Electronic properties of space charge layer of cooper phthalocyanine (CuPc) thin films "in situ" studied by photoemission yield spectroscopy

• Autorzy: Grządziel, L. , Mikołajczak, K. , Szuber, J.
• Konferencja: International Seminar on Semiconductor Gas Sensors : SGS' 98 (1 ; 22-25.09.1998 ; Ustroń, Poland)
• Języki publikacji: EN

Abstrakty

EN

The electronic properties of the space charge layer in situ prepared copper phthalocyanine (CuPc) thin films studied by Photoemission Yield Spectroscopy (PYS) are presented. Depending on the thickness and annealing temperature the energetic parameters of the space charge layer were determined and compared with those obtained for the copper phtahlocyanine (CuPc) thin film obtained ex situ and then UHV outgased at 410 K. Moreover, the origin of these differences is shortly discussed.

• Czasopismo: Electron Technology
• Rocznik: 2000
• Tom: Vol. 33, No. 1/2
• Strony: 157-160
• Opis fizyczny: Bibliogr. 26 poz.

Twórcy

autor

Grządziel, L.

autor

Mikołajczak, K.

autor

Szuber, J.

• Departament of Semiconductor Surface Physics, Institute of Physics, Silesian Technical University, ul. Krzywoustego 2, 44-100 Gliwice, Poland,