics and Yield", Warsaw, Poland, 22-25.06.2003 (CD-ROM).
  • [P37] TOMASZEWSKI D., KOCIUBIŃSKI A., MARCZEWSKI J., KUCHARSKI K., DOMAŃSKI K., GRABIEC P.: A Versatile Tool for Extraction of MOSFETs Parameters. J. of Telecom. a. Inform. Technol. (submitt. to publ.).
  • [P38] WĘGRZECKA I., WĘGRZECKI M., BAR J., GRYNGLAS M., GRÓDECKI R., USZYŃSKI A., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T.: Silicon Avalanche Photodiodes Developed in the Institute of Electron Technology. Proc. of the XVII School of Optoelectronics “Photovoltaics - Solar Cells and Detectors”, Kazimierz Dolny, Poland, 13-16.10.2003 (in print, in Polish).
  • [P39] WĘGRZECKA I., WĘGRZECKI M., BAR J., GRYNGLAS M., USZYŃSKI A., GRÓDECKI R., GRABIEC Р., KRZEMIŃSKI S., BUDZYŃSKI T.: Silicon Avalanche Photodiodes in Poland and World-wide. Proc. of SPIE (in print).
  • [P40] WĘGRZECKA I., WĘGRZECKI M., SŁYSZ W., BAR J., GRÓDECKI R., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T.: Silicon Avalanche and PIN Photodiodes. Proc. of the XVII School of Optoelectronics “Photovoltaics - Solar Cells and Detectors”, Kazimierz Dolny, Poland, 13-16.10.2003 (in print, in Polish).
  • [P41] WĘGRZECKI M., WĘGRZECKA I., BAR J., SŁYSZ W., GRODECKI R., GRYNGLAS M., USZYŃSKI A., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T., PANAS A.: Silicon Detectors of Optical and Nuclear Radiation with a PIN and PN Structure Developed in the Institute of Electron Technology. Proc. of the XVII School of Optoelectronics “Photovoltaics - Solar Cells and Detectors” Kazimierz Dolny, Poland, 13-16.10.2003 (in print, in Polish).
  • [P42] WĘGRZECKI M., WĘGRZECKA I., BAR J., SŁYSZ W., GRYNGLAS M., USZYŃSKI A., GRÓDECKI R., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T., PANAS A.: Silicon Detectors of Optical and Nuclear Radiation, Manufactured at ITE. Proc. of SPIE (in print).
  • [P43] WRZESIŃSKA H., RATAJCZAK J., STUDZIŃSKA K., KĄTCKI J.: Transmission Electron Microscopy of Hard Ceramic Superlattices Applied in Silicon Micro Electro Mechanical Systems. Mater. Chem. a. Phys. 2003 vol. 81 no 2-3 p. 265-268.
  • [P44] ZAJĄC J., WÓJCIK J., KOCIUBIŃSKI A., TOMASZEWSKI D.: Semi-Automatic Test System for Characterization of ASIC/MPWs. Proc. of the IEEE 6th Symp. "Diagnostics and Yield", Warsaw, Poland, 22-25.06.2003 (CD-ROM).
  • [P45] ZAJĄC J., WÓJCIK J., KOCIUBIŃSKI A., TOMASZEWSKI D.: Semi-Automatic Test System for Characterization of ASIC/MPWs. J. of Telecom, a. Inform. Technol. (in print)
  • Conferences
  • [C1] ABEDINOV N., POPOV C., JORDANOV J., IVANOV T., GOTSZALK T., GRABIEC P., RANGELOW I., FILENKO D., SHIRSHOV Y.: Chemical Recognition Based on Micromachined Silicon Cantilever Array. 47th Int. Conf. on Electron, Ion, and Photon Beam Technology & Nanofabrication, Tampa, U.S.A, 27-30.05.2003 (present.).
  • [C2] BARAŃSKI M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A, KUCEWICZ W., KUCHARSKI K., MARCZEWSKI J., NIEMIEC H., SAPOR M., TOMASZEWSKI D.: TSSOI as an Efficient Tool for Diagnostics of SOI Technology in the IET. IEEE 6th Symp. "Diagnostics and Yield", Warsaw, Poland, 22-25.06.2003 (poster).
  • [C3] CACCIA M., DOMAŃSKI K., GRABIEC P., JAROSZEWICZ B., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D.: Silicon Ultra Fast Cameras for Electron and у Sources in Medical Applications. 8thTopical Seminar on Innovative Particle and Radiation Detectors, Siena, Italy, 21-24.10.2002 (inv. paper).
  • [C4] DOMAŃSKI K., GRABIEC P.: CMOS and Micromechanical Technologies. I st Silicon MEMS Technology Hands-On Course - a Reason Project Tutorial. Warsaw, Poland, ITE, 9-12.06.2003 (paper).
  • [C5] GOTSZALK T., CZARNECKI P., GRABIEC P., DOMAŃSKI K., ZABOROWSKI M., RANGELOW I. W.: Microfabricated Cantilever with Metallic Tip for Electrostatic and Capacitance Microscopy and Its Ap- plication to Investigation of Semiconductor Devices. 47th Int. Conf. on Electron, Ion, and Photon Beam Technology & Nanofabrication, Tampa, U.S.A, 27-30.05.2003 (poster).
  • [C6] GOTSZALK T., JANUS P., MARENDZIAK A., CZARNECKI P., RADOJEWSKI J., SZELOCH R., GRABIEC P., RANGELOW I. W.: Diagnostics of Micro- and Nanostructure Using the Scanning Probe Microscopy. IEEE 6th Symp. "Diagnostics and Yield", Warsaw, Poland, 22-25.06.2003 (paper).
  • [C7] GRABIEC P.: Throughout Six Orders of Magnitude - Fabrication of Соmplex 3D Structures for MEMS and MOEMS. IEEE 6th Symp. "Diagnostics and Yield.", Warsaw, Poland, 22-25.06.2003 (paper).
  • [C8] GRABIEC P.: Microsystems-a Review. I st Silicon MEMS Technology Hands-On Course-a Reason Project Tutorial. Warsaw, Poland, ITE, 9-12.06.2003 (paper).
  • [C9] GRABIEC P.: Safety and Cleanliness in Microengineering Technology. I st Silicon MEMS Technology Hands-On Course - a Reason Project Tutorial. Warsaw, Poland, ITE, 9-12.06.2003 (paper).
  • [C10] GRABIEC P.: Microsystems in Chemistry, Biology and Medicine. I st Polish User Supplier Club Meet., Warsaw, Poland, 23.01.2003 (paper, in Polish).
  • [C11] GRABIEC P., DOMAŃSKI K., JANUS P., ZABOROWSKI M.: Microsystem Technology as a Road from Macro to Nano-World. New Opportunities Created by National Centre of Silicon Micro- and Nanotechnology. Int. Workshop on Surface Modification for Chemical and Biochemical Sensing, SMCBS 2003, Białowieża, Poland, 13-16.11.2003 (present.).
  • [C12] GRABIEC P., DOMAŃSKI K., ZABOROWSKI M., RANGELOW I. W., GOTSZALK T.: Nano-Width Lines Using Lateral Pattern Definition Technique for Nanoimprint Templates. Micro a. Nano Engineering MNE 2003, Cambridge, United Kingdom, 22-25.09.2003 (paper).
  • [C13] GRABIEC P., OBRĘBSKI D.: CMOS IC Microsystem Phototyping Service at the Institute of Electron Technology. National Centre of Silicon Micro- and Nano-Technology - Progress Report. 10 th Int. Conf. Mixed Design of Integrated Circuits and Systems, Łódź, Poland, 26-28.06.2003 (paper).
  • [C14] GRABIEC P., RADOJEWSKI J., ZABOROWSKI M., DOMAŃSKI K., SCHENKEL T., RANGELOW I. W.: Batch Fabricated SNOM/AFM Microprobe Integrated with Piezoresistive Cantilever Beam with Highly Reproducible FIB Micromachined Aperture. 47th Int. Conf. on Electron, Ion, and Photon Beam Technology & Nanofabrication, Tampa, U.S.A, 27-30.05.2003 (poster).
  • [C15] GRABIEC P., RYMUZA Z.: Microsystems, Technologies and Applications. 1 st Polish User Supplier Club Meet., Warsaw, Poland, 23.01.2003 (present., in Polish).
  • [C16] GRABIŃSKI W., TOMASZEWSKI D., LEMAITRE L., JAKUBOWSKI A.: Standardization of the Compact Model Coding: Non-Fully Depleted SOI MOSFET Example. IEEE 6th Symp. "Diagnostics and Yield", Warsaw, Poland, 22-25.06.2003 (poster).
  • [C17] KUCEWICZ W., ALEMI M., AMATI M., BADANO L., BARTSCH V., BERST D., BIANCHI C., DE BOER W., BOL H., BULGHERONI A., CACCIA M., CAPPELLINI C., CANNILLO F., CLAUS G., COLLEDANI C., CONTE L., CZERMAK A., DEPTUCH G., DLERLAMM A., DOMAŃSKI K., DULINSKI W., DULNY В., FERRANDO O., GRABIEC P., GRIGORIEV E., JAROSZEWICZ B., JUNGERMANN L., KUCHARSKI K., KUTA S., LEO G., LORUSSO R., MARCZEWSKI J., MONDRY G., MACHOWSKI W., NIEMIEC H., NOVARIO R., PEZZETTA M., POPOSKI Y., PREST M., RIESTER J.-L., SAMPIETRO C., SAPORM., SCHWEICKERT H., TOMASZEWSKI D., ZALEWSKA A.: Position Sensitive Silicon Detectors for Real Time Dosimetry in Medical Applications. 9th Pisa Meet. on Advanced Detectors, La Biadola, Italy, 25—31.05.2003 (paper).
  • [C18] ŁYSKO J. M., MRÓZ J., MAŁACHOWSKI M., LATECKI B., NIKODEM M., WRZESIŃSKA H., BUDZYŃSKI T.: Detection of Mining Gases using TCD. II Domestic Conf. on Electronics KKE’03, Kołobrzeg, Poland, 9-12.06.2003 (paper, in Polish).
  • [C19] MANASSON V. A., SADOVNIK L., ARETSKIN M., BRAILOVSKY A., GRABIEC P., ELIYAHU D., FELMANM., KHODOS V., LITVINOV V., MARCZEWSKI J., MINO R.: Electronically Controlled Beam- -Steering Antenna. 27th Annual Antenna Application Symp., Monticello, Illinois, U.S.A, 17-19.09.2003 (paper).
  • [C20] MARCZEWSKI J.: Physical Background of Semiconductor Devices. I st Silicon MEMS Technology Hands-On Course - a Reason Project Tutorial. Warsaw, Poland, ITE, 9-12.06.2003 (paper).
  • [C21] MARCZEWSKI J., CACCIA M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KLATKA T, KOCIUBIŃSKI A., KOZIEŁ M., KUCEWICZ W., KUCHARSKI K., KUTA S., NIEMIEC H., SAPORM., SZELEZNIAK M., TOMASZEWSKI D.: Monolithic Silicon Pixel Detectors in SOI Technology. 12th Int. Workshop on Vertex Detectors VERTEX 2003, Low Wood Lake Windermere Cumbria, United Kingdom, 14-19.09.2003 (paper).
  • [C22] MARCZEWSKI J., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., TOMASZEWSKI D., KUCEWICZ W., KUTA S., MACHOWSKI W., NIEMIEC H., SAPOR M., CACCIA M.: SOI Active Pixel Detectors of Ionizing Radiation - Technology & Design Development. IEEE Conf. -Nuclear Science Symp. 2003, Portland, Oregon, U.S.A, 19-25.10.2003 (paper).
  • [C23] NIEMIEC H., BARAŃSKI M., KUCEWICZ W., KUTA S., MACHOWSKI W., SAPOR M., DOMAŃSKI K., GRABIEC P., GRODNER M., KUCHARSKI K., JAROSZEWICZ B., MARCZEWSKI J., TOMASZEWSKI D.: SOI Inspired Pixel Sensors. World-Wide Linear Collider Vertex Detector Workshop, Arlington, LU.S.A, 8.01.2003 (paper).
  • [C24] NIEMIEC H., KLATKA T., KOZIEŁ M., KUCEWICZ W., KUTA S., MACHOWSKI W., SAPOR M., SZELEZNIAK M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D.: Technology Development for Silicon Monolithic Pixel Sensor in SOI Technology. 10th int. conf. MIXDES’ 2003, Łódź, Poland, 26-28.06.2003 (commun.).
  • [C25] NIEMIEC H., KOZIEŁ M., KLATKA T., KUCEWICZ W., KUTA S., MACHOWSKI W., SAPOR M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K, MARCZEWSKI J., TOMASZEWSKI D., CACCIA M.: Monolithic Pixel Sensor in SOI Technology - First Test Results. 4th ECFA/DESY Workshop on Physics and Detectors, Amsterdam, Holland, 1-4.04.2003 (paper).
  • [C26] SCHENKE T., RANGELOW I. W., KELLER R., PARK S. J., NLLSSON J., PERSAUD A., RADMILOYIC V. R., GRABIEC P., SCHNEIDER D. H., LIDDLE J. A., BOKOR J.: Open Questions in Electronic Sputtering of Solids by Slow Highly Charged Ions with Respect to Applications in Single Ion Implantation. 16Ih Int. Conf. on Ion Beam Analysis, Albuquerque, NM, LJ.S.A, June 2003 (present.).
  • [C27] TOMASZEWSKI D., GRABIŃSKI W., LEMAITRE L., JAKUBOWSKI A.: Silicon-Insulator MOSFET modelling and Its Verilog-A Coding. 10th Int. Conf. MlXDES’2003, Łódź, Poland, 26-28.06.2003 (commun.).
  • [C28] TOMASZEWSKI D., KOCIUBIŃSKI A., MARCZEWSKI J., KUCHARSKI K., DOMAŃSKI K., GRABIEC P.: A Versatile Tool for Extraction of MOSFETs Parameters. IEEE 6th Symp. "Diagnostics and Yield", Warsaw, Poland, 22-25.06.2003 (poster).
  • [C29] TOMASZEWSKI D., KOCIUBIŃSKI A., KUCHARSKI K.: MOSTXX - Software for Extraction of the Parameter of MOSFET Models. IV Domestic Conf. “Computer Methods and Systems in Research and Engineering”. Cracow, Poland, AGH, 26-28.11.2003 (commun., in Polish).
  • [C30] WĘGRZECKA I., WĘGRZECKI M., BAR J., SŁYSZ W., GRÓDECKI R., GRYNGLAS M., USZYŃSKI A, GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T., PANAS A.: Silicon Detectors of Optical and Nuclear Radiation with a PIN and PN Structure Developed in the Institute of Electron Technology. Conf. Optoelectronics’2003, Poznań, Poland, 11-12.06.2003 (commun., poster, in Polish).
  • [C31 ] WĘGRZECKA I., WĘGRZECKI M., SŁYSZ W., BAR J., GRÓDECKI R., GRABIEC P., KRZEMIŃSKI S, BUDZYŃSKI T.: Silicon Avalanche Photodiodes and PIN Photodiodes. XVII School of Optoelectronics “Photovoltaics - Solar Cells and Detectors”, Kazimierz Dolny, Poland, 13-16.10.2003 (inv. paper).
  • [C32] WĘGRZECKA I., WĘGRZECKI M., BAR J., GRYNGLAS M., USZYŃSKI A., GRÓDECKI R., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T.: Silicon Avalanche Photodiodes in Poland and World-wide. XII IEEE-SPIE Symp. on Photonics and Web Engineering, Wilga, Poland, 22-25.05.2003 (inv. paper).
  • [C33] WĘGRZECKI M., GRABIEC P., BAR J., WĘGRZECKA I., GRÓDECKI R., SŁYSZ W., USZYŃSKI A, GRYNGLAS M., KRZEMIŃSKI S., BUDZYŃSKI T., ZABOROWSKI M., PANAS A., STUDZIŃSKA K., WRZESIŃSKA H., CLEŻ M., GANDURSKA J., Marek A.: Research on Silicon Monolithic Photovoltaic Cells in the Institute of Electron Technology. XVII School of Optoelectronics “Photovoltaics - Solar Cells and Detectors”, Kazimierz Dolny, Poland, 13-16.10.200 (poster, in Polish).
  • [C34] WĘGRZECKI M., WĘGRZECKA M., BAR J., SŁYSZ W., GRYNGLAS M., USZYŃSKI A., GRÓDECKI R., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T., PANAS A.: Silicon Detectors of Optical and Nuclear Radiation, Manufactured at ITE. XII IEEE - SPIE Symp. on Photonics and Web Engineering, Wilga, Poland, 22-25.05.2003 (inv. paper).
  • [C35] ZABOROWSKI M., GRABIEC P.: Silicon Technology Processes for Microsystems Fabrication. I st Silicon MEMS Technology Hands-On Course - a Reason Project Tutorial. Warsaw, Poland, ITE, 9-12.06.2003 (paper).
  • [C36] ZABOROWSKI M., GRABIEC P., RANGELOW I. w.: Nano-Width Lines Using Lateral Pattern Definition Technique for Nanoimprint Templates. Micro a. Nano Engineering MNE 2003, Cambridge, United Kingdom, 22-25.09.2003 (paper).
  • [C37] ZAJĄC J., WÓJCIK J., KOCIUBIŃSKI A., TOMASZEWSKI D.. Semi-Automatic Test System for Characterization of ASIC/MPWs. IEEE 6th Symp. “Diagnostics & Yield”, Warsaw, Poland, 22-25.06.2003 (poster).
  • Patents
  • [PA1] DUMANIA P.: Circuit for Detection of Stress in Silicon Micromechanical Structures. Pat. Appl. no P.361525 (in Polish).
  • [PA2] GRABIEC P., RANGEŁOW I., SUNYK R., GOTSZALK T., STUDZIŃSKA K.: Microrobe for Atomic-Force Measurements. Pat. RP no P328752 (in Polish).
  • [РАЗ] GRABIEC P., ZABOROWSKI M., DOMAŃSKI K., RANGEŁOW I.: a Way to Form Nano-Paths. Pat. Appl. no P.359838 (in Polish).
  • [PA4] GRABIEC P., ZABOROWSKI M., DOMAŃSKI K., RANGEŁOW I.: A Way to Form Nano-Wires. Pat. Appl. no P.359839 (in Polish).
  • [PA5] GRABIEC P., ZABOROWSKI M., RANGEŁOW I., DOMAŃSKI K.; A Way to Form a Stamp for Nanolithograpy by Means of Stamping. Pat. Appl. no P.362344 (in Polish).
  • [PA6] ZABOROWSKI M., GRABIEC P., BUDZYŃSKI T.: A Way to Form a Chromium Fiat Bar in Nano- Devices. Pat. Appl. no P.360303 (in Polish).
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