Optical properties of Zn1-xMgxSe epilayers studied by reflection spectroscopy

• Autorzy: Głowacki, G. , Bała, W.
• Konferencja: The International Conference on Solid State Crystals '98 (ICSSC '98) ; (12.09-16.09.1998) ; Zakopane, Poland
• Języki publikacji: EN

Abstrakty

EN

Linear optical properties of the Zn1-xMgxSe (0 < x < 0,4) alloys have been studied using reflection spectroscopy. The refractive indices of Zn1-xMgxSe epilayers were investigated as a function of Mg composition (0 < x < 0,4). The Sellmeier law is applied to describe the refractive index behaviour as a function of wavelength and magnesium concentration.

Słowa kluczowe

EN

reflection spectroscopy; refractive index; A2B6 compounds

• Czasopismo: Opto-Electronics Review
• Rocznik: 1999
• Tom: Vol. 7, No. 2
• Strony: 113-116
• Opis fizyczny: Bibliogr. 10 poz.

Twórcy

autor

Głowacki, G.

autor

Bała, W.

• Institute of Physics, N. Copernicus University, 5 Grudziądzka Str., 87-100 Toruń, Poland