Department of Silicon Microsystem and Nanostructure Technology

• Autorzy: Grabiec, P.
• Języki publikacji: EN

Słowa kluczowe

PL

Instytut Technologii Elektronowej; działalność naukowo-badawcza

EN

Institute of Electron Technology; scientific activity

• Czasopismo: Prace Instytutu Technologii Elektronowej
• Rocznik: 2010
• Tom: z. 1/2
• Strony: 45-68
• Opis fizyczny: Bibliogr. 138 poz., il., wykr.

Twórcy

autor

Grabiec, P.

• Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warsaw, Poland,

Bibliografia

• [P1] ARABAS J., BARTNIK Ł., SZOSTAK S., TOMASZEWSKI D.: Global Extraction of MOSFET Parameters Using the EKV Model: Some Properties of the Underlying Optimization Task. Proc. of the 16th Int. Conf. "Mixed Design of Integrated Circuits and Systems" MIXDES 2009. Lodz, Poland, 25-27.06.2009, p. 67-72.
• [P2] BARANIECKA A., GÓRSKA M., ZABOROWSKI M., PROKARYN P., SZCZYPIŃSKI R., SKWARA K., SZMIGIEL D., SIERAKOWSKI A., NIEPRZECKI M., MILCZAREK W., ŁYSKO J., PIJANOWSKA D., GRABIEC P.: Microfluidic Immunosensors with Amperometric Detection. Elektronika 2009 vol. L no. 12 p. 100-107 (in Polish).
• [P3] BARANIECKA A., KAZIMIERCZAK B., KRUK J., PIJANOWSKA D., TORBICZ W.: Application of Immunoenzymatic and Microfluidic for Amperometric Determination of C-Reactive Protein Concentration. Elektronika 2009 vol. L no. 11 p. 79-83 (in Polish).
• [P4] BARTNIK Ł., ARABAS J., SZOSTAK S., TOMASZEWSKI D.: Verification of the Ability to Perform Global Extraction of MOSFET Parameters with the Use of EKV Model. Elektronika 2009 vol. L no. 8 p. 258-266 (in Polish).
• [P5] BIENIEK T., JANCZYK G., GRABIEC P., SZYNKA J.: Thermo-Mechanical Reliability Loop in Device Modeling. Proc. of the 15th Int. Workshop on Thermal Investigations of ICs and Systems THERMINIC 2009. Leuven, Belgium, 7-9.10.2009, p. 84-86.
• [P6] BIENIEK T., JANCZYK G., JANUS P., SZYNKA J., GRABIEC P.: Reliability Issues in Modeling and Simulations of the Heterogeneous Integrated Systems. Smart Systems Integration 2009 Conf. Proc. Brussels, Belgium, 10-11.03.2009, p. 428-431.
• [P7] DUK M., KOCIUBIŃSKI A., BIENIEK T., JANUS P.: 3-D Modeling of Anisotropic Wet Etching of Silicon. Prz. Elektrotechn. (submit. to print, in Polish).
• [P8] DVORAK J., BRUCHLE W., DULLMANN E., DVORAKOVA Z., EBERHARDT K., ELCHLER R., JAGER E., NAGAME Y., QUIN Z., SCHADEL M., SCHAUSTEN B., SCHIMPF E., SCHUBER R., SEMCHENKOV A., THROLE P., TURLER A., WĘGRZECKI M., YAKUSHEV A.: Cross Section Limits for the 248Cm(25Mg,4-5n)268,269Hs Reactions. Phys. Rev. C 2009 no. 79 p. 037602-1-4.
• [P9] EICHLER R., AKSENOV N. V., ALBIN Yu. V., BELOZEROV A. V., BOZHIKOV G. A., CHEPIGIN V. L. , DMITRIEV S. N., DRESSLER R., GAGGELER H. W., GORSHKOV V., HENDERSON R. A., JOHNSEN A. M., KENNEALLY J. M., LEBEDEV V. Ya., MALYSHEV O. N., MOODY K. J., OGANESSIAN Yu. Ts., PETRUSCHKIN O. V., PIGUET D., POPEKO A. G., RASMUSSEN P., SEROV A. A., SHAUGHNESSY D. A., SHISHKIN S. V., SHUTOV A. V., STOYER M. A., STOYERN. J., SVIRIKHIN A. I., TERESHATOV E. E., VOSTOKIN G. K., WĘGRZECKI M., WILK P. A., WITTWER D., YEREMIN A.: Indication for a Volatile Element 114. Radiochim. Acta 2010 vol. 98 p. 133-139.
• [P10] EICHLER R., ABDULLIN F. Sh., AKSENOV N. V., ALBIN Yu. V., BELOZEROV A. V., BOZHIKOV G. A., CHEPIGIN V. I., DRESSLER R., DMITRIEV S. N., GAGGELER H. W., GORSHKOV V., HENDERSON R. A., ITKIS M. G., JOHNSEN A. M., KENNEALLY J. M., LEBEDEV V. YA., LOBANOV Yu. V., MALYSHEV O. N., MOODY K. J., OGANESSIAN Yu. Ts., PETRUSCHKIN O. V., POLYAKOV A. N., PIGUET D., POPEKO A. G., RASMUSSEN P., SAGAIDAK R. N., SEROV A. A., SHIROKOVSKY I. V., SHAUGHNESSY D. A., SHISHKIN S. V., SUKHOV A. M., SHUTOV A. V., STOYER M. A., STOYER N. J., SVIRIKHIN A. I., TERESHATOV E. E., TSYGANOV Yu. S., UTYONKOV V. K., VOSTOKIN G. K., WĘGRZECKI M., WILK P. A., YEREMIN A.: Chemical Investigation of Element 114. Proc. of the Seventh Workshop on the Chemistry of the Heaviest Elements. Mainz, Germany, 11-13.10.2009 (on line).
• [P11] EKWIŃSKA M., RYMUZA Z.: Lateral Force Calibration Method used for Calibration of Atomic Force Microscope. J. Telecom. a. Inform. Technol. 2009 no. 4 p. 83-87.
• [P12] EKWIŃSKA M., RYMUZA Z.: Normal Force Calibration Method used for Calibration of Atomic Force Microscope. Acta Phys. Pol. A 2009 vol. 116 Suppl. p. S78-S81.
• [P13] EKWIŃSKA M., RYMUZA Z.: New Approach to Estimate Nanowear Test Results Through Nanoidentation Test. Microelectron. Eng. 2010 vol. 87 p. 1404-1409.
• [P14] FIJAŁKOWSKI M., KARCZEMSKA A., ŁYSKO J., LOUDA P., RALCHENKO V., MITURA S.: Diamond Electrophoretic Microchip. Elektronika 2009 vol. L no. 9 p. 27-30 (in Polish).
• [P15] GRABIEC P.: High-Tech in Polish. Interwiev. Gaz. Wyb. 26.01.2009 p. 1-2 (in Polish).
• [P16] GRABIEC P.: Interview on the Key Project MNS-DIAG. Funds for Science and Higher Education. Bull. of the Ministry of Science and Higher Education 2009 no. 9 p. 7-8 (in Polish).
• [P17] GRABIEC P., KUŹMICZ W., NAPIERALSKI A.: Nanoelectronics in Poland: Barriers, Chances and Directions. Analysis of the Current State and Development Directions of Electronics and Telecommunications. Report of the Committee of Electronics and Telecommunications. Warsaw, Poland, 2009, p. 72-111. www.keit.pan.pl (in Polish).
• [P18] JANCZYK G., BIENIEK T., GRABIEC P., SZYNKA J.: Thermo-Mechanical Aspects of Reliability for Vertically Integrated Heterogeneous Systems. Proc. of the 16th Int. Conf. "Mixed Design of Integrated Circuits and Systems" MIXDES 2009. Lodz, Poland, 25-27.06.2009, p. 536-540.
• [P19] JANCZYK G., BIENIEK T., GRABIEC P., SZYNKA J.: Thermo-Mechanical Aspects of Reliability for Vertically Integrated Heterogeneous Systems. Elektronika 2009 vol. L no. 12 p. 83-87.
• [P20] JANCZYK G., BIENIEK T., SZYNKA J., GRABIEC P.: Reliability Aspects of 3D-Oriented Heterogeneous Device Related to Stress Sensitivity of MOS Transistors. Proc. of the IEEE Int. 3D Systems Conf. 2009, San Francisco, USA, 28-30.09.2009, CD, 2009, p. 1-6.
• [P2l] JANUS P., SZMIGIEL D., WEISHEIT M., WIELGOSZEWSKI G., RITZ Y., GRABIEC P., HECKER M., GOTSZALK T., SULECKI P., ZSCHECH E.: Novel SThM Nanoprobe for Thermal Properties Investigation of Micro- and Nanoelectronic Devices. Microelectron. Eng. (in press).
• [P22] JANUS P., SZMIGIEL D., WEISHEIT M., WIELGOSZEWSKI G., RITZ Y., GRABIEC P., HECKER M., GOTSZALK T., SULECKI P., ZSCHECH E.: Novel SThM Nanoprobe for Thermal Properties Investigation of Micro- and Nanoelectronic Devices. Proc. of the 35th Int. Conf. on Micro and Nano Engineering. Ghent, Belgium, 28.09-1.10.2009 (submit. to print).
• [P23] JASEK T., BUDZYŃSKI T., STRYSZAK E.: Optopneumatic Detector with Platinum Flow Sensor. Acta Phys. Pol. A 2009 vol. 116 no. 3 p. 247-250.
• [P24] KARCZEMSKA A., WITKOWSKI D., RALCHENKO V., BOLSHAKOV A., SOVYK D., ŁYSKO J., HASSARD J.: Diamond Microfluidic Devices Manufactured with the Replica Method. Proc. of the V Int. Conf. MEMSTECH'2009, Polyana-Svalyava, Ukraine, 22-24.04.2009, p. 17-19.
• [P25] KOCIUBIŃSKI A., DUK M., BIENIEK T., JANCZYK G.: Multidomain Modeling and Simulation of CVD Diamond Layers for MEMS/MOEMS. Prz. Elektrotechn. (submit. to print, in Polish).
• [P26] KOCIUBIŃSKI A., DUK M., BIENIEK T., JANUS P.: Modeling, Simulation and Calibration of Silicon Wet Etching. J. Telecom. a. Inform. Technol. 2009 vol. 4 p. 65-70.
• [P27] ŁYSKO J., WITKOWSKI D., OBIDOWSKI D., KARCZEMSKA A.: Numerical Simulations of Diamond Microfluidic Device for the Biomolecules Electrophoretic Separations. Comp. Meth. in Mater. Sci. (submit. to print).
• [P28] MALINOWSKI A., SEKINE M., HORI M., TOMASZEWSKI D., ŁUKASIAK L., JAKUBOWSKI A.: Co-Simulation Matlab-Sentaurus for LWR Modeling in Double Gate Field Effect Transistors. Proc. of the Computer Methods and Systems CMS 2009. Kraków, Poland, 26-27.11.2009 (submit. to print).
• [P29] MALINOWSKI A., TOMASZEWSKI D., ŁUKASIAK L., JAKUBOWSKI A., SEKINE M., HORI M., KORWIN-PAWŁOWSKI M.: Analysis of Dispersion of Electrical Parameters and Characteristics of FinFET Devices. J. Telecom. a. Inform. Technol. (submit. to print).
• [P30] MALYUTENKO V. K., MALYUTENKO O. Yu., BOGATYRENKO V. V., TYKHONOV A. M., PIOTROWSKI T., GRODECKI R., PUŁTORAK J., WĘGRZECKI M.: Planar Silicon Light Emitting Arrays for the 3-12 Micrometer Spectral Band. J. Appl. Phys. 2009 vol. 106 p. 113106-5.
• [P31] MARCZEWSKI J., GRABIEC P., KUCHARSKI K., TOMASZEWSKI D., KUCEWICZ W., KUSIAK T., NIEMEC H., SAPOR M., RUDDELL F. H., ARMSTRONG B. M., GAMBLE H. S., LOSTER B. W., MAJEWSKI S.: Development of a Monolithic Active Pixel Sensor Using SOI Technology with a Thick Device Layer. IEEE Trans. on Nucl. Sci. 2010 vol. 57 no. 1 p. 381-385.
• [P32] MILITARU O., BERGAUER T., BERGHOLZ M., DE BOER W., BORRAS K., CORTINA GIL E., DIERLAMM A., DRAGICEVIC M., ECKSTEIN D., ERFLE J., FERNANDEZ M., FELD L., FREY M., FRIEDL M., FRETWURST E., GAUBAS E., GONZALES F. J., GRABIEC P., GRODNER M., HARTMANN F., HANSEL S., HOFFMANN K. H., HRUBEC J., JARAMILLO R., KARPIŃSKI W., KAZUKAUSKAS V., KLEIN K., KHOMENKOV V., KLANNER R., KRAMMER M., KUCHARSKI K., LANGE W., LEMAITRE V., MOYA D., MARCZEWSKI J., MUSSGILLER A., RODRIGO T., MULLER T., SAMMET J., SCHLEPER P., SCHWANDT J., SIMONIS J., SRIVASTAVA A., STEINBRUCK G., TOMASZEWSKI D., SAKALAUSKAS S., STORASTA J., VAITKUS J. V., LOPEZ VIRTO A., VILA L., ZASINAS E.: Simulation of Electrical Parameters of New Design of SLHC Silicon Sensors for Large Radii. Nucl. Instr. & Meth. in Phys. Res. A 2010 vol. 617 p. 563-564.
• [P33] PADMARAJ D., ZAGOZDZON-WOSIK W., XIE L.-M., PIJANOWSKA D., MILLER J. H., GRABIEC P., WOSIK J.: BioMEMS for Mitochondria Medicine. NSTI-Nanotech. 2009 vol. 1 p. 464-467.
• [P34] PIOTROWSKI T., MALYUTENKO V. K., MALYUTENKO O. Yu., WĘGRZECKI M., CZERWIŃSKI A., POLAKOWSKI H., TYKHONOV A. M.: Optimization of Parameters for Silicon Planar Source of Modulated Infrared Radiation. Proc. of the MicroTherm 2009, VIII Int. Conf. on Microtechnology and Thermal Problems in Electronics. Lodz, Poland, 28.06-1.07.2009, p. 263-269.
• [P35] PIOTROWSKI T., MALYUTENKO V. K., MALYUTENKO O. Yu., WĘGRZECKI M., CZERWIŃSKI A., POLAKOWSKI H., TYKHONOV A. M.: Optimization of Parameters for Silicon Planar Source of Modulated Infrared Radiation. Mater. Sci. a. Eng. (submit. to print).
• [P36] RZODKIEWICZ W., PANAS A.: Application of Spectroscopic Ellipsometry for Investigations of Compaction and Decompaction State in Si-SiO2 Systems. J. Phys.: Conf. Series 2009 vol. 181 p. 012035-7.
• [P37] RZODKIEWICZ W., PANAS A.: Determination of the Analytical Relationship between Refractive Index and Density of SiO2 Layers. ActaPhys. Pol A 2009 vol. 116 Suppl. p. S92-S94.
• [P38] RZODKIEWICZ W., PANAS A.: Spectroscopic Ellipsometry Studies of Elastic and Non-Elastic Strains in Si-SiO2 Systems. Proc. of the 13th Nation. a. 4th Int. Conf. "Metrology in Production Engineering". Poznań, Poland, 23-25.09.2009, p. 419-424.
• [P39] TOMASZEWSKI D., MALINOWSKI A., ZABOROWSKI M., SALEK P., ŁUKASIAK L., JAKUBOWSKI A.: Fluctuations of Electrical Characteristics of FinFET Devices. Proc. of the 16th Int. Conf. "Mixed Design of Integrated Circuits and Systems" MIXDES 2009. Lodz, Poland, 25-27.06.2009, p. 61-66.
• [P40] YAKUSHEV A., GRAEGER R., GORSHKOV V., TURLER A., ACKERMANN D., DULLMANN Ch. E., ESSEL H.-G., JAGER E., HESSBERGER F. P., KHUYAGBAATAR J., KRIER J., KURZ N., SCHADEL M., SCHAUSTEN B., SCHIMPF E., RUDOLPH D., EVEN J., KRATZ J. V., WIEHL N., CHEPIGIN V. L., FOMICHEV A., GORSHKOV A., KRUPKO S., BAR J., GRABIEC P., PANAS A., WĘGRZECKI M.: A New TASCA Focal Plane Detector and Data Acquisition System. Proc. of the Seventh Workshop on the Chemistry of the Heaviest Elements. Mainz, Germany, 11-13.10.2009 (on line).
• [P41] YAKUSHEV A., GRAEGER R., GORSHKOV A., TURLER A., ACKERMANN D., DULLMANN E., JAGER E., HEISSBERGER F. P., KHUYAGBAATAR J., KRIER J., SCHADEL M., SCHAUSTEN B., SCHIMPF E., RUDOLPH D., EVEN J., KRATZ J. V., WIEHL N., CHEPIGIN V. I., FOMICHEV A., GORSHKOV V., KRUPKO S., BAR J., GRABIEC P., PANAS A., WĘGRZECKI M., DVORAK J., SEMCHENKOV A., UUSITALO J.: A New TASCA Focal Plane Detector. GSI Sci. Rep. 2008, 2009, p. 141.
• [P42] YASHCHYSHYN Y., MARCZEWSKI J., TOMASZEWSKI D.: Investigation of the SPIN Diodes for Silicon Monolithic Antennas with Reconfigurable Aperture. IEEE Trans. on Microwave Theory a. Techniq. (submit. to print).
• [P43] VOLOTSENKO I., MOLOTSKII M., BARKAY Z., MARCZEWSKI J., GRABIEC P., JAROSZEWICZ B., MESHULAM G., GRUNBAUM E., ROSENWAKS Y.: Secondary Electron Doping Contrast: Theory Based on HRSEM and KPFM Measurements. J. Appl. Phys. 2010 vol. 107 p. 014510
• [P44] WITKOWSKI D., OBIDOWSKI D., ŁYSKO J., KARCZEMSKA A.: 3D Simulations of Diamond Microfluidic Devices. Inż. Biomater. (Eng. of Biomater.) 2009 vol. XII no. 86 p. 14-16.
• [P45] WITTWER D., ABDULLIN F. Sh., AKSENOV N. V., ALBIN Yu. V., BOZHIKOV. G. A., DMITRIEV S. N., DRESSLER R., EICHLER R., GAGGELER H. W., HENDERSON R. A., HUBENER S., KENNEALLY J. M., LEBEDEV V. Ya., LOBANOV Yu. V., MOODY K. J., OGANESSIAN Yu. Ts., PETRUSCHKIN O. V., POLYAKOV A. N., PIGUET D., RASMUSSEN P., SAGAIDAK R. N., SEROV A. A., SHIROKOVSKY I. V., SHAUGHNESSY D. A., SHISHKIN S. V., SUKHOV A. M., STOYER M. A., STOYER N. J., TERESHATOV E. E., TSYGANOV Yu. S., UTYONKOV V. K., VOSTOKIN G. K., WĘGRZECKI M., WILK P. A.: GAS PHASE Chemical Studies of Superheavy Elements Using the Dubna Gas-Filled Recoil Separator - Stopping Range Determination. Nucl. Instr. & Meth. in Phys. Res. B 2010 vol. 268 p. 28-35.
• [P46] ZABOROWSKI M., GRABIEC P., DOBROWOLSKI R., PANAS A., SKWARA K., SZMIGIEL D., WZOREK M.: Nanoscale Pattern Definition by Edge Oxidation of Silicon under the Si3N4 Mask - PaDEOx. Acta Phys. Pol. A 2009 vol. 116 Suppl. p. S139-S141.
• [P47] ZABOROWSKI M., TOMASZEWSKI D., JAROSZEWICZ B., GRABIEC P.: Si-Based Electrodes for Potentiometric Measurements of Aqueous Solutions. J. Telecom. a. Inform. Technol. 2009 vol. 4 p. 71-75.
• [P48] ZABOROWSKI M., TOMASZEWSKI D., PANAS A., GRABIEC P.: Double-Fin FETs Based on Standard CMOS Approach. Microelectron. Eng. (submit to print).
• [P49] ZIÓŁKOWSKI R., GÓRSKI L., ZABOROWSKI M., MALINOWSKA E.: Application of Mass Fabricated Silicon-Based Gold Transducers for Amperometric Biosensors. Bioelectrochem. (submit. to print).
• [C1] ARABAS J., BARTNIK L., SZOSTAK S., TOMASZEWSKI D.: Global Extraction of MOSFET Parameters Using the EKV Model: Some Properties of the Underlying Optimization Task. MOS-AK Workshop. Frankfurt, Germany, 3.04.2009 (commun.).
• [C2] ARABAS J., BARTNIK L., SZOSTAK S., TOMASZEWSKI D.: Global Extraction of MOSFET Parameters Using the EKV Model: Some Properties of the Underlying Optimization Task. 16th Int. Conf. "Mixed Design of Integrated Circuits and Systems" MIXDES 2009. Lodz, Poland, 25-27.06.2009 (commun.).
• [C3] BIENIEKT., JANCZYK G.: ITE Part of Corona Vision. Corona WPS-WP10 Meet. Erfurt, Germany, 24.04.2009 (commun.).
• [C4] BIENIEK T., JANCZYK G.: ITE Status of the Work - eCubes Modeling and Simulations of the Health and Fitness Demonstrator, 11th e-Cubes SP2 Meet. Grenoble, France, 3-4.03.2009 (paper).
• [C5] BIENIEK T., JANCZYK G.: Status of WP 10: Demonstration of Business Cases for Customer-Driven Product Engineering. Corona WP4-7 Meeting + Corona General Meeting + Corona Exploitation Strategy Sem. Cambridge, Great Britain, 15-17.06.2009 (commun.).
• [C6] BIENIEK T., JANCZYK G., GRABIEC P., SZYNKA J.: Thermo-Mechanical Reliability Loop in Device Modeling. 15th Int. Workshop on Thermal Investigations of ICs and Systems THERMINIC 2009. Leuven, Belgium, 7-9.10.2009 (poster).
• [C7] BIENIEK T., JANCZYK G., JANUS P., SZYNKA J., GRABIEC P.: Reliability Issues in Modeling and Simulations of the Heterogeneous Integrated Systems. Smart Systems Integration 2009 Conf. Brussels, Belgium, 10-11.03.2009 (poster).
• [C8] BIENIEK T., JANCZYK G., JANUS P., SZYNKA J., GRABIEC P., KOCIUBIŃSKI A., EKWIŃSKA M., TOMASZEWSKI D., MALINOWSKI A.: Multi-Domain Modeling and Simulations of the Heterogeneous Systems. 8th Symp. "Diagnostic & Yield Advanced Silicon Devices and Technologies for ULSI Era". Warsaw, Poland, 22-24.06.2009 (poster).
• [C9] BIENIEK T., JANCZYK G., KALICIŃSKI S.: Status of WP 10: Demonstration of Business Cases for Customer-Driven Product Engineering. Corona General Meet. Warsaw, Poland, 3-4.12.2009 (commun.).
• [C10] DUK M., KOCIUBIŃSKI A., BIENIEK T., JANUS P.: 3-D Modeling of Anisotropic Wet Etching of Silicon. 6th Int. Conf. "New Electrical and Electronic Technologies and Their Industrial Implementation" NEET 2009. Zakopane, Poland, 23-26.06.2009 (poster, in Polish).
• [C11] DULLMANN Ch. E., WĘGRZECKI M., BAR J., PANAS A., GRABIEC P.: Studies of the Reaction 244Pu(48Ca,3-4n)288,289 114 at TASCA. 8th Workshop on Recoil Separator for Superheavy Element Chemistry. Darmstadt, Germany, 14.10.2009 (paper).
• [C12] DUMANIA P., DOMAŃSKI K.: Microsystems for Biology, Chemistry and Medical Applications. 2nd Forum Science & Technology Days Poland-East. Białystok-Białowieża, Poland, 22-24.04.2009 (paper).
• [C13] DUMANIA P., DOMAŃSKI K.: Microsystems for Biology, Chemistry and Medical Applications. 2nd Forum Science & Technology Days Poland-East. Białystok-Białowieża, Poland, 22-24.04.2009 (poster).
• [C14] DUMANIA P., DOMAŃSKI K.: Microfabrication for Biochemical Microdevices. ITMED 2009 Innovative Technologies for Medicine. Białystok, Poland, 1-3.12.2009 (paper).
• [C15] EICHLER R., ABDULLIN F. Sh., AKSENOV N. V., ALBIN Yu. V., BELOZEROV A. V., BOZHIKOV G. A., CHEPIGIN V. I., DRESSLER R., DMITRIEV S. N., GAGGELER H. W., GORSHKOV V., HENDERSON R. A., ITKIS M. G., JOHNSEN A. M., KENNEALLY J. M., LEBEDEV V. Ya., LOBANOV Yu. V., MALYSHEV O. N., MOODY K. J., OGANESSIAN Yu. Ts., PETRUSCHKIN O. V., POLYAKOV A. N., PIGUET D., POPEKO A. G., RASMUSSEN P., SAGAIDAK R. N., SEROV A. A., SMROKOVSKY I. V., SHAUGHNESSY D. A., SHISHKIN S. V., SUKHOV A. M., SHUTOV A. V., STOYER M. A., STOYER N. J., SVIRIKHIN A. I., TERESHATOV E. E., TSYGANOV Yu. S., UTYONKOV V. K., VOSTOKIN G. K., WĘGRZECKI M., WILK P. A., YEREMIN A.: Chemical Investigation of Element 114. Seventh Workshop on the Chemistry of the Heaviest Elements. Mainz, Germany, 11-13.10.2009 (paper).
• [C16] EKWIŃSKA M., RYMUZA Z.: Lateral Force Calibration Method used for Calibration of Atomic Force Microscope. 8th Symp. "Diagnostic & Yield Advanced Silicon Devices and Technologies for ULSI Era". Warsaw, Poland, 22-24.06.2009 (poster).
• [C17] EKWIŃSKA M., RYMUZA Z.: Normal Force Calibration Method used for Calibration of Atomic Force Microscope. 3rd Nation. Conf. on Nanotechnology NANO 2009. Warsaw, Poland, 22-26.06.2009 (poster).
• [C18] EKWIŃSKA M., RYMUZA Z.: New Approach to Estimate Nanowear Test Results Through Nanoidentation Test. 35th Int. Conf. on Micro and Nano Engineering. Ghent, Belgium, 28.09-1.10.2009
• [C19] GRABIEC P.: How to Write o Good Proposal. Evaluator's View. Workshop of Coordinators "How to Obtain Funding for the Project Submitted to the 7th Framework Programme of the European Union?" Warsaw, Poland, 27.01.2009 (inv. lect.).
• [C20] GRABIEC P.: Clean Rooms for Micro- and Nano-Technology. Sem. of the Faculty of Physics University of Warsaw, Poland, 26.05.2009 (paper, in Polish).
• [C21] GRABIEC P.: Micro- & Nano-Fabrication Technology Research in ITE, Warsaw, Poland. Sem. Tel Awiv University & INTEL Lab. Tel Aviv, Israel, 21-22.06.2009 (paper).
• [C22] GRABIEC P.: The Concept of Polish Research Center for Micro- and Nano-Electronic Technology. 16th Int. Conf. "Mixed Design of Integrated Circuits and Systems" MIXDES 2009. Lodz 25-27.06.2009 (inv. lect., in Polish).
• [C23] GRABIEC P.: The Concept of Polish Research Center for Micro- and Nano-Electronic Technology. Meet. of the Committee of Electronics and Telecommunications, PAS. Wrocław, Poland, 27.06.2009 (paper, in Polish).
• [C24] GRABIEC P.: EU Infrastructure to Support Electronic Research Activity. EUBR 2009. Sao Paulo, Brazil, 8-9.09.2009 (inv. lect.).
• [C25] GRABIEC P., DOMAŃSKI K., JANUS P.: Micro- & Nano-Fabrication Technology Research in ITE, Warsaw, Poland. Sem. Chung-Yuan University. Chung Li, Taiwan, 17.02.2009 (paper).
• [C26] GRABIEC P., DOMAŃSKI K., JANUS P.: Micro- & Nano-Fabrication Technology Research in ITE, Warsaw, Poland. Sem. National Nano Device Laboratories. Hsinchu, Taiwan, 18.02.2009 (paper).
• [C27] GRABIEC P., DUMANIA P., SZYNKA J.: Heterogenic Microsystems for Interdisciplinary Applications - Examples and Possibilities for Fabrication. Sem. of the National Institute of Telecommunications. Warsaw, Poland, 8.04.2009 (paper, in Polish).
• [C28] GRABIEC P., JANUS P.: Integrated Micro- and Nanosensors Technology and Application. 4th Workshop AFM Based Nanoscale Analysis. Dresden, Germany, 8-9.05.2009 (inv. lect.).
• [C29] GRABIEC P., ZABOROWSKI M., JAROSZEWICZ B.: Micro- & Nano Technology for Chemical and Bio-Medical Diagnostics. Sem. Chung-Yuan University. Chung Li, Taiwan, 19.02.2009 (paper).
• [C30] JANCZYK G., BIENIEK T.: Silicon Microsystem and Nanostructure Technology Department and Integrated Circuits and Systems Department for e-Cubes Project. eCubes 3-rd Partners Meet. Lozanna, Switzerland, 26-27.01.2009 (inv. lect.).
• [C31] JANCZYK G., BIENIEK T.: Status of the Work - eCubes Device Stress Sensitivity Modeling for Basic IC Blocks (Analogue & Digital). 11th e-Cubes SP2 Meet. Grenoble, France, 3-4.03.2009 (inv. lect.).
• [C32] JANCZYK G., BIENIEK T.: ITE Status of the Work - eCubes Modeling and Simulations of the Health and Fitness Demonstrator. 11th e-Cubes SP2 Meet. Grenoble, France, 3-4.03.2009 (paper).
• [C33] JANCZYK G., BIENIEK T.: Silicon Microsystem and Nanostructure Technology Department & Integrated Circuits and Systems Department for e-Cubes Project. 3rd eCubes Review Meet. Leuven, Belgium, 5-6.03.2009 (inv. lect.).
• [C34] JANCZYK G., BIENIEK T.: ITE Part of Corona Vision. Corona WP4-WP8 Meet. Siegen, Germany, 20-21.04.2009 (inv. lect.).
• [C35] JANCZYK G., BIENIEK T., GRABIEC P., SZYNKA J.: Thermo-Mechanical Aspects of Reliability for Vertically Integrated Heterogeneous Systems. 16th Int. Conf. "Mixed Design of Integrated Circuits and Systems" MIXDES 2009. Lodz, Poland, 25-27.06.2009 (paper).
• [C36] JANCZYK G., BIENIEK T., SZYNKA J., GRABIEC P.: Reliability Aspects of 3D-Oriented Heterogeneous Device Related to Stress Sensitivity of MOS Transistors. IEEE Int. 3D Systems Conf. 2009, San Francisco, USA, 28-30.09.2009 (poster).
• [C37] JANCZYK G., BIENIEK T., SZYNKA J., GRABIEC P.: Heterogeneous e-Cubes Device IC-Design Selected Design Guidelines. 12th SP2 eCubes Meet. Munich, Germany, 17-18.06.2009 (paper).
• [C38] JANCZYK G., ŁYSKO J.: Interlayer Cooling. Kick-off Meet. Interlayer Cooling. Zurich, Switzerland, 7.09.2009 (inv. lect).
• [C39] JANUS P., SZMIGIEL D., WEISHEIT M., WIELGOSZEWSKI G., RITZ Y., GRABIEC P., HECKER M., GOTSZALK T., SULECKI P., ZSCHECH E.: Novel SThM Nanoprobe for Thermal Properties Investigation of Micro- and Nanoelectronic Devices. 35th Int. Conf. on Micro and Nano Engineering. Ghent, Belgium, 28.09-1.10.2009 (poster).
• [C40] JANUS P., SZMIGIEL D., WEISHEIT M., WIELGOSZEWSKI G., RITZ Y., GRABIEC P., HECKER M., GOTSZALK T., SULECKI P., ZSCHECH E.: Novel SThM Nanoprobe for Thermal Properties Investigation of Micro- and Nanoelectronic Devices. 35th Int. Conf. on Micro and Nano Engineering. Ghent, Belgium, 28.09-1.10.2009 (commun.).
• [C41] JASEK T., BUDZYŃSKI T., STRYSZAK E.: Optopneumatic Detector with Platinum Flow Sensor. 3rd Conf. "Integrated Optics - Sensors, Sensing Structures and Methods". Korbielów, Poland, 23-26.02.2009 (poster).
• [C42] KARCZEMSKA A., WITKOWSKI D., ŁYSKO J.: Joule Heating Effects in Capillary Electrophoresis - Designing of Electrophoretic Microchips Manufactured with CVD Polycrystalline Diamond. Int. Conf. "Vacuum and Plasma Surface Engineering" VaPSE 2009. Hejnice-Liberec, Czech Republic, 22-26.10.2009 (commun.).
• [C43] KARCZEMSKA A., WITKOWSKI D., RALCHENKO V., BOLSHAKOV A., SOVYK D., ŁYSKO J., HASSARD J.: Diamond Microfluidic Devices Manufactured with the Replica Method. V Int. Conf. MEMSTECH'2009. Polyana-Svalyava, Ukraine, 22-24.04.2009 (commun.).
• [C44] KOCIUBIŃSKI A., DUK M., BIENIEK T., JANCZYK G.: Multidomain Modeling and Simulation of CVD Diamond Layers for MEMS/MOEMS . 6th Int. Conf. "New Electrical and Electronic Technologies and Their Industrial Implementation" NEET 2009. Zakopane, Poland, 23-26.06.2009 (poster, in Polish).
• [C45] KOCIUBIŃSKI A., DUK M., BIENIEK T., JANUS P.: Modeling, Simulation and Calibration of Silicon Wet Etching. 8th Symp. "Diagnostic & Yield Advanced Silicon Devices and Technologies for ULSI Era". Warsaw, Poland, 22-24.06.2009 (poster).
• [C46] KOCIUBIŃSKI A., DUK M., BIENIEK T., JANCZYK G.: 3-D Modeling of CVD Diamond Layers for MEMS Applications. 8th Symp. "Diagnostic & Yield Advanced Silicon Devices and Technologies for ULSI Era". Warsaw, Poland, 22-24.06.2009 (poster).
• [C47] KUCEWICZ W., ARMSTRONG B. M., GAMBLE H. S., GRABIEC P., JASTRZĄB M., KUCHARSKI K., MARCZEWSKI J., NIEMIEC M., RUDDELL F. H., SAPOR M., TOMASZEWSKI D.: Progress in Development of Monolithic Active Pixel Sensors in SOI Technology. New Developments in Radiation Detectors 11th Europ. Symp. on Semiconductor Detectors. Wildbad Kreuth, Germany, 7-11.06.2009 (inv. lect.).
• [C48] LUE Ch.-E., PIJANOWSKA D., LAI C. S., JAROSZEWICZ B., LIN Y.-T., YANG C. M.: Comparison of Single and Stacked Sensing Membrane for pH-ISFET. E-MRS Fall Meet. 2009. Warsaw, Poland, 14-18.09.2009 (paper).
• [C49] ŁYSKO J.: MOS Resistor and Transistors as Components for Detection of Mechanical Interaction. Research group for Microelectronics and Nanoelectronics. Warsaw, Poland, 15.01.2009 (inv. lect., in Polish).
• [C50] ŁYSKO J.: Anisotropic Etching of Silicon as a Tool of Microtechnology. Research group for Microelectronics and Nanoelectronics. Warsaw, Poland, 2.04.2009 (inv. lect, in Polish).
• [C51] ŁYSKO J., WlTKOWSKI D., OBIDOWSKI D., KARCZEMSKA A.: Numerical Simulations of Diamond Microfluidic Device for the Biomolecules Electrophoretic Separations. 16th Conf. "Computer Methods in Materials Technology" KOMPLASTECH'2009. Krynica-Zdrój, Poland, 11-14.01.2009 (commun.).
• [C52] MALINOWSKI A., TOMASZEWSKI D., ŁUKASIAK L., JAKUBOWSKI A., SEKINE M., HORI M., KORWIN-PAWŁOWSKI M.: FinFET Scaling - Analysis of Electrical Parameters and Characteristics. Nano and Giga Challenges in Electronics, Photonics and Renewable Energy. Ontario, Canada, 10-14.08.2009 (poster).
• [C53] MALINOWSKI A., HORI M., SEKINE M., TAKEUCHI W., BIENIEK T., TOMASZEWSKI D.: Modeling Considerations and Performance Estimation of Single Carbon Nano Wall Based Field Effect Transistor by 3D TCAD Simulation Study. 19th Symp. of MRS-Japan. Yokohama, Japan, 7-9.12.2009 (paper).
• [C54] MALINOWSKI A., HORI M., SEKINE M., TAKEUCHI W., BIENIEK T., TOMASZEWSKI D.: Modeling Considerations and Performance Estimation of Single Carbon Nano Wall Based Field Effect Transistor by 3D TCAD Simulation Study. 19th Symp. of MRS-Japan. Yokohama, Japan, 7-9.12.2009 (commun.).
• [C55] MARCZEWSKI J.: ITE, Poland - Department of Silicon Microsystem and Nanostructure Technology - Specialized Detectors. CEC Meet. (CERN). Geneva, Switzerland, 21-22.04.2009 (inv. lect.).
• [C56] MARCZEWSKI J., KUCHARSKI K., GRODNER M.: Strip Detectors for CEC. CEC Meet. (CMS-CERN). Barcelona, Spain, 17-18.09.2009 (inv. lect.).
• [C57] MARCZEWSKI J., KUCHARSKI K., MALINOWSKI A.: Strip Detector Technology at the ITE. CEC Meet. (CERN). Geneva, Switzerland, 21-22.04.2009 (inv. lect.).
• [C58] MILITARU O., BERGAUER T., BERGHOLZ M., BLUM P., DE BOER W., BORRAS K., CORTINA GIL E., DIERLAMM A., DRAGICEVIC M., ECKSTEIN D., ERFLE J., FERNANDEZ M., FELD L., FREY M., FRETWURST E., GAUBAS E., GONZALES F. J., GRABIEC P., GRODNER M., HARTMANN F., HANSEL S., HOFFMANN K. H., HRUBEC J., JARAMILLO R., KARPIŃSKI W., KAZUKAUSKAS V., KLEIN K., KHOMENKOV V., KLANNER R., KRAMMER M., KUCHARSKI K., LANGE W., LEMAITRE V., MOYA D., MARCZEWSKI J., MUSSGILLER A., RODRIGO T., MULLER T., SAMMET J., SCHWANDT J., SCHLEPER P., SIMONIS J., SRIVASTAVA A., STEINBRUCK G., TOMASZEWSKI D., SAKALAUSKAS S., STORASTA J., VAITKUS J. V.: Simulation of Electrical Parameters of New Design of SLHC Silicon Sensors for Large Radii. Frontier Detectors for Frontier Physics. La Biadola, Italy, 24-30.05.2009 (poster).
• [C59] OBRĘBSKI D., TOMASZEWSKI D., KUCHARSKI K., KLOS H., GRABIEC P.: The MPW Service Provided by Institute of Electron Technology. 16th Int. Conf. "Mixed Design of Integrated Circuits and Systems" MIXDES 2009. Lodz, Poland, 25-27.06.2009 (paper).
• [C60] OBRĘBSKI D., TOMASZEWSKI D., KUCHARSKI K., KLOS H., GRABIEC P., SZYNKA J.: The Multi Project Wafer Service Provided by Institute of Electron Technology. II Science and Technology Poland-East Forum. Białystok, Białowieża, Poland, 22-24.05.2009 (poster).
• [C61] PADMARAJ D., ZAGOŻDŻON-WOSIK W., XIE L.-M., PIJANOWSKA D., MILLER J. H., GRABIEC P., WOSIK J.: BioMEMS for Mitochondria Medicine. Nanotech Conf. & Expo 2009. Houston, USA, 3-7.05.2009 (paper).
• [C62] PADMARAJ D., ZAGOŻDŻON-WOSIK W., PANDE R., MILLER J. H., XIE L.-M., GRABIEC P.: The Polarization Effect in a Four Electrodes with Mesh Structures. The 26th Annual Houston Conf. on Biomedical Engineering Research. Houston, USA, 19-20.03.2009 (poster).
• [C63] PIOTROWSKI T., MALYUTENKO V. K., MALYUTENKO O.Yu., WĘGRZECKI M., CZERWIŃSKI A., POLAKOWSKI H., TYKHONOV A. M.: Optimization of Parameters for Silicon Planar Source of Modulated Infrared Radiation. MicroTherm 2009, VIII Int. Conf. on Microtechnology and Thermal Problems in Electronics. Lodz, Poland, 28.06-1.07.2009 (poster).
• [C64] PIOTROWSKI T., WĘGRZECKIM., POLAKOWSKI H., MALYUTENKO V. K., CZERWIŃSKI A.: Silicon Planar Source of Modulated Infrared Radiation. E-MRS Fall Meet. 2009. Warsaw, Poland, 14-18.09.2009 (poster).
• [C65] RZODKIEWICZ W., PANAS A.: Determination of the Analytical Relationship between Refractive Index and Density of SiO2 Layers. 3rd Nation. Conf. on Nanotechnology NANO 2009. Warsaw, Poland, 22-26.06.2009 (poster, in Polish).
• [C66] RZODKIEWICZ W., PANAS A.: Application of Spectroscopic Ellipsometry for Investigations of Compaction and Decompaction State in Si-SiO2 Systems. 7th Int. Conf. on Modern Practice in Stress and Vibration Analysis. Cambridge, Great Britain, 8-10.09.2009 (paper).
• [C67] RZODKIEWICZ W., PANAS A.: Spectroscopic Ellipsometry Studies of Elastic and Non-Elastic Strains in Si-SiO2 Systems. 13th National and 4th Int. Conf. "Metrology in Production Engineering". Poznań-Żerków, Poland, 23-25.09.2009 (poster).
• [C68] SAWICKA A., ŁUKASIAK L., JAKUBOWSKI A., TOMASZEWSKI D.: A New Compact Model for Short-Channel Symmetric DO MOSFET. MOS-AK Workshop Conf. ESSDERC'2009. Athens, Greece, 18.09.2009 (poster).
• [C69] SRIVASTAVA A., ECKSTEIN D., FRETWURST E., KLANNER R., STEINBRUCK G., HARTMANN F., BERGAUER T., DRAGICEVIC M., MUSSGILLER A., KHOMENKOV V., SCHLEPER P., SCHWANDT J., FELD L., KARPIŃSKI W., KLEIN K., SAMMET J., BERGHOLZ M., BORRAS K., ECKERLIN G., LANGE W., DE BOER W., BLUM P., DIERLAMM A., ERFLE J., FREY M., HOFFMANN H., MULLER T., SIMONIS J., CORTINA GIL E., LEMAITRE V., MILITARU O., FERNANDEZ M., GONZALES F. J., JARAMILLO R., LOPEZ VIRTO A., MOYA D., RODRIGO T., VILA I., FRIEDL M., HANSEL S., HRUBEC J., KRAMMER M., VAITKUS J. V., GAUBAS E., KAZUKAUSKAS V., SAKALAUSKAS S., STORASTA J., ZASINAS E., MARCZEWSKI J., GRABIEC P., KUCHARSKI K., GRODNER M., TOMASZEWSKI D.: Strixel Sensor Design for Large Radii of a New CMS Tracker for SLHC. IEEE Nucl. Sci. Symp. a. Medical Imaging Conf. Orlando, USA, 25-31.10.2009 (poster).
• [C70] SŁYSZ W., GUZIEWICZ M., BAR J., WĘGRZECKI M., GRABIEC P., GRODECKI R., WĘRZECKA I., ZWILLER V., DORENBOS S., MILOSTNAYA I., VORONOV B., GOLTSMAN G., KITAYGORSKY J., SOBOLEWSKI R.: Superconducting NbN Nanostructures with a Dielectric Resonant Microcavity and Metallic Mirror for Single-Photon Optical. SPIE Europe Optics and Optoelectronics 2009. Prague, Czech Republic, 20-24.04.2009 (poster).
• [C7l] SOBOLEWSKI R., KITAYGORSKY J., SANDER C., DORENBOS S., REIGER E., SCHOUTEN R., ZWILLER V., SŁYSZ W., JUKNA A.: Superconducting Single-Photon Detectors as Optical-Photon Energy-Resolving Devices. SPIE Europe Optics and Optoelectronics 2009. Prague, Czech Republic, 20-24.04.2009 (paper).
• [C72] TOMASZEWSKI D., MAUNOWSKI A., ZABOROWSKI M., SAŁEK P., ŁUKASIAK L., JAKUBOWSKI A.: Fluctuations of Electrical Characteristics of FinFET Devices. 16th Int. Conf. "Mixed Design of Integrated Circuits and Systems" MIXDES 2009. Lodz, Poland, 25-27.06.2009 (commun.).
• [C73] WĘGRZECKI M., BAR J., BUDZYŃSKI T., CIEŻ M., GÓRSKA M., GRABIEC P., GRODECKI R., GROEGER B., KULAWIK J., KRZEMINSKI S., PANAS A., SŁYSZ W., WĘGRZECKA I., ZABOROWSKI M., YAKUSHEV A., TURLER A., GORSHKOV V., DRESSLER R., SARNECKI J., LIPIŃSKI D.: ITE's α-Particle Detectors for Chromatographic Matrices in COMPACT and COLD Systems. 3rd Nation. Conf. on Nanotechnology NANO 2009. Warsaw, Poland, 22-26.06.2009 (paper, in Polish).
• [C74] WĘGRZECKI M., BAR J., BUDZYŃSKI T., DOBROWOLSKI R., GRABIEC P., GRODECKI R., KULAWIK J., SAWICZ M., SIERAKOWSKI A., PANAS A., SŁYSZ W., WĘGRZECKA I., ZABOROWSKI M., YAKUSHEV A., TURLER A., GORSHKOV A.: New Strip Detectors Developed in ITE for TASCA System. 3rd Nation. Conf. on Nanotechnology NANO 2009. Warsaw, Poland, 22-26.06.2009 (poster, in Polish).
• [C75] YAKUSHEV A., GRAEGER R., GORSHKOV V., TURLER A., ACKERMANN D., DULLMANN Ch. E., ESSEL H.-G., JAGER E., HESSBERGER F. P., KHUYAGBAATAR J., KRIER J., KURZ N., SCHADEL M., SCHAUSTEN B., SCHIMPF E., RUDOLPH D., EVEN J., KRATZ J. V., WIEHL N., CHEPIGIN V. I., FOMICHEV A., GORSHKOV A., KRUPKO S., BAR J., GRABIEC P., PANAS A., WĘGRZECKI M.: A New TASCA Focal Plane Detector and Data Acquisition System. Seventh Workshop on the Chemistry of the Heaviest Elements. Mainz, Germany, 11-13.10.2009 (paper).
• [C76] ZABOROWSKI M., GRABIEC P., DOBROWOLSKI R., PANAS A., SKWARA K., SZMIGIEL D., WZOREK M.: Fabrication of Narrow Silicon Paths Using PaDEOx. 3rd Nation. Conf. on Nanotechnology NANO 2009. Warsaw, Poland, 22-26.06.2009 (poster, in Polish).
• [C77] ZABOROWSKI M., TOMASZEWSKI D., JAROSZEWICZ B., GRABIEC P.: Si-Based Electrodes for Potentiometric Measurements of Aqueous Solutions. 8th Symp. "Diagnostic & Yield Advanced Silicon Devices and Technologies for ULSI Era". Warsaw, Poland, 22-24.06.2009 (poster).
• [C78] ZABOROWSKI M., TOMASZEWSKI D., JAROSZEWICZ B., TAFF J., GRABIEC P.: Sensors and Devices for Water Analysis. Environmental Risk Management Tools for Water Quality Monitoring - Ocean Business 2009. Southampton, Great Britain, 30.03.2009 (poster).
• [C79] ZABOROWSKI M., TOMASZEWSKI D., PANAS A., GRABIEC P.: Double-Fin FETs Based on Standard CMOS Approach. 35th Int. Conf. on Micro and Nano Engineering. Ghent, Belgium, 28.09-1.10.2009 (poster).
• [PAl] ZABOROWSKI M., GRABIEC P.: A Method to Fabricate a Thin-Film Electrode. Pat. RP no. 202893.
• [PA2] WRZESIŃSKA H., HEJDUK K., GÓRSKA M., MROZIEWICZ B., SCHAB-BALCERZAK E.: A Method to Obtain Optical Coatings on the Resonators of Semiconductor Lasers. Pat. RP no. P.368670.
• [PA3] GRABIEC P., ZABOROWSKI M., DOMAŃSKI K., RANGELOW I. W.: A Method to Fabricate Nanopaths. Pat. RP no. P.359838.
• [PA4] GRABIEC P., ZABOROWSKI M., DOMAŃSKI K., RANGELOW I. W.: A Method to Fabricate Nanowires. Pat. RP no. P.359839.
• [PA5] DUMANIA P.: A Circuit for Detection of Stress in Micromechanical Silicon Structures. Pat. RP no. 205076.
• [PA6] BUDZYŃSKI T., KOWALSKI P., GRABIEC P., LATECKI B., STUDZIŃSKA K.: A Method to Fabricate Silicon Resistors. Pat. RP no. 204308.
• [PA7] ŁYSKO J., JAŹWIŃSKI J., GÓRSKA M., WRZESIŃSKA H.: A Method to Fabricate the Structure of a Heat-Conduction Detector. Pat. RP no. P.353250.
• [PA8] WĘGRZECKI M., SŁYSZ W.: A Method to Fabricate a Photodetector Optically Coupled to an Optic Fiber. Pat. RP no. P.363983.
• [PA9] ŁYSKO J.: Miniature Source of Electrical Energy. Pat. RP no. 203922.
• [PA10] CACCIA M., CONTE L., ALEMI M., CAPPELLINI C., AIROLDI A., BIANCHI C., NOVARIO R., DE BOER W., GRIGORIEV E., NIEMEC H., KUCEWICZ W., CANNILLO F., CLAUS G., COLLEDANI C., DEPTUCH D., DULIŃSKI W., GRABIEC P., MARCZEWSKI J., DOMAŃSKI K., JAROSZEWICZ B., KUCHARSKI K., BADANO L., FERRANDO O., POPOWSKI G., ZALEWSKA A., CZERMAK A.: Monolithic Active Pixel Dosimeter. Pat. US 7582875.