Czasopismo
2000
|
Vol. 8, No. 4
|
388-392
Tytuł artykułu
Autorzy
Wybrane pełne teksty z tego czasopisma
Warianty tytułu
Konferencja
The E-MRS European Conference on Photovoltaics ; ( 25.10-27.10.1999)
Języki publikacji
Abstrakty
Macroporous silicon prepared in n-type silicon have been used for a photosensitive device formation. Boron-doped spun-on layer was applied for p+ emitter formation of the devices. The obtained structures were investigated by AFM and electron microscopy, photosensitivity and the photocurrent spectra were measured to evaluate the influence of porous layer and boron diffusion conditions. Unusually fast boron diffusion through the porous emitter was investigated, stipulating the p+ -n junction to be positioned 2.5 µm deeper the pores bottom. This effect was explained by a presence of local electric fields, caused by tensions present at the border between PS layer and crystalline substrate and by possible deeper nanoporous structure, what was partially proofed by AFM.
Słowa kluczowe
Czasopismo
Rocznik
Tom
Strony
388-392
Opis fizyczny
Bibliogr. 20 poz.
Twórcy
autor
autor
autor
autor
autor
autor
autor
autor
- Semiconductor Physics Institute, 11 Goštauto Str., 2600 Vilnius, Lithuania, vaidas@opel2.pfi.lt
Bibliografia
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.baztech-article-BWA1-0001-1022