Electric and dielectric features of thin organic polymer layers

• Autorzy: Lozovski, T. , Montrimas, E. , Arlauskas, K.
• Konferencja: II International Conference on Advances in Processing, Testing and Application of Dielectric Materials, 15-17 September, Wrocław 2004
• Języki publikacji: EN

Abstrakty

EN

The charge carrier transport features of organic dielectric layers on the base of double hydrazone derivative and polycarbonate (PC) mixture of ratio 1:1 by weight have been investigated. The dielectric layers have been cast from solution of both organic materials on thin poly(ethylene theraphthalate) films coated by aluminum layer. Using dosed charging-discharging method, by measuring charge-voltage (C-V) characteristics, the dielectric features of organic polymer layers have been investigated. Latter characteristics enabled to evaluate layer's dielectric permittivity, surface resistance and it's dependence on electric field and polarity of charging potential. Investigation of the hole drift mobility dependencies on electric field by time-of-flight method demonstrated that the hole mobility increased from 3.5∙10^-7 cm²/Vs till 2∙10^-6cm²/Vs with the electric field increasing from 1.6∙10⁵ V/cm up to 6∙10⁵ V/cm.

Słowa kluczowe

EN

organic polymer; carrier transport; organic dielectric layers

• Czasopismo: Prace Naukowe Instytutu Podstaw Elektrotechniki i Elektrotechnologii Politechniki Wrocławskiej. Konferencje
• Rocznik: 2004
• Tom: Vol. 40, nr 15
• Strony: 1-3
• Opis fizyczny: Bibliogr. 2 poz., rys.

Twórcy

autor

Lozovski, T.

• Department of Solid State Electronics, Vilnius University, Saulėtekio 9, build. 3, 01513 Vilnius, Lithuania

autor

Montrimas, E.

• Department of Solid State Electronics, Vilnius University, Saulėtekio 9, build. 3, 01513 Vilnius, Lithuania

autor

Arlauskas, K.

• Department of Solid State Electronics, Vilnius University, Saulėtekio 9, build. 3, 01513 Vilnius, Lithuania

Bibliografia

• [1] LOZOVSKI T. , MONTRIMAS E. , ARLAUSKAS K. , G. JUŠKA, Non-destructive methods for determination of electric parameters of dielectric layer, APTADM' 2001 International Conference on Advances in Processing, Testing and Application of Dielectric Materials, Przegląd Elektotechniczny, Zeszyt Specjalny, Wrocław, 2001, pp. 128-130.
• [2] LOZOVSKI T. , MONTRIMAS E. , MOTIEJŪNAS K. , SIDARAVIČIUS J., BRAZIULIS S., The device for determining capacitance of an electrographic layer, A.c. 1486954 (USSR), Biuletin of inventions, 1989, No 22, 3p.