Extraction of the shape of small defects on the surface of ferrite cores

• Autorzy: Nieniewski, M. , Serneels, R.
• Konferencja: Conference on Computer Graphics and Image Processing, GKPO' 2000 (6 ; 15-19.05.2000 ; Polesie, Poland)
• Języki publikacji: EN

Abstrakty

EN

The paper presents a morphological method for detection and extraction of the shape of defects on the surface of industrial type objects, such as ferrite cores. The method uses a morphological defect detector and a morphological pyrmid for detecting positions of defects. The output from the pyramid gives the positions and extents of defects together with a very coarse approximation of the shape of defects. In order to extract the precise shape, two morphological reconstructions are subsequently used. The first of them is a gray level reconstruction extracting the shape of all brighter spots in the image. The other reconstruction is a binary one. It extracts the shape of those brighter spots indicated by the morphological pyramid, and leaves out all the others. The described morphological operations can be carried out in real time. The method correctly extracts the shape of relatively small defects. Defects of this kind are very typical for ferrite cores, and thier presence justifies the rejection of the core from the production line. Extraction of the shape of defects covering a significant portion of the core may be obtained by the use of the method presented in the current paper together with the watershed segmentation. However, in the case a large defect, the core can also be rejected directly, on the basis of the output from the pyramid. The paper presents several examples of the extraction of the shape of defects, which confirm the validity of the proposed method.

Słowa kluczowe

EN

morphological defect detection; defect extraction; morphological reconstruction

• Czasopismo: Machine Graphics and Vision
• Rocznik: 2000
• Tom: Vol. 9, No. 1/2
• Strony: 453-462
• Opis fizyczny: Bibliogr. 13 poz.

Twórcy

autor

Nieniewski, M.

autor

Serneels, R.

• IFTR, PAS and Electronical Institute, Warsaw,