Department of Silicon Microsystem and Nanostructure Technology

• Autorzy: Grabiec, P.
• Języki publikacji: EN

Słowa kluczowe

PL

Instytut Technologii Elektronowej; działalność naukowo-badawcza

EN

Institute of Electron Technology; scientific activity

• Czasopismo: Prace Instytutu Technologii Elektronowej
• Rocznik: 2005
• Tom: z. 1/2
• Strony: 43-56
• Opis fizyczny: Bibliogr. 69 poz., il., wykr.

Twórcy

autor

Grabiec, P.

• Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warsaw, Poland,

Bibliografia

• [P1] ALEMI M., BULGHERONI A., CACCIA M., ANELLI M., BERTOLUCCI S., CORDELLI M., MISCETTI M., BETINI M., BORSATO E., CHECCHIA P., FANIN C., MARGONI M., NICOLETTO M., PEGHIN R., MARCZEWSKI J.: LCCAL. a Calorimeter Prototype for Future Linear Colliders. Proc. of the 8th Conf. Astroparticle, Particle and Space Physics, Detectors and Medical Physics Applications, World Sci. Publ. 2004, p. 181-187.
• [P2] BARCZ A., PANAS A., JAKIELA R.: Out- and In-Diffusion of Oxygen 160 in Silicon. Semicond. Sci. a. Technol. 2004 vol. 19 no 11 p. 1311-1314.
• [P3] BETINI M., BORSATO E., CHECCHIA P., NICOLETTO M., NADULATE B., VALLAZZA E., JAROSZEWICZ B., MARCZEWSKI J., TOMASZEWSKI D., BERTOLUCCI S., MISCETI S., ALEMI M., BULGHERONI A., CACCIA M., CAPELLINI C., PREST M., KUCEWICZ W.: Silicon PAD Detectors for an Electromagnetic Calorimeter at Future Linear Collider Experiments - Characterisation and Test Beam Results. Proc. of the 8th Conf. Astroparticle, Particle and Space Physics, Detectors and Medical Physics Applications, World Sci. Publ. 2004, p. 176-79.
• [P4] BULGHERONI A., CACCIA M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KLATKA T., KOCIUBIŃSKI A., KOZIEŁ M., KUCEWICZ W., KUCHARSKI K., KUTA S., MARCZEWSKI J., NIEMIEC H., SAPOR M., SZELEZNIAK M., TOMASZEWSKI D.: Monolithic Active Pixel Detector Realized in Silicon on Insulator Technology. Nucl. Instr. a. Meth. A 2004 vol. 535 no 1-2 p. 398-403.
• [P5] DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., JASIELSKI J., KLATKA T., JASTRZĄB M., KLATKA M., KOZIEŁ M., KUCEWICZ W., KUCHARSKI K., KUTA S., MARCZEWSKI J., NIEMIEC H., SAPOR M., TOMASZEWSKI D.: Monolithic Active Pixel Detector in SOI Technology. Elektronika 2004 no 10 p. 39-41 (in Polish).
• [P6] GOTSZALK T., CZARNECKI P., GRABIEC P., DOMAŃSKI K., ZABOROWSKI M., RANGELOW I. W.: Microfabricated Cantilever with Metallic Tip for Electrostatic and Capacitance Microscopy and Its Application to Investigation of Semiconductor Devices. J. of Vacuum Sci. a. Technol. B 2004 vol. 22 no 2 p. 506-509.
• [P7] GOTSZALK T., KOLANEK K., HASEK T., SIKORA A., SZERLOCH R., GRABIEC P., DOMAŃSKI K., JANUS P.: Electronic Measurement Circuits Co-Operating with Microsystem Piezoresistive Sensors of Force. Proc. of the III Domestic Conf. on Electronics KKE’04, Kołobrzeg, Poland, 16-18.06.2004, vol. 1/2 p. 253-258 (in Polish).
• [P8] GOTSZALK T., RADOJEWSKI J., SZERLOCH R., MARENDZIAK A., SIKORA A., HASEK T., KOLANEK K., GRABIEC P., RANGELOW I. W.: Diagnostics of Materials and Micro- and Nanoelectronic Circuits using Methods of Modular Microscopy of Short-Range Interactions. Proc. of the III Domestic Conf. on Electronics KKE ’04, Kołobrzeg, Poland, 16-18.06.2004, vol. 1/2 p. 73-828 (in Polish).
• [P9] GOTSZALK T., SIKORA A., JANUS P., GRABIEC P., RANGELOW I. W.: Flexible Piezoresistive Lever with Thermal Actuation of Deflection. Proc. of the VIII Sci. Conf. “Optoelectronic and Electronic Sensors”, Wrocław, Poland, 27-30.06.2004, p. 346-3498 (in Polish).
• [P10] GOTSZALK T., SIKORA A., MARENDZIAK A., KOLANEK K., SANKOWSKA A., GRABIEC P., RANGELOW I. W.: Issues Related to Measurements of Forces and Deflections in Micro- and Nanosystems. Proc. of the VIII Sci. Conf. “Optoelectronic and Electronic Sensors”, Wrocław, Poland, 27-30.06.2004, p. 354-3588 (in Polish).
• [P11] GOTSZALK T., RADOJEWSKI J., SZELOCH R., MARENDZIAK A., SIKORA A., FLASEK T., KOLANEK K., GRABIEC P., RANGELOW I. W.: Diagnostics of Materials and Micro- and Nanoelectronic Circuits using Methods of Modular Microscopy of Short-Range Interactions. Elektronika 2004 no 12 p. 29-338 (in Polish).
• [P12] GRABIEC P., RADOJEWSKI J., ZABOROWSKI M., DOMAŃSKI K., SZENKEL T., RANGELOW I. W.: Batch Fabricated Scanning Near Field Optical Microscope/Atomic Force Microscopy Microprobe Integrated with Piezoresistive Cantilever Beam with Highly Reproducible Focused Ion Beam Micromachined Aperture. J. of Vacuum Sci. a. Technol. B 2004 vol. 22 no 1 p. 16-21.
• [P13] GRABIEC P., ZABOROWSKI M., DOMAŃSKI K., GOTSZALK T., RANGELOW I. W.: Nano-Width Lines using Lateral Pattern Definition Technique for Nanoimprint Template Fabrication. Microelectron. Eng. 2004 vol. 73-74 p. 599-603.
• [P14] JAROSZEWICZ B., TOMASZEWSKI D., KOCIUBIŃSKI A., NIKODEM M., GRABIEC P., PIJANOWSKA D., TORBICZ W., CHUDY M.: Design and Process Development of Ion Sensitive FET’s. Elektronika 2004 no 10 p. 27-28 (in Polish).
• [P15] KAMIŃSKA E., GOŁASZEWSKA K., PIOTROWSKA A., KRUSZKA R., KUCHUK A., PAPIS E., SZELOCH R., JANUS P., GOTSZALK T., BARCZ A., WAWRO A.: Study of Long-Term Stability of Ohmic Contacts to GaN. phys. stat. sol. (c) 2004 vol. 1 no 2 p. 219-222.
• [P16] KUCEWICZ W., ALEMI M., AMATI M., DOMAŃSKI K., GRABIEC P., JAROSZEWICZ B., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D., ZALEWSKA A.: Position-Sensitive Silicon Detectors for Real-Time Dosimetry in Medical Applications. Nucl. Instr. a. Meth. A 2004 vol. 518 p. 411-414.
• [P17] KUCEWICZ W., BULGHERONI A., CACCIA M., GRABIEC P., MARCZEWSKI J., NIEMIEC H.: Development of Monolithic Active Pixel Detector in SOI Technology. Proc. of the 5th Int. Symp. on Development and Application of Semiconductor Tracking Detectors, Hiroshima, Japan, 14-17.06.2004, http://jsdhp1.kek.jp.
• [P18] MARCZEWSKI J., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., TOMASZEWSKI D., KUCEWICZ W., KUTA S., MACHOWSKI W., NIEMIEC H., SAPOR M., CACCIA M.: SOI Active Pixel Detectors of Ionizing Radiation-Technology and Design Development. IEEE Trans, on Nucl. Sci. 2004 vol. 51 no 3 p. 1025-1028.
• [P19] MARENDZIAK A., CZARNECKI P., GOTSZALK T., RADOJEWSKI J., SZELOCH R., GRABIEC P., RANGELOW I. W.: Calibration of a Measurement Probe used in Atomic-Force Scanning Microscopy. Proc. of the VIII Sci. Conf. “Optoelectronic and Electronic Sensors”, Wrocław, Poland, 27-30.06.2004, p. 224-227 (in Polish).
• [P20] MAZIARZ W., PISARKIEWICZ T., GRABIEC P.: Thin Film Sensors on the Integrated Micromachined Substrate. Proc. of the VIII Sci. Conf. "Optoelectronic and Electronic Sensors”, Wrocław, Poland, 27-30.06.2004, p. 195-198.
• [P21] NIEMIEC H., JASTRZĄB M., KUCEWICZ W., KUTA S., SAPOR M., SZELEZNIAK M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D., CZERMAK A., DULNY B., SOWICKI B., ZALEWSKA A., BULGHERONI A., CACCIA M.: Preliminary Measurements of the Monolithic Active Pixel Detector Realized in the SOI Technology. Proc. of the 11th Int. Conf. “Mixed Design of Integrated Circuits and Systems” MIXDES, Szczecin, Poland, 24-26.07.2004, p. 234-237.
• [P22] NIEMIEC H., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KLATKA T., KOCIUBIŃSKI A., KOZIEL M., KUCEWICZ W., KUCHARSKI K., KUTA S., JASIELSKI J., MARCZEWSKI J., SAPOR M., SZELEZNIAK M., TOMASZEWSKI D.: Monolithic Active Pixel Detector in SOI Technology - Preliminary Results. Proc. of the IEEE 24th Int. Conf. on Microelectronics MIEL 2004, NiS, Serbia and Montenegro, 16-19.05.2004, p. 209-212.
• [P23] SCHENKEL T., RANGELOV I. W., KELLER R., PARK S. J., NILSSON J., PERSAUD A., RADMILOVIC V. R., GRABIEC P., SCHNEIDER D. H., LlDDLE J. A., BOKOR J.: Open Questions in Electronic Sputtering of Solids by Slow Highly Charged Ions with Respect to Applications in Single Ion Implantation. Nucl. Instr. a. Meth. B 2004 vol. 219-220 p. 200-205.
• [P24] WĘGRZECKA I., WĘGRZECKI M., BAR J., GRYNGLAS M., USZYŃSKI A., GRÓDECKI R., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T.: Silicon Avalanche Photodiodes Developed at the Institute of Electron Technology. Proc. of SPIE 2004 vol. 5484 p. 503-514.
• [P25] WĘGRZECKA I., WĘGRZECKI M., GRYNGLAS M., BAR J., USZYŃSKI A., GRÓDECKI R., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T.: Design and Properties of Silicon Avalanche Photodiodes. Opto-Electron. Rev. 2004 vol. 12 no 1 p. 95-104.
• [P26] WĘGRZECKA I., WĘGRZECKI M., BAR J., SŁYSZ W., GRYNGLAS M., USZYŃSKI A., GRÓDECKI R., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T., PANAS A.: Silicon Photodiodes and PIN Diodes Developed at the Institute of Electron Technology. Proc. of SPIE 2004 vol. 5484 p. 493-502.
• [P27] ZABOROWSKI M., GRABIEC P., RANGELOW I. W.: Chromium Nano-Width Ribbons by Standard Lithography and Wet Etching. Microelectron. Eng. 2004 vol. 73-74 p. 588-593.
• [C1] BECK R. B., GRABIEC P., PASZKIEWICZ R.: Silicon and Its Compounds-Non-Classical Applications. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-24.04.2004 (paper, abstr. p. 45-46).
• [C2] BULGHERONI A., BADANO L., BERST D., BlANCHI C., BOL J., CACCIA M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D., ZALEWSKA A.: Silicon Ultra Fast Cameras for Electron and y Sources in Medical Applications - a Progress Report. 9th Topical Sem. on Innovative Particle and Radiation Detectors, Siena, Italy, 23-26.05.2004 (paper).
• [C3] BULGHERONI A., CACCIA M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KLATKA T., KOCIUBIŃSKI A., KOZIEŁ M., KUCEWICZ W., KUCHARSKI K., KUTA S., MARCZEWSKI J., NIEMIEC H., SAPOR M., SZELEZNIAK M., TOMASZEWSKI D.: Monolithic Active Pixel Detector Realized in Silicon on Insulator Technology. 10th Vienna Conf. on Instrumentation, Vienna, Austria, 16-21.01.2004 (paper).
• [C4] DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KLATKA T., KOCIUBIŃSKI A., KOZIEŁ M., KUCEWICZ W., KUCHARSKI K., KUTA S., MACHOWSKI W., MARCZEWSKI J., NIEMIEC H., SAPOR M., SZELEZNIAK M., TOMASZEWSKI D .: Monolithic Active Pixel Detector in SOI Technology. VIII Sci. Conf. „Electron Technology” ELTE 2004 , Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 245-246).
• [C5] DOMAŃSKI K., JANUS P., GRABIEC P., NIKODEM M., SILL A., PEREZ R., CHAILET N.: Desig and Fabrication on Force Sensors for Microrobot. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 439-440).
• [C6] DOMAŃSKI K., JANUS P., GRABIEC P., PEREZ R., CHAILLET N., FAHLBUSCH S., SILL A., FATIKOW S.: Design, Fabrication and Characterization of Force Sensors for Nanorobot. Micro and Nano Engineering MNE 2004, Rotterdam, Holland, 18-22.09.2004 (poster, abstr. p. 220-221).
• [C7] GOTSZALK T., RADOJEWSKI J., SZERLOCH R., MARENDZIAK A., SIKORA A., HASEK T., KOLANEK K., GRABIEC P., RANGELOW I. W .: Diagnostics of Materials and Micro- and Nanoelectronic Circuits using Methods of Modular Microscopy of Short-Range Interactions. Ill Domestic Conf. on Electronics KKE’04, Kołobrzeg, Poland, 16-18.06.2004 (inv. paper, in Polish).
• [C8] GOTSZALK T., KOLANEK K., HASEK T., SIKORA A., SZELOCH R., GRABIEC P., DOMAŃSKI K., JANUS P.: Electronic Measurement Circuits Co-Operating with Microsystem Piezoresistive Sensors of Force. Ill Domestic Conf. on Electronics KKE’04, Kołobrzeg, Poland, 16-18.06.2004 (paper, in Polish).
• [C9] GOTSZALK T., SIKORA A., JANUS P., GRABIEC P., RANGELOW I. W .: Flexible Piezoresistive Lever with Thermal Actuation of Deflection. VIII Sci. Conf. “Optoelectronic and Electronic Sensors”, Wrocław, Poland, 27-30.06.2004 (commun., in Polish).
• [C10] GOTSZALK T., SIKORA A., MARENDZIAK A., KOLANEK K., SANKOWSKA A., GRABIEC P., RANGELOW I. W.: Issues Related to Measurements of Forces and Deflections in Micro- and Nanosystems. Proc. of the VIII Sci. Conf. “Optoelectronic and Electronic Sensors”, Wrocław, Poland, 27-30.06.2004 (commun., in Polish).
• [C11] GRABIEC P.: Dissemination of MEMS/MOEMS Microsystem and Nanotechnology Applications in Industry. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 429).
• [C12] GRABIEC P.: Micro- and Nanotechnology in Poland, a Look at the New Member of the Enlarged Union. 10th Micromachine Summit, Grenoble, France, 3-5.05.2004 (paper).
• [C13] GRABIEC P., DOMAŃSKI K., ZABOROWSKI M., MARENDZIAK A., IVANOVA K., RANGELOW I. W.: A Simple Nano-Patterning Technique using Lateral Pattern Definition. Fifth Int. Conf. on Microelectronics and Interfaces, ICMI'04, Santa Clara, USA, 1-3.03.2004 (paper).
• [C14] GRODNER M., KLATKA T., KOZIEŁ M., KUCEWICZ W., KUCHARSKI K., MARCZEWSKI J., NIEMIEC H., SAPOR M., SZELEZNIAK M., TOMASZEWSKI D.: CMOS SOI Technology Characterization and Verification of Device Models for Analogue Design. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 259-260).
• [C15] HASEK T., GOTSZALK T., GRABIEC P., SZERLOCH R.: Near Field Scanning Thermal Microscopy for Investigation of Surface Micro and Nano System Thermal Conductivity. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 465-466).
• [C16] JANUS p., DOMAŃSKI K., GRABIEC P., KOSZUR J., LATECKI B., GNIAZDOWSKI Z.: Electro-Mechanical Characterisation of Piezoresistive Force Sensors. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 442-443).
• [C17] JAROSZEWICZ B., TOMASZEWSKI D., KOCIUBIŃSKI A., NIKODEM M., GRABIEC P., CHUDY M., PIJANOWSKA D., TORBICZ W.: Design and Process Development of Ion Sensitive FET's. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 214-215).
• [C18] JAROSZEWICZ B., DOMAŃSKI K., TOMASZEWSKI D., JANUS P., KUDLA A., LATECKI B., KOCIUBIŃSKI A., NIKODEM M., KĄTCKI J., WZOREK M., MARCZEWSKI J., GRABIEC P.: Application of Ion Implantation for Mono-Si Piezoresistors Manufacturing in Silicon MEMS Technology. V Int. Conf. Ion Implantation and Other Applications of Ions and Electrons, Kazimierz Dolny, Poland, 14-17.06.2004 (poster, abstr. p. 100).
• [C19] KOCIUBIŃSKI A., GRABIEC P., TOMASZEWSKI D., KUCHARSKI K., BUDZYŃSKI T., DOMAŃSKI K., MARCZEWSKI J., MILCZAREK W.: Polysilicon Fuses as Efficient Tool for Programming of Semiconductor Sensor Arrays. Vlll Sci. Conf. „Electron Technology” ELTE 2004 , Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 446-447).
• [C20] KOLANEK K., GOTSZALK T., GRABIEC P., SZELOCH R.: Electrostatic Force Microscope for Investigation of Surface Electrical Properties. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 441).
• [C21] KUCEWICZ W., BULGHERONI A., CACCIA M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., JASTRZĄB M., KOCIUBIŃSKI A., KUCHARSKI K., KUTA S., MARCZEWSKI J., NIEMIEC H., SAPOR M., TOMASZEWSKI D.: Fully Depleted Monolithic Active Pixel Sensor in SOI Technology. IEEE Nucl. Sci. Symp., Rome, Italy, 16-23.10.2004 (paper).
• [C22] KUCEWICZ W., BULGHERONI A., CACCIA M., GRABIEC P., MARCZEWSKI J., NIEMIEC H.: Development of Monolithic Active Pixel Detector in SOI Technology. 5' Int. Symp. on Development and Application of Semiconductor Tracking Detectors, Hiroshima, Japan, 14-17.06.2004 (paper).
• [C23] KUCHARSKI K., TOMASZEWSKI D., GRODNER M., DUTKIEWICZ W., GRABIEC P., HEJDUK K., KOCIUBIŃSKI A., MALESIŃSKA J., KOKOSZKA A., OBRĘBSKI D., SZYNKA J.: MPW Service for Manufacturing of CMOS ASICs in a National Center of Silicon Micro- and Nano-Technology. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 220-222).
• [C24] ŁUKASIAK L., JAKUBOWSKI A., TOMASZEWSKI D.: Modeling I-V Characteristics of a p-MOSFET with a SiGe Channel. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 231-232).
• [C25] ŁUKASIAK L., JAKUBOWSKI A., TOMASZEWSKI D.: Modeling MOS Capacitor with SiGe Gate. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 233-234).
• [C26] ŁUKASIAK L., JAKUBOWSKI A., TOMASZEWSKI D.: Modeling Threshold Voltage of a MOS Structure with SiGe Channel and Gate. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 235-236).
• [C27] MARCZEWSKI J., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., TOMASZEWSKI D., CACCIA M., KUCEWICZ W., NIEMIEC H.: Technology Development for SOI Monolithic Pixel Detectors. 13th Int. Workshop on Vertex Detectors VERTEX 2004, Menaggio, Italy, 13-18.09.2004 (inv. paper).
• [C28] MARENDZIAK A., CZARNECKI P., GOTSZALK T., RADOJEWSKI J., SZELOCH R., GRABIEC P., RANGELOW I. W.: Calibration of a Measurement Probe used in Atomic-Force Scanning Microscopy. VIII Sci. Conf. “Optoelectronic and Electronic Sensors”, Wrocław, Poland, 27-30.06.2004 (commun., in Polish).
• [C29] MAZIARZ W., PISARKIEWICZ T., GRABIEC P.: Thin Film Sensors on the Integrated Micromachined Substrate. Proc. of the VIII Sci. Conf. “Optoelectronic and Electronic Sensors”, Wrocław, Poland, 27-30.06.2004 (commun., in Polish).
• [C30] NIEMIEC H., JASTRZĄB M., KUCEWICZ W., KUTA S., SAPOR M., SZELEZNIAK M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D., CZERMAK A., DULNY B., SOWICKI B., ZALEWSKA A., BULGHERONI A., CACCIA M.: Preliminary Measurements of the Monolithic Active Pixel Detector Realized in the SOI Technology. Proc. of the 11th Int. Conf. “Mixed Design of Integrated Circuits and Systems” MIXDES, Szczecin, Poland, 24-26.07.2004 (paper).
• [C31] NIEMIEC H., JASTRZĄB M., KUCEWICZ W., KUTA S., SAPOR M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D., BULGHERONI A., CACCIA M.: Status of the SOI Monolithic Active Pixel Detector Development. Int. Conf. on Linear Collides - LCWS 2004, Paris, France, 19-23.04.2004 (paper).
• [C32] NIEMIEC H., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KLATKA T., KOCIUBIŃSKI A., KOZIEL M., KUCEWICZ W., KUCHARSKI K., KUTA S., JASIELSKI J., MARCZEWSKI J., SAPOR M., SZELEZNIAK M., TOMASZEWSKI D.: Monolithic Active Pixel Detector in SOI Technology - Preliminary Results. IEEE 24th Int. Conf. on Microelectronics MIEL 2004, Nis, Serbia and Montenegro, 16-19.05.2004 (paper).
• [C33] NIEMIEC H., KUCEWICZ W., KUTA S., SAPOR M., DOMAŃSKI K., GRABIEC P., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D., BULGHERONI A., CACCIA M.: The SOI Silicon Active Pixel Sensor. 13th Int. Workshop on Vertex Detectors VERTEX 2004, Menaggio, Italy, 13-18.09.2004 (paper).
• [C34] RZODKIEWICZ W., BOROWICZ L., PANAS A., PRZEWŁOCKI H. M.: Determination of the Densification Degree of Silicon Dioxide Layers on Silicon Substrates by Interferometry and Spectroscopic Ellipsometry. Lightmetry’04. Light and Optics in Biomedicine. Warsaw, Poland, 20-22.10.2004 (paper).
• [C35] SŁYSZ W., WĘGRZECKI M., BAR J., GRABIEC P., GOLTSMAN G. N., VEREVKIN A., SOBOLEWSKI R.: NbN Superconducting Single-Photon Detectors Coupled with a Communication Fiber. VIII Sci. Conf. „Electron Technology” ELTE 2004, Stare Jabłonki, Poland, 19-22.04.2004 (poster, abstr. p. 370-371).
• [C36] TOMASZEWSKI D., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KLATKA T., KOCIUBIŃSKI A., KOZIEŁ M., KUCEWICZ W., KUCHARSKI K., KUTA S., MARCZEWSKI J., NIEMIEC H., SAPOR M., SZELEŹNIAK M.: Design, Fabrication and Characterization of SOI Pixel Detectors of Ionizing Radiation. NATO ARW: Science and Technology of SOI Structures and Devices Operating in a Harsh Environment, Kiev, Ukraine, 25-29.04.2004 (commun.).
• [C37] WĘGRZECKA I., WĘGRZECKI M., BAR J., GRYNGLAS M., GRÓDECKI R., USZYŃSKI A., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T.: Silicon Avalanche Photodiodes Developed at the Institute of Electron Technology. 13th Int. Workshop on Vertex Detectors VERTEX 2004, Menaggio, Italy, 13-18.09.2004 (poster).
• [C38] WĘGRZECKA I., WĘGRZECKI M., BAR J., SŁYSZ W., GRYNGLAS M., USZYŃSKI A., GRÓDECKI R., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T., PANAS A.: Silicon Detectors with PIN or PN Structures for Optical and Nuclear Radiation, Developed at the Institute of Electron Technology. 13th Int. Workshop on Vertex Detectors VERTEX 2004, Menaggio, Italy, 13-18.09.2004 (poster).
• [C39] WZOREK M., KĄTCKI J., JAROSZEWICZ B., DOMAŃSKI K., GRABIEC P.: TEM Study of Implanted Silicon Applied to Piezoresistors Manufacturing. Autumn School on Emerging Microscopy for Advanced Materials Development - Imaging and Spectroscopy on Atomic Scale, Berlin, Germany, 3-7.10.2004 (commun., poster).
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