Warianty tytułu
Języki publikacji
Abstrakty
In the paper the automatic and universal system for identi.cation of Random Telegraph Signal (RTS) noise as a non-Gaussian component of the inherent noise signal of semiconductor devices is presented. The system for data acquisition and processing is described. Histograms of the instantaneous values of the noise signals are calculated as the basis for analysis of the noise signal to determine the number of local maxima of histograms and to evaluate the number of RTS noise levels. The presented system does not need supervisor control of identi.cation results.
Czasopismo
Rocznik
Tom
Strony
219-228
Opis fizyczny
Bibliogr. 12 poz. rys., wykr.
Twórcy
autor
autor
autor
- Gdańsk University of Technology Faculty of Electronics, Telecommunications and Informatics, Department of Optoelectronics and Electronic Systems, Poland, Alicja.Konczakowska@eti.pg.gda.pl
Bibliografia
- 1. Claeys C., Simoen E.: Noise as a diagnostic tool for semiconductor material and device characterization, J. Electrochem. Soc., 145, no. 6, pp. 2058–2067, 1998.
- 2. Ciofi C., Neri B.: Low-frequency noise measurements as a characterisation tool for degradation phenomena in solid-state devices, J. Phys. D. Appl., no. 33, pp. 199–216, 2000.
- 3. Jones B. K.: Electrical noise as a reliability indicator in electronic devices and components, IEEE Proc. Circuits Devices Syst., vol. 149, no. 1, pp. 13–22, 2002.
- 4. Konczakowska A.: Quality and 1/f noise of electronic components, Quality and Reliability Engineering International, vol. 11, pp. 165–169, 1995.
- 5. Celik-Butler Z.: Measurement and analysis methods for Random Telegraph Signals, Proc. of Advanced Experimental Methods for Noise Research in Nanoscale Electron Devices, Ed. J. Sikula and M. Levinshtein, Kluwer Academic Publisher, NATO Science Series. II. Mathemetics, Physics and Chemistry, 151, pp. 219–226, 2004.
- 6. Cichosz J., Szatkowski A.: Noise scattering patterns methods for recognition of RTS noise in semiconductor components, Proc. of 18th Inter. Conference on Noise and Fluctuations – ICNF 2005, Salamanca, Spain, 19–23 September 2005, Eds. T. Gonzalez, J. Mateos, D. Pardo. AIP Conference Proceedings, pp. 673–676.
- 7. Vandamme L. K. J., Macucci M.: 1/f and RTS noise in submicron devices: Faster is noisier, UNSOLVED PROBLEMS OF NOISE AND FLUCTUATIONS: UPoN 2005: Fourth International Conference on Unsolved Problems of Noise and Fluctuations in Physics, Biology, and High Technology. AIP Conference Proceedings, vol. 800, pp. 436–443, 2005.
- 8. Cichosz J., Szatkowski A.: Identification and digital processing of RTS noise in semiconductor devices, The Scientific Papers of Faculty of Electrical and Control Engineering Gdańsk University of Technology, no. 21, pp. 29–37, 2005.(in Polish)
- 9. Yuzhelevki Y, Yuzhelevki M., Jung G.: Random Telegraph Noise analysis in time domain. Rev. Scientific Instruments, vol. 71, April 2000.
- 10. Konczakowska A., Cichosz J., Stawarz B.: RTS noise in optoelectronic coupled devices, Proc. of the 18th Inter. Conference on Noise and Fluctuations – ICNF 2005, Salamanca, Spain, 19–23 September, Eds. T. Gonzales, Mateos J., Pardo D. AIP Conference Proceedings 780, pp. 669–672.
- 11. Konczakowska A., Cichosz J., Szewczyk A.: A new method for identification of RTS noise, Bulletin of The Polish Academy of Sciences, Technical Sciences, vol. 54, no. 4, pp. 457–460, 2006.
- 12. Konczakowska A., Cichosz J., Szewczyk A., Stawarz B.: Identification of optocoupler devives with RTS noise, Fluctuation and Noise Letters, vol. 6, no. 4, pp. L395–L401, 2006.
Typ dokumentu
Bibliografia
Identyfikatory
Identyfikator YADDA
bwmeta1.element.baztech-article-BSW1-0033-0003