Reconstruction of thin films polyazomethine based on microscopic images

• Autorzy: Weszka, J. , Szindler, M. , Śliwa, A. , Hajduk, B. , Jurusik, J.
• Języki publikacji: PL

Abstrakty

EN

The aim of this paper was to investigate changes in surface morphology of thin films of polyazomethine PPI. Thin films were prepared using low-temperature chemical vapor deposition (CVD) method.

Słowa kluczowe

PL

mikroskopia sił atomowych; skaningowy mikroskop elektronowy; oprogramowanie WSxM

EN

atomic force microscope; scanning electron microscope; WSxM software

• Czasopismo: Archives of Materials Science and Engineering
• Rocznik: 2011
• Tom: Vol. 48, nr 1
• Strony: 40-48
• Opis fizyczny: Bibliogr. 20 poz.

Twórcy

autor

Weszka, J.

autor

Szindler, M.

autor

Śliwa, A.

autor

Hajduk, B.

autor

Jurusik, J.

• Division of Materials Processing Technology, Management and Computer Techniques in Materials Science, Institute of Engineering Materials and Biomaterials, Silesian University of Technology, ul. Konarskiego 18a, 44-100 Gliwice, Poland,

Bibliografia

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