The automatic method for recognition of RTS noise in noise signals

• Autorzy: Stawarz-Graczyk, B. , Załęski, D. , Konczakowska, A.
• Języki publikacji: EN

Abstrakty

EN

In the paper the automatic and universal system for identi.cation of Random Telegraph Signal (RTS) noise as a non-Gaussian component of the inherent noise signal of semiconductor devices is presented. The system for data acquisition and processing is described. Histograms of the instantaneous values of the noise signals are calculated as the basis for analysis of the noise signal to determine the number of local maxima of histograms and to evaluate the number of RTS noise levels. The presented system does not need supervisor control of identi.cation results.

Słowa kluczowe

EN

RTS noise; semiconductor devices; Noise Scattering Pattern (NSP) method; histogram

• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2007
• Tom: Vol. 14, nr 2
• Strony: 219-228
• Opis fizyczny: Bibliogr. 12 poz. rys., wykr.

Twórcy

autor

Stawarz-Graczyk, B.

autor

Załęski, D.

autor

Konczakowska, A.

• Gdańsk University of Technology Faculty of Electronics, Telecommunications and Informatics, Department of Optoelectronics and Electronic Systems, Poland,

Bibliografia

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