Department of Integrated Circuits' and Systems' Design

• Autorzy: Szynka, J.
• Języki publikacji: EN

Słowa kluczowe

PL

Instytut Technologii Elektronowej; działalność naukowo-badawcza

EN

Institute of Electron Technology; scientific activity

• Czasopismo: Prace Instytutu Technologii Elektronowej
• Rocznik: 2011
• Tom: z. 1/2
• Strony: 170-198
• Opis fizyczny: Bibliogr. 32 poz., il., wykr.

Twórcy

autor

Szynka, J.

• Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warsaw, Poland,

Bibliografia

• Publications'2010
• [P1] AUZINGER G., BERGAUER T., DRAGICEVIC M., ERFLE J., GRABIEC P., GRODNER M., HANSEL S., HARTMANN F., HOFFMANN K. H., HUEMER E., KLESENHOFER W., KUCHARSKI K., MARCZEWSKI J., MILITARU O., STEINBRUCK G., VALENTAN M.: R&D on Novel Sensor Routing and Test Structure Development. Nuci. Instr. & Methods in Physics Res. A (submit, to print).
• [P2] AUZINGER G., BERGAUER T., DRAGICEVIC M., HANSEL S., IRMLER Ch., KlESENHOFER W., VALENTAN M., GRABIEC P., GRODNER M., KUCHARSKI K., MARCZEWSKI J.: Silicon Strip Sensors with Integrated Pitch Adapters. EUDET MEMO http://www.eudet.org./e26/e28/e42441/e71533/ EUDET-Memo-2009-18.doc, 2010 (on line).
• [P3] BIENIEK T., JANCZYK G., GRABIEC P., SZYNKA J.: Physical Reliability Aspects in Integrated Microsystem Modeling. Prz. Elektrotechn. 2010 vol. 86 no. 10 p. 9-12 (in Polish).
• [P4] BIENIEK T., JANCZYK G., GRABIEC P., SZYNKA J., KALICIŃSKI S., JANUS P.: Micro and Nano Device - Customer-Oriented Product e-Engineering in e-CoFrame. eChallenges e-2010 Conf. Proc. Warsaw, Poland, 27-29.10.2010, CD, p. 1-5.
• [P5] BIENIEK T., JANCZYK G., GRABIEC P., SZYNKA J., KALICIŃSKI S., JANUS P., DOMAŃSKI K., SIERAKOWSKI A., EKWIŃSKA M., SZMIGIEL D., TOMASZEWSKI D., HOLZER G., SCHROPFER G.: Customer-Oriented Product Engineering of Micro and Nano Devices. Proc. of the 17th Int. Conf. on Mixed Design of Integrated Circuits and Systems. Wrocław, Poland, 24-26.06.2010, p. 81-84.
• [P6] BIENIEK T., JANCZYK G., KALICIŃSKI S., JANUS P., DOMAŃSKI K., GRABIEC P., SZYNKA J.: Methodology and Tools for Customer-Oriented Product Engineering of Micro and Nano Devices. Proc. Of the 10th Conf. 'Electron Technology ELTE 2010". Wrocław, Poland, 22-25.09.2010 (submit. to print).
• [P7] JANCZYK G., BIENIEK T., SZYNKA J., GRABIEC P.: Investigation on Mechanical Stress Influence on MOS Transistor Parameter Fluctuation in 3D Heterogeneous Devices. DATE' 10 Friday Workshop on 3D Integration. Applications, Technology, Architecture, Design, Automation, and Test. Electronic Workshop Digest. Dresden, Germany, 12-13.03.2010, p. 415-416 (on line).
• [P8] JANCZYK G., BIENIEK T., SZYNKA J., GRABIEC P., JANUS P., KALICIŃSKI S.: Micro and Nano Device Reliability Control by MOS Transistors Mechanical Stress Sensitivity Estimation and Flexible, Customer Oriented Product Engineering Flow. 2010 IRWFinal Rep. (submit, to print)
• [P9] KOCIUBIŃSKI A., DUK M., BIENIEK T., JANCZYK G.: Multidomain Modeling and Simulation of CVD Diamond Layers for MEMS/MOEMS Applications. Prz. Elektrotechn. 2010 vol. 86 no. 7 p. 221-223 (in Polish).
• [P10] KUCHARSKI K., RENAUX C., CRAHAY A., GRABIEC P., GRODNER M., BIENIEK T., PANAS A., SIERAKOWSKI A., KŁOS H., TOMASZEWSKI D., OBRĘBSKI D., MARCZEWSKI J., FLANDRE D.: Implementation of FD SOI CMOS Technology in ITE. Proc. of the 10th Conf. "Electron Technology ELTE 2010". Wrocław, Poland, 22-25.09.2010 (submit, to print).
• [P11] ŁUSAKOWSKI J., KNAP W., KOPYT P., GWAREK W., RATAJCZYK M., MARCZEWSKI J., SZYNKA J.: THz Detection with Si Metal-Oxide-Semiconductor Field-Effect Transistors: Current Status and Perspectives. Proc. ot the IX Polish Conf. on Electronics. Darłówko Wschodnie, Poland, 30.05-2.06.2010, p. 728-729.
• [P12] MILITARU O., BERGAUER T., BERGHOLZ M., DE BOER W., BORRAS K., CORTINA GIL E., DIERLAMM A., DRAGICEVIC M., ECKSTEIN D., ERFLE J., FERNANDEZ M., FELD L., FREY M., FRIEDL M., FRETWURST E., GAUBAS E., GONZALES F. J., GRABIEC P., GRODNER M., HARTMANN F., HANSEL S., HOFFMANN K. H., HRUBEC J., JARAMILLO R., KARPIŃSKI W., KAZUKAUSKAS V., KLEIN K., KHOMENKOV V., KLANNER R., KRAMMER M., KUCHARSKI K., LANGE W., LEMAITRE V., MOYA D., MARCZEWSKI J., MUSSGILLER A., RODRIGO T., MULLER T., SAMMET J., SCHLEPER P., SCHWANDT J., SIMONIS J., SRIVASTAVA A., STEINBRUCK G., TOMASZEWSKI D., SAKALAUSKAS S., STORASTA J., VAITKUS J. V. , LOPEZ VIRTO A., VILA I., ZASINAS E.: Simulation of Electrical Parameters of New Design of SLHC Silicon Sensors for Large Radii. Nucl. Instr. & Meth. in Phys. Res. A 2010 vol. 617 p. 563-564.
• [P13] OBRĘBSKI D., KUCHARSKI K., TOMASZEWSKI D., KŁOS H.: The MPW Service Development. Proc. of the 10th Conf. "Electron Technology ELTE 2010". Wrocław, Poland, 22-25.09.2010 (submit, to print).
• [P14] SZYMAŃSKI A., KURJATA-PFITZNER E., WĄSOWSKI J., LESIŃSKI J.: Practical Issues of 2 .4 Ghz RF Circuit Design: Simulation Versus Measurement Results. Proc. of the 17th Int. Conf. on Mixed Design of Integrated Circuits and Systems. Wrocław, Poland, 24-26.06.2010, p. 321-327.
• Conferences'2010
• [C1] AUZINGER G., BERGAUER T., DRAGICEVIC M., GRABIEC P., GRODNER M., HANSEL S., HARTMANN F., HOFFMANN K. H., HUEMER E., KIESENHOFER W., KUCHARSKI K., MARCZEWSKI J., MLLITARU O., STEINBRUCK G., VALENTAN M.: R&D on Novel Sensor Routing and Test Structure Development. 12th Vienna Conf. on Instrumentation. Vienna, Austria, 15-20.02.2010 (poster).
• [C2] BIENIEK T., JANCZYK G., GRABIEC P., JANUS P., KALICIŃSKI S., DOMAŃSKI K., SZYNKA J.: Institute of Electron Technology, Warsaw, Poland for e-BRAINS Project. e-BRAINS Kick-off Meet, and e-B RAINS WP1 Kick-off Meet. Munich, Germany, 19.11.2010 (commun.).
• [C3] BIENIEK T., JANCZYK G., GRABIEC P., SZYNKA J.: Physical Reliability Aspects in Integrated Microsystem Modeling. XI Sci. Conf. "Optoelectronic and Electronic Sensors". Nałęczów, Poland, 20-23.06.2010 (poster, in Polish).
• [C4] BIENIEK T., JANCZYK G., GRABIEC P., SZYNKA J., KALICIŃSKI S., JANUS P.: Support of Heterogeneous Systems Development Process by Dedicated Customer-Oriented Methodology and Tools. 5th Wide Bandgap Materials - Progress in Synthesis and Applications and 7th Diamond & Related Films jointly with 2nd Int. Workshop on Science and Applications of Nanoscale Diamond Materials. Zakopane, Poland, 28.06-2.07.2010 (poster).
• [C5] BIENIEK T., JANCZYK G., GRABIEC P., SZYNKA J., KALICIŃSKI S., JANUS P.: Micro and Nano Device - Customer-Oriented Product e-Engineering in e-CoFrame. eChallenges e-2010 Conf. Warsaw, Poland, 27-29.10.2010 (paper).
• [C6] BIENIEK T., JANCZYK G., GRABIEC P., SZYNKA J., KALICIŃSKI S., JANUS P., DOMAŃSKI K., SIERAKOWSKI A., EKWIŃSKA M., SZMIGIEL D., TOMASZEWSKI D., HOLZER G., SCHROPFER G.: Customer-Oriented Product Engineering of Micro and Nano Devices. 17th Int. Conf. on Mixed Design of Integrated Circuits and Systems MIXDES 2010. Wrocław, Poland, 24-26.06.2010 (poster).
• [C7] BIENIEK T., JANCZYK G., KALICIŃSKI S., JANUS P.: ITE Works and WP10. Corona Project Meet. Erfurt, Germany, 14-17.06.2010 (commun.).
• [C8] BIENIEK T., JANCZYK G., KALICIŃSKI S., JANUS P., DOMAŃSKI K., GRABIEC P., SZYNKA J.: Methodology and Tools for Customer-Oriented Product Engineering of Micro and Nano Devices. 10th Conf. "Electron Technology ELTE 2010". Wrocław, Poland, 22-25.09.2010 (commun.).
• [C9] JANCZYK G., BIENIEK T., SZYNKA J., GRABIEC P.: Investigation on Mechanical Stress Influence on MOS Transistor Parameter Fluctuation in 3D Heterogeneous Devices. DATE'10 The Design, Automation, and Test in Europe. Dresden, Germany, 12-13.03.2010 (poster).
• [C10] JANCZYK G., BIENIEK T., SZYNKA J., GRABIEC P., JANUS P., KALICIŃSKI S.: Micro and Nano Device Reliability Control by MOS Transistors Mechanical Stress Sensitivity Estimation and Flexible, Customer Oriented Product Engineering Flow. IEEE Int. Reliability Workshop. South Lake Tahoe, USA, 17-21.10.2010 (poster).
• [C11] KALICIŃSKI S., JANCZYK G., BIENIEK T., JANUS P.: Demonstrator 3 M3S - Vibration and Pressure Monitoring System. Eniac - SE2A Progress Meet. Warsaw, 2-3.12.2010 (commun.).
• [C12] KOCIUBIŃSKI A., BIENIEK T., JANCZYK G.: Comparison of the Properties of Diamond and Silicon Layers in Micromechanical. II Conf. on Nano- and Micromechanics. Krasiczyn, Poland, 6-8.07.2010 (poster, in Polish).
• [C13] KOCIUBIŃSKI A., BIENIEK T., JANCZYK G.: CVD Diamond Layers for MEMS/MOEMS Applications - Parameter Modeling and Simulation of Properties. 5 th Wide Bandgap Materials - Progress in Synthesis and Applications and 7th Diamond & Related Films jointly with 2nd Int. Workshop on Science and Applications of Nanoscale Diamond Materials. Zakopane, Poland, 28.06-2.07.2010 (poster).
• [C13] KUCHARSKI K., RENAUX C., CRAHAY A., GRABIEC P., GRODNER M., BIENIEK T., PANAS A., SIERAKOWSKI A., KŁOS H., TOMASZEWSKI D., OBRĘBSKI D., MARCZEWSKI J., FLANDRE D.: Implementation of FD SOI CMOS Technology in ITE. 10th Conf. "Electron Technology ELTE 2010". Wrocław, Poland, 22-25.09.2010 (paper).
• [C15] ŁUSAKOWSKI J., KNAP W., KOPYT P., GWAREK W., RATAJCZYK M., MARCZEWSKI J., SZYNKA J.: THz Detection with Si Metal-Oxide-Semiconductor Field-Effect Transistors: Current Status and Perspectives. IX Polish. Conf. on Electronics. Darłówko Wschodnie, Poland, 30.05-2.06.2010 (inv. lect.).
• [C16] NOGAJEWSKI K., BIAŁEK M., KARPIERZ K., ŁUSAKOWSKI J., GRYNBERG M., TOMASZEWSKI D., MARCZEWSKI J., SZYNKA J., KNAP W.: Sub-THz Room Temperature Detection with Si Metal-Oxide-Semiconductor Field-Effect Transistors. XXXIX "Jaszowiec" Int. School a. Conf. on the Physics of Semiconductors. Krynica-Zdrój, Poland, 19-24.06.2010 (poster).
• [C17] OBRĘBSKI D., KUCHARSKI K., TOMASZEWSKI D., KŁOS H.: The M PW Service Development. 10th Conf. "Electron Technology ELTE 2010". Wrocław, Poland, 22-25.09.2010 (paper).
• [C18] SZYMAŃSKI A., KURJATA-PFITZNER E., WĄSOWSKI J., LESIŃSKI J.: Practical Issues of2.4 GHz RF Circuit Design: Simulation Versus Measurement Results. 17th Int. Conf. on Mixed Design of Integrated Circuits and Systems. Wrocław, Poland, 24-26.06.2010 (poster, commun.).