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Prace Instytutu Technologii Elektronowej

2007 | z. 1/2 | 43-55
Tytuł artykułu

Department of Silicon Microsystem and Nanostructure Technology

Autorzy
Grabiec, P.
Warianty tytułu
Języki publikacji
EN
Abstrakty
Słowa kluczowe
PL
EN
Wydawca

Czasopismo
Prace Instytutu Technologii Elektronowej
Rocznik
2007
Tom
z. 1/2
Strony
43-55
Opis fizyczny
Bibliogr. 71 poz., il., wykr.
Twórcy
autor
Grabiec, P.
Bibliografia
  • [P1] BULGHERONI A., BADANO L., CACCIA M., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D., ZALEWSKA A.: Silicon Ultra Fast Cameras for Electron and Sources in Medical Applications: a Progress Report. Nucl. Phys. B (Proc. Suppl.) 2006 vol. 150 p. 308-312.
  • [P2] CACCIA M., BADANO L., BERST D., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., MARCZEWSKI J., TOMASZEWSKI D. ET AL.: The SUCIMA Project: A Status Report on High Granularity Dosimetry and Proton Beam Monitoring. Nucl. Instr. & Meth. in Phys. Res. A 2006 vol. 560 p. 153-157.
  • [P3] DOMAŃSKI K., JANUS P., SZMIGIEL D., PROKARYN P., KOCIUBIŃSKI A., GRABIEC P.: Microsystem Electrodes for Medical Implants. Proc. of the IX Sci. Conf. "Optoelectronic and Electronic Sensors” COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006, p. 403-406 (in Polish).
  • [P4] DOMAŃSKI K., ŁYSKO J., GRABIEC P., DUMANIA P.: Microsystem Technology in ITE, Warsaw, Poland. Proc. of the MINOS EURONET Meet. Barcelona, Spain, 5-6.05.2006.
  • [P5] DVORAK J., BRUCHLE W., CHELNOKOV M., DRESSLER R., DULLMANN E., EBERHARDT K., GORSHKOV V., JAGER E., KRUCKEN R., KUZNETSOV A., NAGAME Y., NEBEL F., NOVACKOVA Z., QUIN Z., SCHADEL M., SCHAUSTEN B., SCHIMPF E., SEMCHENKOV A., THROLE P., TURLER A., WĘGRZECKI M., WIERCZINSKI B., YAKUSHEV A., YEREMIN A.: Doubly Magic Nucleus 270 108 Hs162. Phys. Rev. Lett. 2006 p. 242501-1-4.
  • [P6] GOTSZALK T., MARENDZIAK A., KOLANEK K., SZELOCH R., GRABIEC P., ZABOROWSKI M., JANUS P., RANGELOW I. W.: Scanning Probe Microscopy as a Metrology Method in Micro- and Nanostructure Investigations. Bull. of Polish Acad. Sci., Tech. Sci. 2006 vol. 54 No. 1 p. 1-5.
  • [P7] GRABIEC P., MARCZEWSKI J., YASHCHYSHYN Y., MODELSKI J.: Integration of Heterogeneous MEMS and RF Systems as an Enabling Technology for Unobtrusive Ambient Intelligence. Proc. of the 16th Int. Conf. MIKON'2006. Krakow, Poland, 22-26.05.2006, vol. 3 p. 935-940.
  • [P8] JANUS P., GRABIEC P., DOMAŃSKI K., GOTSZALK T., MULAK P.: Silicon Micro-Chuck with Submicron Displacement for Application in an Integrated Probe of a Hardness Nano-Tester. Proc. of the IX Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Kraków-Zakopane, Poland, 19-22.06.2006, p. 471-474 (in Polish).
  • [P9] JAROSZEWICZ B., TOMASZEWSKI D., GRABIEC P., YANG CHIA-MING, PIJANOWSKA D., DAWGUL M., KRUK J., TORBICZ W.: Lineal Matrix of p-Well and SOI ISFET Chemical Sensors. Proc. of the IX Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006, p. 207-210 (in Polish).
  • [P10] JASTRZAB M., KOZIEL M., KUCEWICZ W., KUCHARSKI K., MARCZEWSKI J., NIEMIEC H., SAPOR M., TOMASZEWSKI D.: Prototypes of Large-Scale SOI Monolithic Active Pixel Sensors. Nucl. Instr. & Meth. in Phys. Res. A 2006 vol. 560 p. 31-35.
  • [P11] KOLANEK K., GOTSZALK T., WOSZCZYNA M., MASALSKA A., ZAWIERUCHA P., MULAK P., SZELOCH R., ZIELONY M., JANUS P., GRABIEC P.: Fabrication of Nanostructures Using Scanning Probe Microscopy. Elektronika 2006 No. 5 p. 27-29 (in Polish).
  • [P12] KOWALSKI P., GNIAZDOWSKI Z., JAŹWIŃSKI J., LATECKI B., STUDZIŃSKA K.: Piezoelectric Drive for MEMS Structures. Proc. of the IX Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006, p. 407-410 (in Polish).
  • [P13] ŁYSKO J., LATECKI B., PIJANOWSKA D., NIKODEM M., WRZESIŃSKA H., PANAS A.: Measurements of the Dynamics of a Silicon, Thermo-Anemometric Sensor of Microflow. Proc. of the IX Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006, p. 127-130 (in Polish).
  • [P14] MARCZEWSKI J., DOMAŃSKI K., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., TOMASZEWSKI D., CACCIA M., KUCEWICZ W., NIEMIEC H.: Technology Development for SOI Monolithic Pixel Detectors. Nucl. Instr. & Meth. in Phys. Res. A 2006 vol. 560 p. 26-30.
  • [P15] MILOSTNAYA I., KORNEEV A., RUBTSOWA I., SELEZNEV V., MINAEVA O., CHULKOVA G., OKUNEV O., VORONOV B., SMIRNOV K., GOLTSMAN G., SŁYSZ W., WĘGRZECKI M., GUZIEWICZ M., BAR J., GÓRSKA M., PEARLMAN A., KITAYGORSKY J., CROSS A., SOBOLEWSKI R.: Superconducting Single-Photon Detectors Designed for Operation at 1.55-?m Telecommunication Wavelength. J. of Physics: Conf. Series 2006 vol. 43 p. 1334-1337.
  • [P16] MULAK P., GOTSZALK T., KOLANEK K., WOSZCZYNA M., MASALSKA A., ZAWIERUCHA P., WIELGOSZEWSKI G., ZIELONY M., SANKOWSKA A., SZELOCH R., JANUS P., GRABIEC P.: Application of Light-Guide Interferometry in Assessment of Metrologic Properties of Sensors of Near AFM Field. Proc. of the Conf. “Quantum Metrology 2006”. Poznań, Poland, 9-10.05.2006.
  • [P17] NIEMIEC H., JASTRZĄB M., KUCEWICZ W., KUCHARSKI K., MARCZEWSKI J., SAPOR M., TOMASZEWSKI D.: Full-Size Monolithic Active Pixel Sensors in SOI Technology – Design Considerations, Simulations, and Measurements Results. Nucl. Instr. & Meth. in Phys. Res. A 2006 vol. 568 p. 153-158.
  • [P18] PEREZ R., CHAILLET N., DOMAŃSKI K., JANUS P., GRABIEC P.: Fabrication Modelling and Integration of a Silicon Technology Force Sensors in a Piezoelectric Micro-Manipulator. Sensors & Actuators A 2006 vol. 128 p. 367-375.
  • [P19] PIJANOWSKA D., DAWGUL M., TORBICZ W., YANG CHIA-MING, JAROSZEWICZ B., GRABIEC P.: Ion-Sensitive Field-Effect Transistor with Reduced Sensitivity to Hydrogen Ions – REFET239-242. Proc. of the IX Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Kraków-Zakopane, Poland, 19-22.06.2006, p. 239-242.
  • [P20] SŁYSZ W., WĘGRZECKI M., BAR J., GRABIEC P., GÓRSKA M., ZWILLER V., LATTA C., BOHI P., MILOSTNAYA I., MINAEVA O., ANTIPOV A., OKUNEV O., KORNEEV A., SMIRNOV K., VORONOV B., KAUROVA N., GOLTSMAN G., PEARLMAN A., CROSS A., KOMISSAROV I., VEREVKIN A., SOBOLEWSKI R.: Fiber-Coupled Single-Photon Detectors Based on NbN Superconducting Nanostructures for Practical Quantum Cryptography and Photon-Correlation Studies. Appl. Phys. Lett. 2006 vol. 88 p. 261113-1-3.
  • [P21] SZMIGIEL D., DOMAŃSKI K., GRABIEC P.: The Effect of Morphology and Surface Purity on the Etching of Silicon in an Inductively Coupled Fluorine-Based Plasma. Proc. of the First Central Europ. Symp. on Plasma Chemistry and Workshop on the Plasma-Assisted Combustion and Plasma- Aftertreatment of Combustion Flue Gases for Power Industry. Gdańsk, Poland, 28-31.05.2006, p. 1-5.
  • [P22] SZMIGIEL D., DOMAŃSKI K., PROKARYN P., GRABIEC P.: Deep Etching of the Biocompatible Silicon Rubber. Microelectron. Eng. 2006 vol. 83 p. 1178-1181.
  • [P23] SZMIGIEL D., DOMAŃSKI K., PROKARYN P., GRABIEC P., SOBCZAK J. W.: The Effect of Fluorine-Based Plasma Treatment on the Morphology and Chemical Surface Composition of Biocompatible Silicon Elastomer. Appl. Surf. Sci. 2006 vol. 253 p. 1506-1511.
  • [P24] WEN-YAW CHUNG, CHUNG-HUANG YANG, PIJANOWSKA D., GRABIEC P., TORBICZ W.: ISFET Performance Enhancement by Using the Improved Circuit Techniques. Sensors & Actuators B 2006 vol. 113 p. 555-562.
  • [P25] WĘGRZECKI M., BAR J., WĘGRZECKA I., SŁYSZ W., GRODECKI R., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T., ZABOROWSKI M., PANAS A., CIEŻ M., KULAWIK J., GRÖGER B.: New Silicon Detectors of Radiation Achievement of the ITE. Elektronika 2006 No. 12 p. 40-43 (in Polish).
  • [P26] WOSZCZYNA M., MASALSKA A., ZAWIERUCHA P., GRABIEC P., JANUS P., GOTSZALK T.: Application of a Piezoelectric Sensor of Nano-Interactions in Modular Atomic-Force Microscopy. Proc. of the IX Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006, p. 439-442 (in Polish).
  • [P27] WZOREK M., KĄTCKI J., PŁUSKA M., RATAJCZAK J., JAROSZEWICZ B., DOMAŃSKI K., GRABIEC P.: Buried Amorphous-Layer Impact on Dislocation Densities in Silicon. J. of Microscopy 2006 vol. 224 p. 104-107.
  • [P28] ZABOROWSKI M., SZMIGIEL D., GOTSZALK T., IVANOVA K., SAROV Y., IVANOV T., VOLLAND B., RANGELOW I. W., GRABIEC P.: Nano-Line Width Control & Standard Using Lateral Pattern Definition Technique. Microelectron. Eng. 2006 vol. 83 p.1555-1558.
  • [P29] ŻYŁKA P., JANUS P.: Measurements of Mechanical Deformation in Electro-Active Polymers Using MEMS Microsensors. Proc. of the VI Sci. Conf. "Progress in Electrotechnics 2006". Jamrozowa Polana, Poland, 20-22.09.2006, serie: Conferences No. 18: vol. 44, 2006, p. 65-68 (in Polish).
  • [C1] BOER DE W., BOL J., FURGERI S., HARTMAN F., HAULER F., KRAUSE M., KUCEWICZ W., MARCZEWSKI J., SABELLEK A., SANDER C., SCHAMANAU M., SCHNEIDER T.: Lorentz Angle Versus Radiation Damage. Tracker Meetings during CMS Week, Geneve, Switzerland, 18-22.09.2006 (paper).
  • [C2] DOMAŃSKI K., JANUS P., SZMIGIEL D., PROKARYN P., GRABIEC P.: Application of Microsystem Technology for Medical Implants. 7th Symp. Diagnostics & Yield, Advanced Silicon Devices and Technologies for ULSI Era. Warsaw, Poland, 25-28.06.2006 (poster).
  • [C3] DOMAŃSKI K., JANUS P., SZMIGIEL D., PROKARYN P., KOCIUBIŃSKI A., GRABIEC P.: Microsystem Electrodes for Medical Implants. IX Sci. Conf. "Optoelectronic and Electronic Sensors” COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006 (paper, in Polish).
  • [C4] DOMAŃSKI K., ŁYSKO J., GRABIEC P., DUMANIA P.: Microsystem Technology in ITE, Warsaw, Poland. MINOS EURONET Meet. Barcelona, Spain, 5-6.05.2006 (commun.).
  • [C5] DUMANIA P., GRABIEC P., GRODNER M., JAROSZEWICZ B., KOCIUBIŃSKI A., KUCHARSKI K., MALINOWSKI A., MARCZEWSKI J., NIEMEC H., PANAS A., TOMASZEWSKI D., WÓJCIK J., ZABOROWSKI M., ZAJĄC J.: Application and Characterization of CMOS Technology in ITE. 7th Symp. Diagnostics & Yield, Advanced Silicon Devices and Technologies for ULSI Era. Warsaw, Poland, 25-28.06.2006 (poster).
  • [C6] GRABIEC P.: Micro-Nano-Bio Systems: Future R&D and New Challenges - Position Paper, FP7 Consultation Workshop on Micro-Nano-Bio Systems: Future R&D and New Challenges. Brussels, Belgium, 3.05.2006 (inv. paper).
  • [C7] GRABIEC P.: Microsystems and Sensors in Strategic Research Agenda of the European Nanoelectronic Technology Platform ENIAC. IX Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006 (inv. paper, in Polish).
  • [C8] GRABIEC P.: MNT-Based Harsh-Environment Sensors – Concept Topic Introduction, CANEUS 2006 Conf., Micro- Nano-Technologies for Aerospace Applications. From Concept to System. Touluse, France, 27.08-1.09.2006 (inv. paper).
  • [C9] GRABIEC P.: Repeat the Success of Microelectronics in the Area of Micro- and Nanosystems. Meet. of the Measurement Microsystem and Sensor Section of the Committee of Metrology and Scientific Equipment of Polish Academy of Sciences, Institute of Electronic Systems, Warsaw University of Technology, Warsaw, Poland, 13.06.2006 (inv. paper, in Polish).
  • [C10] GRABIEC P.: Strategic Research Agenda of the European Nanoelectronic Technology Platform ENIAC and Its Significance for New Member States. Conf. Launching the 7th Framework of the European Union. Warsaw, Poland, 16-17.11.2006 (inv. paper).
  • [C11] GRABIEC P., DOMAŃSKI K.: Advanced Medical Application of Microsystem Technology, Healthy Aims FP IP Example, MINOS Info-Day Conf. Warsaw, Poland, 10-10.05.2006 (inv. paper).
  • [C12] GRABIEC P., MARCZEWSKI J.: Integration of MEMS and RF Systems. Transport in 7th Framework Programme. Warsaw, Poland, 6-7.06.2006 (inv. paper).
  • [C13] GRABIEC P., MARCZEWSKI J., YASHCHYSHYN Y., MODELSKI J.: Integration of Heterogeneous MEMS and RF Systems as an Enabling Technology for Unobtrusive Ambient Intelligence. 16th Int. Conf. MIKON’2006. Krakow, Poland, 22-26.05.2006 (inv. paper).
  • [C14] GOLTSMAN G., MINAEVA O., KORNEEV A., TARKHOV M., RUBTSOWA I., DIVOCHIJ A., MILOSTNAYA I., CHULKOVA G., KAUROVA N., VORONOV B., PAN D., CROSS A., PEARLMAN A., KOMISSAROV I., SŁYSZ W., SOBOLEWSKI R.: Middle-Infrared to Visible-Light Ultrafast Superconducting Single-Photon Detector. Applied Superconductivity Conf. Seattle, USA, 27.08-1.09.2006 (poster).
  • [C15] JANUS P., GRABIEC P., DOMAŃSKI K., GOTSZALK T., MULAK P.: Silicon Micro-Chuck with Submicron Displacement for Application in an Integrated Probe of a Hardness Nano-Tester. IX Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006 (poster, in Polish).
  • [C16] JANUS P., KOCIUBIŃSKI A., BIENIEK T., GRABIEC P., SCHROPFER G.: Methodology of Modern MEMS Design and Modeling. 7th Symp. Diagnostics & Yield, Advanced Silicon Devices and Technologies for ULSI Era. Warsaw, Poland, 25-28.06.2006 (poster).
  • [C17] JAROSZEWICZ B., TOMASZEWSKI D., GRABIEC P., YANG CHIA-MING, PIJANOWSKA D., DAWGUL M., KRUK J., TORBICZ W.: Lineal Matrix of p-Well and SOI ISFET Chemical Sensors. "X Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006 (paper).
  • [C18] KOWALSKI P., GNIAZDOWSKI Z., JAŹWIŃSKI J., LATECKI B., STUDZIŃSKA K.: Piezoelectric Drive for MEMS Structures. IX Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006 (poster).
  • [C19] ŁYSKO J., DUMANIA P., GRABIEC P.: Micro/Nano Technology Networking in Poland. Third MINAEAST-NET Workshop. Villard de Lans, France, 26-27.01.2006 (commun.).
  • [C20] ŁYSKO J., LATECKI B., PIJANOWSKA D., NIKODEM M., WRZESIŃSKA H., PANAS A.: Measurements of the Dynamics of a Silicon, Thermo-Anemometric Sensor of Microflow. IX Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006 (poster, in Polish).
  • [C21] MALINOWSKI A., DOMAŃSKI K., GRABIEC P.: Electromechanical Characterization of Piezoresistive Strain Gauge. 7th Symp. Diagnostics & Yield, Advanced Silicon Devices and Technologies for ULSI Era. Warsaw, Poland, 25-28.06.2006 (poster).
  • [C22] MARCZEWSKI J.: Integration of MEMS and RF Systems. 16th Int. Travelling Summer School on Microwaves and Lightwaves. Warsaw, Poland,8-14.07.2006 (inv. paper).
  • [C23] MARCZEWSKI J.: Physical Basements of Functioning of Semiconductor Devices. IF PAN XXXI Series. Warsaw, Poland, 4.12.2006 (inv. paper, in Polish).
  • [C24] MARCZEWSKI J.: Positron Emission Tomography. 10th Festival of Science, Warsaw, Poland, 18.09.2006 (inv. paper, in Polish).
  • [C25] MULAK P., GOTSZALK T., KOLANEK K., WOSZCZYNA M., MASALSKA A., ZAWIERUCHA P., WIELGOSZEWSKI G., ZIELONY M., SANKOWSKA A., SZELOCH R., JANUS P., GRABIEC P.: Application of Light-Guide Interferometry in Assessment of Metrologic Properties of Sensors of Near AFM Field. Proc. of the Conf. “Quantum Metrology 2006”. Poznań, Poland, 9-10.05.2006 (paper, in Polish).
  • [C26] PIJANOWSKA D., DAWGUL M., TORBICZ W., YANG CHIA-MING, JAROSZEWICZ B., GRABIEC P.: Ion-Sensitive Field-Effect Transistor with Reduced Sensitivity to Hydrogen Ions – REFET239-242. IX Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006 (poster, in Polish).
  • [C27] RZODKIEWICZ W., PANAS A.: Ellipsometric and Raman Spectroscopy Studies of Compaction and Decompaction of Si-SiO2 Systems. 7th Symp. Diagnostics & Yield, Advanced Silicon Devices and Technologies for ULSI Era. Warsaw, Poland, 25-28.06.2006 (poster).
  • [C28] SŁYSZ W., WĘGRZECKI M., GRABIEC P., ZWILLER V., MILOSTNAYA I., MINAEVA O., VORONOV B., KORNEEV A., GOLTSMAN G., PAN D., PEARLMAN A., KOMISSAROV I., SOBOLEWSKI R.: Practical, Fiber-Coupled Superconducting Single-Photon Detector. Applied Superconductivity Conf. Seattle, USA, 27.08-1.09.2006 (poster).
  • [C29] SZMIGIEL D., DOMAŃSKI K., GRABIEC P.: The Effect of Morphology and Surface Purity on the Etching of Silicon in an Inductively Coupled Fluorine-Based Plasma. First Central Europ. Symp. on Plasma Chemistry and Workshop on the Plasma-Assisted Combustion and Plasma-Aftertreatment of Combustion Flue Gases for Power Industry. Gdańsk, Poland, 28-31.05.2006 (poster).
  • [C30] SZMIGIEL D., DOMAŃSKI K., PROKARYN P., GRABIEC P., PAMUŁA E., ŚCISŁOWSKA-CZARNECKA A., PŁYTYCZ B.: Plasma Treated Polysiloxane Coating for Medical Implants. Conf. "Biomaterials in Medicine and Veterinary Medicine". Rytro, Poland, 12-15.10.2006 (paper).
  • [C31] TOMASZEWSKI D., GRABIŃSKI W.: Advanced MOST Modeling for CMOS Technology Characterization. 7th Symp. Diagnostics & Yield, Advanced Silicon Devices and Technologies for ULSI Era. Warsaw, Poland, 25-28.06.2006 (poster).
  • [C32] TOMASZEWSKI D., YANG C. M., JAROSZEWICZ B., ZABOROWSKI M., GRABIEC P., PIJANOWSKA D.: Electrical Characterization of ISFETs. 7th Symp. Diagnostics & Yield, Advanced Silicon Devices and Technologies for ULSI Era. Warsaw, Poland, 25-28.06.2006 (poster).
  • [C33] WĘGRZECKI M., BAR J., WĘGRZECKA I., SŁYSZ W., GRODECKI R., GRABIEC P., KRZEMIŃSKI S., BUDZYŃSKI T., ZABOROWSKI M., PANAS A., CIEŻ M., KULAWIK J., GROEGER B.: New Silicon Detectors of Ionising and Optical Radiation Development at ITE. Conf. Launching the 7th Framework of the European Union. Warsaw, Poland, 16-17.11.2006 (poster).
  • [C34] WOSZCZYNA M., MASALSKA A., ZAWIERUCHA P., GRABIEC P., JANUS P., GOTSZALK T.: Application of Light-Guide Interferometry in Assessment of Metrologic Properties of Sensors of Near AFM Field. IX Sci. Conf. "Optoelectronic and Electronic Sensors" COE’2006. Krakow-Zakopane, Poland, 19-22.06.2006 (poster, in Polish).
  • [C35] ZABOROWSKI M., JAROSZEWICZ B., JANUS P., TOMASZEWSKI D., GRABIEC P., NIKODEM M., WRÓBLEWSKI W.: pH and Temperature Microsensor for Biological Application. 20th EUROSENSORS. Göteborg, Sweden, 17-20.09.2006 (poster).
  • [C36] ŻYŁKA P., JANUS P.: Measurements of Mechanical Deformation in Electro-Active Polymers Using MEMS Microsensors. VI Sci. Conf. "Progress in Electrotechnics 2006". Jamrozowa Polana, Poland, 20–22.09.2006 (paper, in Polish).
  • [PA1] JABŁOŃSKI W., WRZESIŃSKA H., GÓRSKA M.: A Method to Fabricate a Schottky Diode with Beam Contacts. Pat. RP No. 192581 (in Polish).
  • [PA2] ŁYSKO J., PIJANOWSKA D., MALINOWSKA E., JAŹWIŃSKI J.: Ion-Sensitive Silicon Electrode. Pat. RP No. 193862 (in Polish).
  • [PA3] GÓRSKA M., JABŁOŃSKI W., WRZESIŃSKA H.: A Method of Selective Formation of Glass Layers on Semiconductor Substrates. Pat. RP No. P.336512 (in Polish).
  • [PA4] GRABIEC P., MARCZEWSKI J., DOMAŃSKI K., JAROSZEWICZ B., KUCHARSKI K.: Monolithic Active Pixel Dosimeter. Pat. Appl. USA No. 20060043313.
  • [PA5] WĘGRZECKI M., WĘGRZECKA I., BAR J.: Hybrid Detector Matrix. Pat. Appl. No. P.381124 (in Polish).
  • [PA6] BAR J.: A Method to Protect Semiconductor Devices from Mechanical Damage. Pat. Appl. No. P.381227 (in Polish).
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