Application of atomic force microscopy in analysis of material surfaces

• Autorzy: Konstantová, V.
• Konferencja: Letnia Szkoła Inżynierii Powierzchni (4 ; 07-08.10.2010 ; Kielce, Polska)
• Języki publikacji: EN

Abstrakty

EN

Atomic Force Microscopy (AFM) is from the family of Scanning Probe microscopy common used technique for imaging analysis of material. This paper describe fundamentals of Atomic Force Microscopy - contact, semicontact and noncontact mode. Topography by semicontact mode will be presented by scan images of different type of materials, biological and technical. This work was done with the financial support of the VEGA project n. 1/0564/10 "Research of Structures, Morphologies of Surface and Properties of Nature Materials as Source of Inspiration for Non-conventional constructional Materials".

Słowa kluczowe

EN

atomic force microscopy (AFM); material surface; material analysis

• Czasopismo: Zeszyty Naukowe Politechniki Świętokrzyskiej. Nauki Techniczne
• Rocznik: 2011
• Tom: Z. 16
• Strony: 47-55
• Opis fizyczny: Bibliogr. 4 poz., rys., wykr.

Twórcy

autor

Konstantová, V.

• University of Žilina, Faculty of Mechanical Engineering, Department of Design and Mechanical Parts, Univerzitná 8215/1, Žilina, 010 26 Slovak Republic

Bibliografia

• 1. Mironov V.L.: Fundamentals of Scanning Probe Microscopy. The textbook for students of the senior courses of higher educational institutions. The Russian Academy of Sciences Institute for Physics of Microstructures, Nizhniy Novgorod 2004, © NT-MDT Co., p. 98.
• 2. http://www.ntmdt.com/
• 3. Morris V.J., Kirby A.R., Gunning A.P.: Atomic Force Microscopy for Biologists. Imperial College Press London, 1999, p. 332, ISBN 1-86094-199-0.
• 4. SPM SOLVER NEXT, Instruction Manual, Zelenograd 124482, Moscow, Russia 20 September 2010, © NT-MDT Co. p. 172.