An UHV experimental system for in situ determination of the electronic properties of metal phthalocyanine thin films by photoemission yield spectroscopy

• Autorzy: Grządziel, L. , Szuber, J.
• Konferencja: Seminar on Surface and Thin Film Structures (5 ; 23-26.09.1997 ; Ustroń, Poland)
• Języki publikacji: EN

Abstrakty

EN

The experimental system for in situ determination of the electronic properties of metal phthalocyanine thin films by photoemission yield spectroscopy (PYS) is described. Preliminary results of studies of the electronic parameters of the space charge layers of in situ obtained cooper phthalocyanine (CuPc) thin films are presented and compared with those previously determined for the ex situ obtained cooper phthalocyanine (CuPc) thin films.

• Czasopismo: Electron Technology
• Rocznik: 1998
• Tom: Vol. 31, No. 3/4
• Strony: 502-504
• Opis fizyczny: Bibliogr. 15 poz.

Twórcy

autor

Grządziel, L.

autor

Szuber, J.

• Division of Semiconductor Surface Physics, Institute of Physics, Silesian technical Universit,y ul. Krzywoustego 2, 44-100 Gliwice, Poland