Particle measurement in scanning electron microscopy images

• Autorzy: Cuesta-Frau, D. , Hernández-Fenollosa, M. A. , Vicedo-Payá, J. , Jiménez-López, F.
• Konferencja: International Conference on Computer Vision and Graphics ICCVG 2006 (25-27.09.2006 ; Warsaw, Poland)
• Języki publikacji: EN

Abstrakty

EN

This paper describes the segmentation of nanoparticles of ZnO obtained by mechanical milling. Segmentation of objects in images is a common application of computer vision methods. In contrast to manual segmentation, these techniques are fast, objective, and accurate. We describe in this paper a method based on such techniques aimed at segmenting the particles in a microscopic image of ZnO in order to obtain an approximation of the grain size, and a measure of the homogeneity, in a non-supervised way. The images are obtained using scanning electron microscopy and then preprocessed to enhance the contrast and to reduce the noise. Next, an edge detection algorithm is applied to obtain the boundaries of the particles. Finally, the particles that satisfy a specific criterion are extracted and measured, and their measure is taken as an approximation of the particle size.

Słowa kluczowe

EN

image processing; edge detection; pattern matching

• Czasopismo: Machine Graphics and Vision
• Rocznik: 2006
• Tom: Vol. 15, No. 3/4
• Strony: 321-328
• Opis fizyczny: Bibliogr. 15 poz., wykr., il.

Twórcy

autor

Cuesta-Frau, D.

autor

Hernández-Fenollosa, M. A.

autor

Vicedo-Payá, J.

autor

Jiménez-López, F.

• Polytechnic University of Valencia, Alcoi Campus (Spain)

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