Comparative analysis of three algorithms for two-channel common frequency sinewave parameter estimation: ellipse fit, seven parameter sine fit and spectral sinc fit

• Autorzy: Ramos, P. M. , Janeiro, F. M. , Radil, T.
• Języki publikacji: EN

Abstrakty

EN

In this paper, a comparison analysis of three different algorithms for the estimation of sine signal parameters in two-channel common frequency situations is presented. The relevance of this situation is clearly understood in multiple applications where the algorithms have been applied. They include impedance measurements, eddy currents testing, laser anemometry and radio receiver testing for example. The three algorithms belong to different categories because they are based on different approaches. The ellipse fit algorithm is a parametric fit based on the XY plot of the samples of both signals. The seven parameter sine fit algorithm is a least-squares algorithm based on the time domain fitting of a single tone sinewave model to the acquired samples. The spectral sinc fit performs a fitting in the frequency domain of the exact model of an acquired sinewave on the acquired spectrum. Multiple simulation situations and real measurements are included in the comparison to demonstrate the weaknesses and strong points of each algorithm.

Słowa kluczowe

EN

sinewave parameter estimation; amplitude and phase measurements; even parameter sine fit; ellipse fit; spectral sinc fit

• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2010
• Tom: Vol. 17, nr 2
• Strony: 255-270
• Opis fizyczny: Bibliogr. 16 poz., rys., tab., wykr.

Twórcy

autor

Ramos, P. M.

autor

Janeiro, F. M.

autor

Radil, T.

• Instituto de Telecomunicaçoes, Instituto Superior Técnico, Av. Rovisco Pais 1, 1049-001 Lisbon, Portugal,

Bibliografia

• [1] IEEE Standard for Digitizing Waveform Records, 2007. IEEE Std. 1057-2007.
• [2] P.M. Ramos, M. Fonseca da Silva, A. Cruz Serra: “Low frequency impedance measurement using sinefitting”. Measurement, vol. 35, no.1, Jan. 2004, pp. 89-96,
• [3] A.L. Ribeiro, H.G. Ramos: “Inductive probe for flaw detection in non-magnetic metallic plates using eddy currents”. IEEE International Instrumentation and Measurement Technology Conference, Victoria, Canada, May 2008, pp. 1447–1451.
• [4] P. Händel, A. Høst-Madsen: “Estimation of velocity and size of particles from two channel laser anemometry measurements”. Measurement, vol. 21, no. 3, July 1997, pp. 113-123.
• [5] P. Händel, P. Zetterberg: “Receiver I/Q Imbalance: Tone Test, Sensitivity Analysis, and the Universal Software Radio Peripheral”. IEEE Trans. Instr. Meas., vol. 59, no. 3, March 2010, pp. 704-714.
• [6] D. Agrež: “Power measurement in non-coherent sampling”. Measurement, vol. 41, no. 3, April 2008, pp. 230-235.
• [7] M. Novotný, M. Sedláček: “Measurement of active power by time-domain digital signal processing”. Measurement, vol. 42, no. 8, October 2009, pp. 1139-1152.
• [8] P.M. Ramos, A.C. Serra; “A new sine-fitting algorithm for accurate amplitude and phase measurements in two channel acquisition systems”. Measurement, vol. 41, no. 2, Feb. 2008, pp. 135-143.
• [9] P.M. Ramos, F.M. Janeiro, T. Radil: “Comparison of impedance measurements in a DSP using ellipse-fit and seven-parameter sine-fit algorithms”. Measurement, vol. 42, no. 9, Nov. 2009, pp. 1370-1379.
• [10] R. Halíř, J. Flusser: “Numerically stable direct least squares fitting of ellipses”. Proc. WSCG’98, University of West Bohemia, Czech Republic, Feb. 1998, pp. 125-132.
• [11] P.M. Ramos, F.M. Janeiro, M. Tlemçani, A.C. Serra: “Recent Developments on Impedance Measurements With DSP-Based Ellipse-Fitting Algorithms”. IEEE Trans. Instr. Meas., vol. 58, no. 5, May 2009, pp. 1680-1689.
• [12] T. Radil, P.M. Ramos, A.C. Serra: “New spectrum leakage correction algorithm for frequency estimation of power system signals”. IEEE Trans. Instr. Meas., vol. 58, no. 5, May 2009, pp. 1670-1679.
• [13] P. Händel: “Parameter estimation employing a dual-channel sine-wave model under a Gaussian assumption”. IEEE Trans. Instr. Meas., vol. 57, no. 8, Aug. 2008, pp. 1661-1669.
• [14] A. Fitzgibbon, M. Pilu, R. Fischer: “Direct least squares fitting of ellipses”. 13th Intern. Conf. on Pattern Recognition, Vienna, Austria, Sept. 1996, pp. 253-257.
• [15] F.M. Janeiro, P.M. Ramos, M. Tlemçani, A.C. Serra: “Analysis of a non-iterative algorithm for the amplitude and phase difference estimation of two acquired sinewaves”. XVIII IMEKO World Congr., Rio de Janeiro, Brazil, Sep. 2006.
• [16] H. Renders, J. Schoukens, G. Vilain; “High-accuracy spectrum analysis of sampled discrete frequency signals by analytical leakage compensation”. IEEE Trans. Instr. Meas., vol. 33, no. 4, Dec 1984, pp. 287-292.